SG112019A1 - Anti-corrosion layer on objective lens for liquid immersion lithography applications - Google Patents

Anti-corrosion layer on objective lens for liquid immersion lithography applications

Info

Publication number
SG112019A1
SG112019A1 SG200406212A SG200406212A SG112019A1 SG 112019 A1 SG112019 A1 SG 112019A1 SG 200406212 A SG200406212 A SG 200406212A SG 200406212 A SG200406212 A SG 200406212A SG 112019 A1 SG112019 A1 SG 112019A1
Authority
SG
Singapore
Prior art keywords
objective lens
liquid immersion
corrosion layer
immersion lithography
lithography applications
Prior art date
Application number
SG200406212A
Other languages
English (en)
Inventor
Lin Burg-Jeng
Lu David
Original Assignee
Taiwan Semiconductor Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg filed Critical Taiwan Semiconductor Mfg
Publication of SG112019A1 publication Critical patent/SG112019A1/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70983Optical system protection, e.g. pellicles or removable covers for protection of mask
    • G02B1/105
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/11Anti-reflection coatings
    • G02B1/111Anti-reflection coatings using layers comprising organic materials
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/11Anti-reflection coatings
    • G02B1/113Anti-reflection coatings using inorganic layer materials only
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/11Anti-reflection coatings
    • G02B1/113Anti-reflection coatings using inorganic layer materials only
    • G02B1/115Multilayers
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/14Protective coatings, e.g. hard coatings
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00Optical objectives specially designed for the purposes specified below
    • G02B13/14Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation
    • G02B13/143Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation for use with ultraviolet radiation
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70341Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Toxicology (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Lenses (AREA)
  • Microscoopes, Condenser (AREA)
SG200406212A 2003-11-06 2004-10-25 Anti-corrosion layer on objective lens for liquid immersion lithography applications SG112019A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/702,664 US7924397B2 (en) 2003-11-06 2003-11-06 Anti-corrosion layer on objective lens for liquid immersion lithography applications

Publications (1)

Publication Number Publication Date
SG112019A1 true SG112019A1 (en) 2005-06-29

Family

ID=34551708

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200406212A SG112019A1 (en) 2003-11-06 2004-10-25 Anti-corrosion layer on objective lens for liquid immersion lithography applications

Country Status (4)

Country Link
US (2) US7924397B2 (zh)
CN (1) CN1289965C (zh)
SG (1) SG112019A1 (zh)
TW (1) TWI247341B (zh)

Families Citing this family (128)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7081278B2 (en) * 2002-09-25 2006-07-25 Asml Holdings N.V. Method for protection of adhesives used to secure optics from ultra-violet light
US10503084B2 (en) 2002-11-12 2019-12-10 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
CN100568101C (zh) 2002-11-12 2009-12-09 Asml荷兰有限公司 光刻装置和器件制造方法
US9482966B2 (en) 2002-11-12 2016-11-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7372541B2 (en) * 2002-11-12 2008-05-13 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
SG121818A1 (en) 2002-11-12 2006-05-26 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
US7948604B2 (en) * 2002-12-10 2011-05-24 Nikon Corporation Exposure apparatus and method for producing device
KR101036114B1 (ko) * 2002-12-10 2011-05-23 가부시키가이샤 니콘 노광장치 및 노광방법, 디바이스 제조방법
JP4362867B2 (ja) * 2002-12-10 2009-11-11 株式会社ニコン 露光装置及びデバイス製造方法
JP4352874B2 (ja) * 2002-12-10 2009-10-28 株式会社ニコン 露光装置及びデバイス製造方法
KR20050062665A (ko) * 2002-12-10 2005-06-23 가부시키가이샤 니콘 노광장치 및 디바이스 제조방법
SG171468A1 (en) * 2002-12-10 2011-06-29 Nikon Corp Exposure apparatus and method for producing device
TW200421444A (en) * 2002-12-10 2004-10-16 Nippon Kogaku Kk Optical device and projecting exposure apparatus using such optical device
US7242455B2 (en) * 2002-12-10 2007-07-10 Nikon Corporation Exposure apparatus and method for producing device
DE10261775A1 (de) * 2002-12-20 2004-07-01 Carl Zeiss Smt Ag Vorrichtung zur optischen Vermessung eines Abbildungssystems
TW201908879A (zh) * 2003-02-26 2019-03-01 日商尼康股份有限公司 曝光裝置、曝光方法及元件製造方法
EP1610361B1 (en) * 2003-03-25 2014-05-21 Nikon Corporation Exposure system and device production method
WO2004090956A1 (ja) 2003-04-07 2004-10-21 Nikon Corporation 露光装置及びデバイス製造方法
KR101177331B1 (ko) * 2003-04-09 2012-08-30 가부시키가이샤 니콘 액침 리소그래피 유체 제어 시스템
KR101177330B1 (ko) * 2003-04-10 2012-08-30 가부시키가이샤 니콘 액침 리소그래피 장치
WO2004090633A2 (en) * 2003-04-10 2004-10-21 Nikon Corporation An electro-osmotic element for an immersion lithography apparatus
EP2921905B1 (en) 2003-04-10 2017-12-27 Nikon Corporation Run-off path to collect liquid for an immersion lithography apparatus
SG141425A1 (en) * 2003-04-10 2008-04-28 Nikon Corp Environmental system including vacuum scavange for an immersion lithography apparatus
JP4315198B2 (ja) * 2003-04-11 2009-08-19 株式会社ニコン 液浸液体を光学アセンブリ下に維持するリソグラフィ装置及び液浸液体維持方法並びにそれらを用いるデバイス製造方法
KR101508809B1 (ko) * 2003-04-11 2015-04-06 가부시키가이샤 니콘 액침 리소그래피에 의한 광학기기의 세정방법
JP4582089B2 (ja) * 2003-04-11 2010-11-17 株式会社ニコン 液浸リソグラフィ用の液体噴射回収システム
JP2006523958A (ja) 2003-04-17 2006-10-19 株式会社ニコン 液浸リソグラフィで使用するためのオートフォーカス素子の光学的構造
TWI295414B (en) 2003-05-13 2008-04-01 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
EP1624481A4 (en) * 2003-05-15 2008-01-30 Nikon Corp EXPOSURE DEVICE AND METHOD FOR MANUFACTURING COMPONENTS
TWI421906B (zh) * 2003-05-23 2014-01-01 尼康股份有限公司 An exposure method, an exposure apparatus, and an element manufacturing method
TWI424470B (zh) * 2003-05-23 2014-01-21 尼康股份有限公司 A method of manufacturing an exposure apparatus and an element
CN100541717C (zh) * 2003-05-28 2009-09-16 株式会社尼康 曝光方法、曝光装置以及器件制造方法
TWI442694B (zh) * 2003-05-30 2014-06-21 Asml Netherlands Bv 微影裝置及元件製造方法
US7213963B2 (en) * 2003-06-09 2007-05-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7317504B2 (en) * 2004-04-08 2008-01-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7684008B2 (en) 2003-06-11 2010-03-23 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP3401946A1 (en) * 2003-06-13 2018-11-14 Nikon Corporation Exposure apparatus and device manufacturing method
KR101146962B1 (ko) 2003-06-19 2012-05-22 가부시키가이샤 니콘 노광 장치 및 디바이스 제조방법
EP1639391A4 (en) * 2003-07-01 2009-04-29 Nikon Corp USE OF FLUIDS SPECIFIED ISOTOPICALLY AS OPTICAL ELEMENTS
EP2466382B1 (en) * 2003-07-08 2014-11-26 Nikon Corporation Wafer table for immersion lithography
WO2005006416A1 (ja) * 2003-07-09 2005-01-20 Nikon Corporation 結合装置、露光装置、及びデバイス製造方法
WO2005006418A1 (ja) * 2003-07-09 2005-01-20 Nikon Corporation 露光装置及びデバイス製造方法
EP2264531B1 (en) 2003-07-09 2013-01-16 Nikon Corporation Exposure apparatus and device manufacturing method
EP1650787A4 (en) * 2003-07-25 2007-09-19 Nikon Corp INVESTIGATION METHOD AND INVESTIGATION DEVICE FOR AN OPTICAL PROJECTION SYSTEM AND METHOD OF MANUFACTURING AN OPTICAL PROJECTION SYSTEM
US7175968B2 (en) * 2003-07-28 2007-02-13 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method and a substrate
EP2264534B1 (en) 2003-07-28 2013-07-17 Nikon Corporation Exposure apparatus, method for producing device, and method for controlling exposure apparatus
EP1503244A1 (en) * 2003-07-28 2005-02-02 ASML Netherlands B.V. Lithographic projection apparatus and device manufacturing method
US7326522B2 (en) * 2004-02-11 2008-02-05 Asml Netherlands B.V. Device manufacturing method and a substrate
US7779781B2 (en) 2003-07-31 2010-08-24 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7579135B2 (en) * 2003-08-11 2009-08-25 Taiwan Semiconductor Manufacturing Company, Ltd. Lithography apparatus for manufacture of integrated circuits
US7700267B2 (en) * 2003-08-11 2010-04-20 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion fluid for immersion lithography, and method of performing immersion lithography
US8357749B2 (en) * 2003-08-25 2013-01-22 Dow Global Technologies Llc Coating composition and articles made therefrom
TWI439823B (zh) 2003-08-26 2014-06-01 尼康股份有限公司 Optical components and exposure devices
US8149381B2 (en) 2003-08-26 2012-04-03 Nikon Corporation Optical element and exposure apparatus
US6954256B2 (en) * 2003-08-29 2005-10-11 Asml Netherlands B.V. Gradient immersion lithography
TWI263859B (en) 2003-08-29 2006-10-11 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
SG145780A1 (en) * 2003-08-29 2008-09-29 Nikon Corp Exposure apparatus and device fabricating method
KR101748923B1 (ko) 2003-09-03 2017-06-19 가부시키가이샤 니콘 액침 리소그래피용 유체를 제공하기 위한 장치 및 방법
WO2005029559A1 (ja) * 2003-09-19 2005-03-31 Nikon Corporation 露光装置及びデバイス製造方法
KR101421398B1 (ko) 2003-09-29 2014-07-18 가부시키가이샤 니콘 노광장치, 노광방법 및 디바이스 제조방법
JP2005136364A (ja) * 2003-10-08 2005-05-26 Zao Nikon Co Ltd 基板搬送装置、露光装置、並びにデバイス製造方法
KR101111364B1 (ko) 2003-10-08 2012-02-27 가부시키가이샤 자오 니콘 기판 반송 장치 및 기판 반송 방법, 노광 장치 및 노광방법, 디바이스 제조 방법
KR20060126949A (ko) 2003-10-08 2006-12-11 가부시키가이샤 니콘 기판 반송 장치와 기판 반송 방법, 노광 장치와 노광 방법,및 디바이스 제조 방법
TW201738932A (zh) 2003-10-09 2017-11-01 Nippon Kogaku Kk 曝光裝置及曝光方法、元件製造方法
US7352433B2 (en) * 2003-10-28 2008-04-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7411653B2 (en) * 2003-10-28 2008-08-12 Asml Netherlands B.V. Lithographic apparatus
US7924397B2 (en) 2003-11-06 2011-04-12 Taiwan Semiconductor Manufacturing Company, Ltd. Anti-corrosion layer on objective lens for liquid immersion lithography applications
JP4295712B2 (ja) 2003-11-14 2009-07-15 エーエスエムエル ネザーランズ ビー.ブイ. リソグラフィ装置及び装置製造方法
WO2005054953A2 (en) * 2003-11-24 2005-06-16 Carl-Zeiss Smt Ag Holding device for an optical element in an objective
TWI470371B (zh) 2003-12-03 2015-01-21 尼康股份有限公司 An exposure apparatus, an exposure method, an element manufacturing method, and an optical component
JPWO2005057635A1 (ja) * 2003-12-15 2007-07-05 株式会社ニコン 投影露光装置及びステージ装置、並びに露光方法
US20070081133A1 (en) * 2004-12-14 2007-04-12 Niikon Corporation Projection exposure apparatus and stage unit, and exposure method
KR101499405B1 (ko) 2003-12-15 2015-03-05 가부시키가이샤 니콘 스테이지 장치, 노광 장치, 및 노광 방법
US7460206B2 (en) * 2003-12-19 2008-12-02 Carl Zeiss Smt Ag Projection objective for immersion lithography
US7394521B2 (en) 2003-12-23 2008-07-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7088422B2 (en) * 2003-12-31 2006-08-08 International Business Machines Corporation Moving lens for immersion optical lithography
EP1706793B1 (en) * 2004-01-20 2010-03-03 Carl Zeiss SMT AG Exposure apparatus and measuring device for a projection lens
US7589822B2 (en) * 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
WO2005076321A1 (ja) 2004-02-03 2005-08-18 Nikon Corporation 露光装置及びデバイス製造方法
US20050205108A1 (en) * 2004-03-16 2005-09-22 Taiwan Semiconductor Manufacturing Co., Ltd. Method and system for immersion lithography lens cleaning
US8488102B2 (en) * 2004-03-18 2013-07-16 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion fluid for immersion lithography, and method of performing immersion lithography
TWI402893B (zh) * 2004-03-25 2013-07-21 尼康股份有限公司 曝光方法
US7898642B2 (en) * 2004-04-14 2011-03-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1747499A2 (en) 2004-05-04 2007-01-31 Nikon Corporation Apparatus and method for providing fluid for immersion lithography
US7616383B2 (en) * 2004-05-18 2009-11-10 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
WO2005119368A2 (en) * 2004-06-04 2005-12-15 Carl Zeiss Smt Ag System for measuring the image quality of an optical imaging system
EP2966670B1 (en) 2004-06-09 2017-02-22 Nikon Corporation Exposure apparatus and device manufacturing method
US7463330B2 (en) 2004-07-07 2008-12-09 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
ATE441937T1 (de) * 2004-07-12 2009-09-15 Nikon Corp Belichtungsgerät und bauelemente- herstellungsverfahren
EP1801853A4 (en) * 2004-08-18 2008-06-04 Nikon Corp EXPOSURE DEVICE AND COMPONENT MANUFACTURING METHOD
US7701550B2 (en) * 2004-08-19 2010-04-20 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20060044533A1 (en) * 2004-08-27 2006-03-02 Asmlholding N.V. System and method for reducing disturbances caused by movement in an immersion lithography system
US7397533B2 (en) 2004-12-07 2008-07-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7880860B2 (en) 2004-12-20 2011-02-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
SG124351A1 (en) * 2005-01-14 2006-08-30 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
EP1681597B1 (en) 2005-01-14 2010-03-10 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
US8692973B2 (en) * 2005-01-31 2014-04-08 Nikon Corporation Exposure apparatus and method for producing device
EP2506289A3 (en) * 2005-01-31 2013-05-22 Nikon Corporation Exposure apparatus and method for manufacturing device
US7282701B2 (en) * 2005-02-28 2007-10-16 Asml Netherlands B.V. Sensor for use in a lithographic apparatus
USRE43576E1 (en) 2005-04-08 2012-08-14 Asml Netherlands B.V. Dual stage lithographic apparatus and device manufacturing method
US7242843B2 (en) * 2005-06-30 2007-07-10 Corning Incorporated Extended lifetime excimer laser optics
US20070004182A1 (en) * 2005-06-30 2007-01-04 Taiwan Semiconductor Manufacturing Company, Ltd. Methods and system for inhibiting immersion lithography defect formation
US7357768B2 (en) * 2005-09-22 2008-04-15 William Marshall Recliner exerciser
US7495743B2 (en) * 2005-09-30 2009-02-24 International Business Machines Corporation Immersion optical lithography system having protective optical coating
GB2431670A (en) * 2005-10-25 2007-05-02 Zeiss Carl Smt Ag Protective coating with windows for protection of optical element that is soluble in immersion liquid.
US20070124987A1 (en) * 2005-12-05 2007-06-07 Brown Jeffrey K Electronic pest control apparatus
KR100768849B1 (ko) * 2005-12-06 2007-10-22 엘지전자 주식회사 계통 연계형 연료전지 시스템의 전원공급장치 및 방법
US7649611B2 (en) 2005-12-30 2010-01-19 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7893047B2 (en) * 2006-03-03 2011-02-22 Arch Chemicals, Inc. Biocide composition comprising pyrithione and pyrrole derivatives
DE102006021797A1 (de) * 2006-05-09 2007-11-15 Carl Zeiss Smt Ag Optische Abbildungseinrichtung mit thermischer Dämpfung
WO2007131769A1 (en) * 2006-05-15 2007-11-22 Micronic Laser Systems Ab Backside immersion lithography
DE102006027969A1 (de) * 2006-06-17 2007-12-20 X-Fab Semiconductor Foundries Ag Verfahren zur selektiven Entspiegelung einer Halbleitergrenzfläche durch eine besondere Prozessführung
JP5645406B2 (ja) * 2006-09-12 2014-12-24 カール・ツァイス・エスエムティー・ゲーエムベーハー 浸漬リソグラフィーのための疎水性被膜を有する光学的配置、ならびにそれを具える投影露光器機
CN102540766A (zh) * 2006-09-12 2012-07-04 卡尔蔡司Smt有限责任公司 用于浸入式光刻的光学装置及包含该装置的投影曝光设备
US8817226B2 (en) 2007-02-15 2014-08-26 Asml Holding N.V. Systems and methods for insitu lens cleaning using ozone in immersion lithography
US8654305B2 (en) * 2007-02-15 2014-02-18 Asml Holding N.V. Systems and methods for insitu lens cleaning in immersion lithography
US8237911B2 (en) 2007-03-15 2012-08-07 Nikon Corporation Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
TWI389551B (zh) * 2007-08-09 2013-03-11 Mstar Semiconductor Inc 迦瑪校正裝置
US8215074B2 (en) * 2008-02-05 2012-07-10 International Business Machines Corporation Pattern formation employing self-assembled material
KR101448152B1 (ko) * 2008-03-26 2014-10-07 삼성전자주식회사 수직 포토게이트를 구비한 거리측정 센서 및 그를 구비한입체 컬러 이미지 센서
JP5097166B2 (ja) 2008-05-28 2012-12-12 エーエスエムエル ネザーランズ ビー.ブイ. リソグラフィ装置及び装置の動作方法
US20090311871A1 (en) * 2008-06-13 2009-12-17 Lam Research Corporation Organic arc etch selective for immersion photoresist
EP2372404B1 (en) * 2008-10-17 2013-01-16 Carl Zeiss SMT GmbH High transmission, high aperture projection objective and projection exposure apparatus
US8946514B2 (en) * 2009-12-28 2015-02-03 E.I. Du Pont De Nemours And Company Sorghum fertility restorer genotypes and methods of marker-assisted selection
EP2381310B1 (en) 2010-04-22 2015-05-06 ASML Netherlands BV Fluid handling structure and lithographic apparatus
KR102391893B1 (ko) 2017-03-10 2022-04-28 엘지이노텍 주식회사 액체렌즈 및 이를 포함하는 카메라 모듈 및 광학기기
DE102018221189A1 (de) * 2018-12-07 2020-06-10 Carl Zeiss Smt Gmbh Verfahren zum Bilden von Nanostrukturen an einer Oberfläche und optisches Element
CN113311515A (zh) * 2020-02-25 2021-08-27 华为技术有限公司 一种镜头、摄像模组和电子设备

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1292717A (en) * 1970-02-04 1972-10-11 Rank Organisation Ltd Improvements relating to anti-reflection coatings
DE3028044C1 (de) * 1980-07-24 1981-10-08 Vdo Adolf Schindling Ag, 6000 Frankfurt Lötfähiges Schichtensystem
NL8301824A (nl) * 1983-05-24 1984-12-17 Philips Nv Optisch element bestaande uit een doorzichtig substraat en een antireflectieve bekleding voor het golflengtegebied in het nabije infrarood.
DE3537626A1 (de) * 1984-10-26 1986-04-30 Merck Patent Gmbh, 6100 Darmstadt Beschichtungsloesungen
US5067781A (en) * 1989-11-21 1991-11-26 Raytheon Company Optical elements and method of manufacture
US5121256A (en) 1991-03-14 1992-06-09 The Board Of Trustees Of The Leland Stanford Junior University Lithography system employing a solid immersion lens
US5139879A (en) * 1991-09-20 1992-08-18 Allied-Signal Inc. Fluoropolymer blend anti-reflection coatings and coated articles
US5494743A (en) * 1992-08-20 1996-02-27 Southwall Technologies Inc. Antireflection coatings
US5648860A (en) * 1992-10-09 1997-07-15 Ag Technology Co., Ltd. Projection type color liquid crystal optical apparatus
JP2753930B2 (ja) 1992-11-27 1998-05-20 キヤノン株式会社 液浸式投影露光装置
US5882773A (en) * 1993-10-13 1999-03-16 The Regents Of The University Of California Optical coatings of variable refractive index and high laser-resistance from physical-vapor-deposited perfluorinated amorphous polymer
US5825043A (en) 1996-10-07 1998-10-20 Nikon Precision Inc. Focusing and tilting adjustment system for lithography aligner, manufacturing apparatus or inspection apparatus
US5900354A (en) 1997-07-03 1999-05-04 Batchelder; John Samuel Method for optical inspection and lithography
AU1785399A (en) * 1998-01-12 1999-07-26 Hitachi Maxell, Ltd. Method and apparatus for magnetooptic reproduction
US6084846A (en) * 1998-06-03 2000-07-04 Seagate Technology, Inc. Liquid immersion lens for optical data storage
EP0962789B1 (en) * 1998-06-05 2008-02-06 FUJIFILM Corporation Anti-reflection film and display device having the same
JP3531483B2 (ja) * 1998-07-16 2004-05-31 セイコーエプソン株式会社 投写型表示装置
JP2000131503A (ja) 1998-10-22 2000-05-12 Nikon Corp 光学部材
DE19929403A1 (de) * 1999-06-26 2000-12-28 Zeiss Carl Fa Objektiv, insbesondere Objektiv für eine Halbleiter-Lithographie-Projektionsbelichtungsanlage und Herstellungverfahren
US20020005990A1 (en) 2000-07-11 2002-01-17 Nikon Corporation Optical element formed with optical thin film and exposure apparatus
JP3905035B2 (ja) * 2000-08-29 2007-04-18 独立行政法人科学技術振興機構 光学薄膜の形成方法
JP2002323652A (ja) * 2001-02-23 2002-11-08 Nikon Corp 投影光学系,該投影光学系を備えた投影露光装置および投影露光方法
US20020163629A1 (en) 2001-05-07 2002-11-07 Michael Switkes Methods and apparatus employing an index matching medium
US7129009B2 (en) * 2002-05-14 2006-10-31 E. I. Du Pont De Nemours And Company Polymer-liquid compositions useful in ultraviolet and vacuum ultraviolet uses
US7932020B2 (en) * 2003-07-10 2011-04-26 Takumi Technology Corporation Contact or proximity printing using a magnified mask image
US7700267B2 (en) * 2003-08-11 2010-04-20 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion fluid for immersion lithography, and method of performing immersion lithography
US6954256B2 (en) 2003-08-29 2005-10-11 Asml Netherlands B.V. Gradient immersion lithography
US6961186B2 (en) * 2003-09-26 2005-11-01 Takumi Technology Corp. Contact printing using a magnified mask image
US7924397B2 (en) 2003-11-06 2011-04-12 Taiwan Semiconductor Manufacturing Company, Ltd. Anti-corrosion layer on objective lens for liquid immersion lithography applications
US20060001851A1 (en) 2004-07-01 2006-01-05 Grant Robert B Immersion photolithography system

Also Published As

Publication number Publication date
TWI247341B (en) 2006-01-11
US20050100745A1 (en) 2005-05-12
US7924397B2 (en) 2011-04-12
TW200518191A (en) 2005-06-01
US20070091288A1 (en) 2007-04-26
CN1614509A (zh) 2005-05-11
CN1289965C (zh) 2006-12-13
US8179516B2 (en) 2012-05-15

Similar Documents

Publication Publication Date Title
SG112019A1 (en) Anti-corrosion layer on objective lens for liquid immersion lithography applications
AU2003221490A1 (en) Refractive projection objective for immersion lithography
GB2432011B (en) Liquid zoom lens
HK1095388A1 (zh) 浸沒式光刻透鏡的液壓補償
GB2432010B (en) Liquid zoom lens
TWI372412B (en) Immersion lithography fluid control system
EP1805539A4 (en) PLANAR LENSES FOR INTEGRATED OPTICS
FR2907067B1 (fr) Dispositif d'eclairage pour vehicules.
TWI348597B (en) Systems and methods for retrieving residual liquid during immersion lens photolithography
HK1100434A1 (en) Coating film transfer tool
DE602005024842D1 (de) Dünnfilmvorrichtungen für gefässverschluss
EP1746445A4 (en) OPTICAL FILM
EP1651991A4 (en) INSPECTION SYSTEM USING SMALL CATADIOPTRIC OBJECTIVE
EP1679535A4 (en) HARD immersion LENS HOLDER
AU2003304557A1 (en) Refractive projection objective for immersion lithography
ZA200804343B (en) Prismatic films for optical applications
EP1832350A4 (en) OPTICAL LENS COATING APPARATUS
DE60306252D1 (de) Übertragungswerkzeug für Beschichtungsfilm
GB2434457B (en) Solid immersion lens lithography
EP1939664A4 (en) LIQUID IMMERSION MICROSCOPE
GB0417991D0 (en) Automatic contact navigation assistant
EP1721680A4 (en) REVERSING APPARATUS FOR OPTICAL LENS
EP1679540A4 (en) DEVICE FOR DISPLACING SOLID IMMERSION LENS AND MICROSCOPE EQUIPPED WITH SAID LENS
DE60238019D1 (de) Übertragungswerkzeug für Beschichtungsfilm
FI7025U1 (fi) Laite sinilevän torjumiseksi tai rajoittamiseksi