SG11201407582SA - Laser-assisted device alteration using synchronized laser pulses - Google Patents

Laser-assisted device alteration using synchronized laser pulses

Info

Publication number
SG11201407582SA
SG11201407582SA SG11201407582SA SG11201407582SA SG11201407582SA SG 11201407582S A SG11201407582S A SG 11201407582SA SG 11201407582S A SG11201407582S A SG 11201407582SA SG 11201407582S A SG11201407582S A SG 11201407582SA SG 11201407582S A SG11201407582S A SG 11201407582SA
Authority
SG
Singapore
Prior art keywords
laser
international
fremont
laser pulses
publication
Prior art date
Application number
SG11201407582SA
Inventor
Praveen Vedagarbha
Derryck Reid
Keith Serrels
James S Vickers
Original Assignee
Dcg Systems Inc
Praveen Vedagarbha
Derryck Reid
Keith Serrels
James S Vickers
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dcg Systems Inc, Praveen Vedagarbha, Derryck Reid, Keith Serrels, James S Vickers filed Critical Dcg Systems Inc
Publication of SG11201407582SA publication Critical patent/SG11201407582SA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/308Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/31725Timing aspects, e.g. clock distribution, skew, propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Laser Surgery Devices (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

(12) INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property Organization International Bureau (43) International Publication Date 19 December 2013 (19.12.2013) WIPOIPCT (10) International Publication Number WO 2013/188046 A4 (51) International Patent Classification: G01R 31/311 (2006.01) (21) International Application Number: (22) International Filing Date: (25) Filing Language: (26) Publication Language: PCT/US2013/041468 16 May 2013 (16.05.2013) English English (30) Priority Data: 61/648,042 16 May 2012 (16.05.2012) US (71) Applicant: DCG SYSTEMS, INC. [US/US]; 45900 Northport Loop East, Fremont, CA 94538 (US). (72) Inventors; and (71) Applicants VEDAGARBHA, Praveen : [US/US]; 45524 Cherokee Lane, Fremont, CA 94539 (US). REID, Derryck [GB/GB]; 6 Matthews Crofts, Blackridge, West Lothian EH48 3TJ (GB). SERRELS, Keith [GB/US]; 39600 Fre­ mont Boulevard, Apt. 125, Fremont, CA 94538 (US). VICKERS, James, S. [US/US]; 2002 Coastland Ave, San Jose, CA 95125 (US). (74) Agent: BACH, Joseph; Nixon Peabody LLP, P.O. Box 60610, Palo Alto, CA 94306 (US). (81) Designated States (unless otherwise indicated, for every kind of national protection available)'. AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available)'. ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG). Published: — with international search report (Art. 21(3)) — with amended claims and statement (Art. 19(1)) — with information concerning one or more priority claims considered void (Rule 26bis.2(d)) Date of publication of the amended claims and statement: 27 February 2014 (54) Title: LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES •t o 00 00 Figure 3 i-H o CJ (57) Abstract: A pulsed-laser LADA system is provided, which utilizes temporal resolution to enhance spatial resolution. The sys - tem is capable of resolving CMOS pairs within the illumination spot using synchronization of laser pulses with the DUT clock. The system can be implemented using laser wavelength having photon energy above the silicon bandgap so as to perform single- photon LADA or wavelength having photon energy below the silicon bandgap so as to generate two-photon LADA. The timing of the laser pulses can be adjusted using two feedback loops tied to the clock signal of an ATE, or by adjusting the ATE's clock signal with ref­ erence to a fixed- pulse laser source.
SG11201407582SA 2012-05-16 2013-05-16 Laser-assisted device alteration using synchronized laser pulses SG11201407582SA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261648042P 2012-05-16 2012-05-16
PCT/US2013/041468 WO2013188046A1 (en) 2012-05-16 2013-05-16 Laser-assisted device alteration using synchronized laser pulses

Publications (1)

Publication Number Publication Date
SG11201407582SA true SG11201407582SA (en) 2014-12-30

Family

ID=49758609

Family Applications (2)

Application Number Title Priority Date Filing Date
SG11201407582SA SG11201407582SA (en) 2012-05-16 2013-05-16 Laser-assisted device alteration using synchronized laser pulses
SG10201609595UA SG10201609595UA (en) 2012-05-16 2013-05-16 Laser-assisted device alteration using synchronized laser pulses

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG10201609595UA SG10201609595UA (en) 2012-05-16 2013-05-16 Laser-assisted device alteration using synchronized laser pulses

Country Status (4)

Country Link
JP (1) JP6200947B2 (en)
SG (2) SG11201407582SA (en)
TW (1) TWI479167B (en)
WO (1) WO2013188046A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10352995B1 (en) 2018-02-28 2019-07-16 Nxp Usa, Inc. System and method of multiplexing laser triggers and optically selecting multiplexed laser pulses for laser assisted device alteration testing of semiconductor device

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2428807A3 (en) 2010-09-08 2014-10-29 DCG Systems, Inc. Laser assisted fault localization using two-photon absorption
US9201096B2 (en) 2010-09-08 2015-12-01 Dcg Systems, Inc. Laser-assisted device alteration using synchronized laser pulses
SG11201507735RA (en) 2013-03-24 2015-10-29 Dcg Systems Inc Pulsed lada for acquisition of timing diagrams
JP2016109673A (en) 2014-10-16 2016-06-20 ディーシージー システムズ、 インコーポレイテッドDcg Systems Inc. Systems and method for laser voltage imaging
CN104484885B (en) * 2014-12-25 2017-09-19 上海华岭集成电路技术股份有限公司 The ATE method of testings of CIS chips yuv format output
WO2019038836A1 (en) * 2017-08-22 2019-02-28 富士通株式会社 Soft error inspection method, soft error inspection device and soft error inspection system
US10782343B2 (en) 2018-04-17 2020-09-22 Nxp Usa, Inc. Digital tests with radiation induced upsets
US10910786B2 (en) * 2018-07-23 2021-02-02 University Of Maryland, College Park Laser cavity optical alignment
CN118472768B (en) * 2024-07-10 2024-09-17 北京卓镭激光技术有限公司 Laser timing synchronization device, method, medium, program, and laser

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Publication number Priority date Publication date Assignee Title
US5095262A (en) * 1988-09-01 1992-03-10 Photon Dynamics, Inc. Electro-optic sampling system clock and stimulus pattern generator
US6316950B1 (en) * 1997-05-15 2001-11-13 Lucent Technologies Inc. Method and apparatus for imaging semiconductor devices
US6400165B1 (en) * 2000-02-02 2002-06-04 Lucent Technologies Inc. Ultra-fast probe
JP4249410B2 (en) * 2001-12-10 2009-04-02 Necエレクトロニクス株式会社 Inspection apparatus and inspection method for semiconductor device
JP3776073B2 (en) * 2002-10-01 2006-05-17 株式会社神戸製鋼所 Semiconductor carrier lifetime measurement method and apparatus
US7450245B2 (en) * 2005-06-29 2008-11-11 Dcg Systems, Inc. Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
US7733100B2 (en) * 2005-08-26 2010-06-08 Dcg Systems, Inc. System and method for modulation mapping
US9130344B2 (en) * 2006-01-23 2015-09-08 Raydiance, Inc. Automated laser tuning
JP2009300202A (en) * 2008-06-12 2009-12-24 Toshiba Corp Method and system for inspecting semiconductor device
SG10201506637YA (en) * 2009-05-01 2015-10-29 Dcg Systems Inc Systems and method for laser voltage imaging state mapping
EP2428807A3 (en) * 2010-09-08 2014-10-29 DCG Systems, Inc. Laser assisted fault localization using two-photon absorption

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10352995B1 (en) 2018-02-28 2019-07-16 Nxp Usa, Inc. System and method of multiplexing laser triggers and optically selecting multiplexed laser pulses for laser assisted device alteration testing of semiconductor device

Also Published As

Publication number Publication date
TW201411157A (en) 2014-03-16
TWI479167B (en) 2015-04-01
JP6200947B2 (en) 2017-09-20
SG10201609595UA (en) 2017-01-27
WO2013188046A4 (en) 2014-02-27
JP2015517667A (en) 2015-06-22
WO2013188046A1 (en) 2013-12-19

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