SG11201407582SA - Laser-assisted device alteration using synchronized laser pulses - Google Patents
Laser-assisted device alteration using synchronized laser pulsesInfo
- Publication number
- SG11201407582SA SG11201407582SA SG11201407582SA SG11201407582SA SG11201407582SA SG 11201407582S A SG11201407582S A SG 11201407582SA SG 11201407582S A SG11201407582S A SG 11201407582SA SG 11201407582S A SG11201407582S A SG 11201407582SA SG 11201407582S A SG11201407582S A SG 11201407582SA
- Authority
- SG
- Singapore
- Prior art keywords
- laser
- international
- fremont
- laser pulses
- publication
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Laser Surgery Devices (AREA)
- Optical Radar Systems And Details Thereof (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(12) INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property Organization International Bureau (43) International Publication Date 19 December 2013 (19.12.2013) WIPOIPCT (10) International Publication Number WO 2013/188046 A4 (51) International Patent Classification: G01R 31/311 (2006.01) (21) International Application Number: (22) International Filing Date: (25) Filing Language: (26) Publication Language: PCT/US2013/041468 16 May 2013 (16.05.2013) English English (30) Priority Data: 61/648,042 16 May 2012 (16.05.2012) US (71) Applicant: DCG SYSTEMS, INC. [US/US]; 45900 Northport Loop East, Fremont, CA 94538 (US). (72) Inventors; and (71) Applicants VEDAGARBHA, Praveen : [US/US]; 45524 Cherokee Lane, Fremont, CA 94539 (US). REID, Derryck [GB/GB]; 6 Matthews Crofts, Blackridge, West Lothian EH48 3TJ (GB). SERRELS, Keith [GB/US]; 39600 Fre mont Boulevard, Apt. 125, Fremont, CA 94538 (US). VICKERS, James, S. [US/US]; 2002 Coastland Ave, San Jose, CA 95125 (US). (74) Agent: BACH, Joseph; Nixon Peabody LLP, P.O. Box 60610, Palo Alto, CA 94306 (US). (81) Designated States (unless otherwise indicated, for every kind of national protection available)'. AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available)'. ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG). Published: — with international search report (Art. 21(3)) — with amended claims and statement (Art. 19(1)) — with information concerning one or more priority claims considered void (Rule 26bis.2(d)) Date of publication of the amended claims and statement: 27 February 2014 (54) Title: LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES •t o 00 00 Figure 3 i-H o CJ (57) Abstract: A pulsed-laser LADA system is provided, which utilizes temporal resolution to enhance spatial resolution. The sys - tem is capable of resolving CMOS pairs within the illumination spot using synchronization of laser pulses with the DUT clock. The system can be implemented using laser wavelength having photon energy above the silicon bandgap so as to perform single- photon LADA or wavelength having photon energy below the silicon bandgap so as to generate two-photon LADA. The timing of the laser pulses can be adjusted using two feedback loops tied to the clock signal of an ATE, or by adjusting the ATE's clock signal with ref erence to a fixed- pulse laser source.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261648042P | 2012-05-16 | 2012-05-16 | |
PCT/US2013/041468 WO2013188046A1 (en) | 2012-05-16 | 2013-05-16 | Laser-assisted device alteration using synchronized laser pulses |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201407582SA true SG11201407582SA (en) | 2014-12-30 |
Family
ID=49758609
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201407582SA SG11201407582SA (en) | 2012-05-16 | 2013-05-16 | Laser-assisted device alteration using synchronized laser pulses |
SG10201609595UA SG10201609595UA (en) | 2012-05-16 | 2013-05-16 | Laser-assisted device alteration using synchronized laser pulses |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201609595UA SG10201609595UA (en) | 2012-05-16 | 2013-05-16 | Laser-assisted device alteration using synchronized laser pulses |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6200947B2 (en) |
SG (2) | SG11201407582SA (en) |
TW (1) | TWI479167B (en) |
WO (1) | WO2013188046A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10352995B1 (en) | 2018-02-28 | 2019-07-16 | Nxp Usa, Inc. | System and method of multiplexing laser triggers and optically selecting multiplexed laser pulses for laser assisted device alteration testing of semiconductor device |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2428807A3 (en) | 2010-09-08 | 2014-10-29 | DCG Systems, Inc. | Laser assisted fault localization using two-photon absorption |
US9201096B2 (en) | 2010-09-08 | 2015-12-01 | Dcg Systems, Inc. | Laser-assisted device alteration using synchronized laser pulses |
SG11201507735RA (en) | 2013-03-24 | 2015-10-29 | Dcg Systems Inc | Pulsed lada for acquisition of timing diagrams |
JP2016109673A (en) | 2014-10-16 | 2016-06-20 | ディーシージー システムズ、 インコーポレイテッドDcg Systems Inc. | Systems and method for laser voltage imaging |
CN104484885B (en) * | 2014-12-25 | 2017-09-19 | 上海华岭集成电路技术股份有限公司 | The ATE method of testings of CIS chips yuv format output |
WO2019038836A1 (en) * | 2017-08-22 | 2019-02-28 | 富士通株式会社 | Soft error inspection method, soft error inspection device and soft error inspection system |
US10782343B2 (en) | 2018-04-17 | 2020-09-22 | Nxp Usa, Inc. | Digital tests with radiation induced upsets |
US10910786B2 (en) * | 2018-07-23 | 2021-02-02 | University Of Maryland, College Park | Laser cavity optical alignment |
CN118472768B (en) * | 2024-07-10 | 2024-09-17 | 北京卓镭激光技术有限公司 | Laser timing synchronization device, method, medium, program, and laser |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5095262A (en) * | 1988-09-01 | 1992-03-10 | Photon Dynamics, Inc. | Electro-optic sampling system clock and stimulus pattern generator |
US6316950B1 (en) * | 1997-05-15 | 2001-11-13 | Lucent Technologies Inc. | Method and apparatus for imaging semiconductor devices |
US6400165B1 (en) * | 2000-02-02 | 2002-06-04 | Lucent Technologies Inc. | Ultra-fast probe |
JP4249410B2 (en) * | 2001-12-10 | 2009-04-02 | Necエレクトロニクス株式会社 | Inspection apparatus and inspection method for semiconductor device |
JP3776073B2 (en) * | 2002-10-01 | 2006-05-17 | 株式会社神戸製鋼所 | Semiconductor carrier lifetime measurement method and apparatus |
US7450245B2 (en) * | 2005-06-29 | 2008-11-11 | Dcg Systems, Inc. | Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system |
US7733100B2 (en) * | 2005-08-26 | 2010-06-08 | Dcg Systems, Inc. | System and method for modulation mapping |
US9130344B2 (en) * | 2006-01-23 | 2015-09-08 | Raydiance, Inc. | Automated laser tuning |
JP2009300202A (en) * | 2008-06-12 | 2009-12-24 | Toshiba Corp | Method and system for inspecting semiconductor device |
SG10201506637YA (en) * | 2009-05-01 | 2015-10-29 | Dcg Systems Inc | Systems and method for laser voltage imaging state mapping |
EP2428807A3 (en) * | 2010-09-08 | 2014-10-29 | DCG Systems, Inc. | Laser assisted fault localization using two-photon absorption |
-
2013
- 2013-05-16 SG SG11201407582SA patent/SG11201407582SA/en unknown
- 2013-05-16 TW TW102117339A patent/TWI479167B/en active
- 2013-05-16 SG SG10201609595UA patent/SG10201609595UA/en unknown
- 2013-05-16 WO PCT/US2013/041468 patent/WO2013188046A1/en active Application Filing
- 2013-05-16 JP JP2015512867A patent/JP6200947B2/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10352995B1 (en) | 2018-02-28 | 2019-07-16 | Nxp Usa, Inc. | System and method of multiplexing laser triggers and optically selecting multiplexed laser pulses for laser assisted device alteration testing of semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
TW201411157A (en) | 2014-03-16 |
TWI479167B (en) | 2015-04-01 |
JP6200947B2 (en) | 2017-09-20 |
SG10201609595UA (en) | 2017-01-27 |
WO2013188046A4 (en) | 2014-02-27 |
JP2015517667A (en) | 2015-06-22 |
WO2013188046A1 (en) | 2013-12-19 |
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