SG11201903115PA - Protection circuit - Google Patents
Protection circuitInfo
- Publication number
- SG11201903115PA SG11201903115PA SG11201903115PA SG11201903115PA SG11201903115PA SG 11201903115P A SG11201903115P A SG 11201903115PA SG 11201903115P A SG11201903115P A SG 11201903115PA SG 11201903115P A SG11201903115P A SG 11201903115PA SG 11201903115P A SG11201903115P A SG 11201903115PA
- Authority
- SG
- Singapore
- Prior art keywords
- international
- channel
- massachusetts
- pct
- drive
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
- H02H9/04—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
- H02H9/045—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere
Landscapes
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
- Financial Or Insurance-Related Operations Such As Payment And Settlement (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/346,230 US10283958B2 (en) | 2016-11-08 | 2016-11-08 | Protection circuit |
PCT/US2017/053868 WO2018089124A1 (en) | 2016-11-08 | 2017-09-28 | Protection circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201903115PA true SG11201903115PA (en) | 2019-05-30 |
Family
ID=62065786
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201903115PA SG11201903115PA (en) | 2016-11-08 | 2017-09-28 | Protection circuit |
Country Status (5)
Country | Link |
---|---|
US (1) | US10283958B2 (zh) |
JP (1) | JP7001680B2 (zh) |
CN (1) | CN109792148B (zh) |
SG (1) | SG11201903115PA (zh) |
WO (1) | WO2018089124A1 (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20230023000A (ko) | 2021-04-28 | 2023-02-16 | 주식회사 아도반테스토 | 복수의 자동 테스트 장비 채널을 교정하기 위한 회로 및 방법 |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3931548A (en) | 1974-04-26 | 1976-01-06 | Admiral Corporation | Over voltage protection circuit |
ATE7926T1 (de) | 1980-02-01 | 1984-06-15 | Imperial Chemical Industries Plc | Waessrige anstrichmittel und ihre verwendung. |
SE422131B (sv) | 1980-06-23 | 1982-02-15 | Asea Ab | Overspenningsskydd |
US5473498A (en) | 1993-06-28 | 1995-12-05 | Rockwell International Corporation | Power amplifier over-voltage protection circuit |
JPH0843488A (ja) * | 1994-07-27 | 1996-02-16 | Mitsubishi Electric Corp | 半導体試験装置 |
JP3469351B2 (ja) * | 1995-04-17 | 2003-11-25 | 三菱電機株式会社 | リンギング防止回路、デバイスアンダーテストボード、ピンエレクトロニクスカード及び半導体装置 |
US6127879A (en) | 1998-02-26 | 2000-10-03 | Lockheed Martin Corporation | Multi-channel overvoltage protection circuit |
JP4119060B2 (ja) * | 1999-10-01 | 2008-07-16 | 株式会社アドバンテスト | 試験装置 |
US6940703B1 (en) | 1999-12-15 | 2005-09-06 | Tripath Technology, Inc. | Overvoltage protection circuit |
CA2380464C (en) | 2000-06-01 | 2006-05-09 | Everbrite, Inc. | Gas-discharge lamp including a fault protection circuit |
US6882513B2 (en) | 2002-09-13 | 2005-04-19 | Ami Semiconductor, Inc. | Integrated overvoltage and reverse voltage protection circuit |
US7248035B2 (en) | 2002-12-12 | 2007-07-24 | Analog Devices, Inc. | Automatic test equipment pin channel with T-coil compensation |
JP4390515B2 (ja) | 2003-09-30 | 2009-12-24 | Necエレクトロニクス株式会社 | 出力mosトランジスタの過電圧保護回路 |
US7098694B2 (en) | 2004-11-12 | 2006-08-29 | Agere Systems Inc. | Overvoltage tolerant input buffer |
US7403030B2 (en) | 2004-12-17 | 2008-07-22 | Teradyne, Inc. | Using parametric measurement units as a source of power for a device under test |
US7135881B2 (en) * | 2004-12-21 | 2006-11-14 | Teradyne, Inc. | Method and system for producing signals to test semiconductor devices |
US7327148B2 (en) * | 2005-06-29 | 2008-02-05 | Agilent Technologies, Inc. | Method for using internal semiconductor junctions to aid in non-contact testing |
US20080062603A1 (en) | 2006-09-12 | 2008-03-13 | Klaus Richter | Apparatus and method for overload protection of electronic circuitry |
US7446554B2 (en) | 2006-11-15 | 2008-11-04 | Advantest Corporation | Direct current measuring apparatus and limiting circuit |
US8139329B2 (en) | 2007-08-03 | 2012-03-20 | Linear Technology Corporation | Over-voltage protection circuit |
CN101378194B (zh) | 2007-08-28 | 2012-05-30 | 鸿富锦精密工业(深圳)有限公司 | 电压保护电路 |
US7602205B2 (en) | 2008-02-19 | 2009-10-13 | Qualitau, Inc. | Electromigration tester for high capacity and high current |
JP5711000B2 (ja) | 2011-02-16 | 2015-04-30 | ラピスセミコンダクタ株式会社 | 過電圧保護回路及び半導体集積回路 |
US9829526B2 (en) * | 2012-02-21 | 2017-11-28 | Texas Instruments Incorporated | Transmission line pulsing |
CN104155590B (zh) * | 2014-08-14 | 2015-09-02 | 温州大学 | 二极管正向恢复参数综合测试分析平台 |
US9219420B1 (en) | 2014-11-07 | 2015-12-22 | Power Integrations, Inc. | Overvoltage protection using a tapFET |
CN104780682B (zh) | 2015-04-15 | 2016-03-30 | 深圳市稳先微电子有限公司 | 一种过压保护电路、驱动芯片及电源模块 |
-
2016
- 2016-11-08 US US15/346,230 patent/US10283958B2/en active Active
-
2017
- 2017-09-28 JP JP2019515339A patent/JP7001680B2/ja active Active
- 2017-09-28 CN CN201780057863.4A patent/CN109792148B/zh active Active
- 2017-09-28 SG SG11201903115PA patent/SG11201903115PA/en unknown
- 2017-09-28 WO PCT/US2017/053868 patent/WO2018089124A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
US10283958B2 (en) | 2019-05-07 |
WO2018089124A1 (en) | 2018-05-17 |
CN109792148A (zh) | 2019-05-21 |
US20180131180A1 (en) | 2018-05-10 |
JP2019534447A (ja) | 2019-11-28 |
JP7001680B2 (ja) | 2022-01-19 |
CN109792148B (zh) | 2021-11-30 |
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