SG11201903115PA - Protection circuit - Google Patents
Protection circuitInfo
- Publication number
- SG11201903115PA SG11201903115PA SG11201903115PA SG11201903115PA SG11201903115PA SG 11201903115P A SG11201903115P A SG 11201903115PA SG 11201903115P A SG11201903115P A SG 11201903115PA SG 11201903115P A SG11201903115P A SG 11201903115PA SG 11201903115P A SG11201903115P A SG 11201903115PA
- Authority
- SG
- Singapore
- Prior art keywords
- international
- channel
- massachusetts
- pct
- drive
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
- H02H9/04—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
- H02H9/045—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere
Landscapes
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
- Financial Or Insurance-Related Operations Such As Payment And Settlement (AREA)
Abstract
INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property Organization International Bureau (43) International Publication Date 17 May 2018 (17.05.2018) WIPO I PCT olimion °nolo III 01111101 Dii DID Immo oimIE (10) International Publication Number WO 2018/089124 Al (51) International Patent Classification: H02H 9/04 (2006.01) GO1R 31/3183 (2006.01) G01R 31/319 (2006.01) (21) International Application Number: PCT/US2017/053868 (22) International Filing Date: 28 September 2017 (28.09.2017) (25) Filing Language: English (26) Publication Language: English (30) Priority Data: 15/346,230 08 November 2016 (08.11.2016) US (71) Applicant: TERADYNE, INC. [US/US]; 600 Riverpark Drive, North Reading, Massachusetts 01864 (US). (72) Inventors: KIRKISH, Brian; 609 Sandpiper Ct., Al- gonquin, Illinois 60102 (US). NOWAKOWSKI, Don- ald Joseph; c/o Teradyne, Inc., 600 Riverpark Drive, North Reading, Massachusetts 01864 (US). CRESS, Mark Christopher; 6125 S. Teresa Drive, Chandler, Arizona 85249 (US). (74) Agent: PYSHER, Paul A. et al.; Choate, Hall & Ste- wart LLP, Two International Place, Boston, Massachusetts 02110 (US). (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, (54) Title: PROTECTION CIRCUIT 10 POSITIVE LIMITING CIRCUIT 13 20 CURRENT SINK 19 GENERATOR 25 26 15 27 18 ATE, INCLUDING PIN DUT 41 CHANNEL 4 ELECTRONICS 31 38 CURRENT 30 SOURCE GENERATOR 32 14 NEGATIVE LIMITING CIRCUIT FIG. 1 cc cc (57) : An example system includes a channel over which signals are transmitted between test equipment and a device under O test (DUT); and limiting circuitry to limit a voltage on the channel. The limiting circuitry includes a PN-junction device connected to pass current in response to the voltage on the channel exceeding a limit. C [Continued on next page] WO 2018/089124 Al MIDEDIMOMOIDIONDEIDIONIMEIHOHOEHEMOVOIS TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). Declarations under Rule 4.17: as to applicant's entitlement to apply for and be granted a patent (Rule 4.17(11)) Published: — with international search report (Art. 21(3))
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/346,230 US10283958B2 (en) | 2016-11-08 | 2016-11-08 | Protection circuit |
PCT/US2017/053868 WO2018089124A1 (en) | 2016-11-08 | 2017-09-28 | Protection circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201903115PA true SG11201903115PA (en) | 2019-05-30 |
Family
ID=62065786
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201903115PA SG11201903115PA (en) | 2016-11-08 | 2017-09-28 | Protection circuit |
Country Status (5)
Country | Link |
---|---|
US (1) | US10283958B2 (en) |
JP (1) | JP7001680B2 (en) |
CN (1) | CN109792148B (en) |
SG (1) | SG11201903115PA (en) |
WO (1) | WO2018089124A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20230023000A (en) | 2021-04-28 | 2023-02-16 | 주식회사 아도반테스토 | Circuit and Method for Calibrating Multiple Automatic Test Equipment Channels |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3931548A (en) | 1974-04-26 | 1976-01-06 | Admiral Corporation | Over voltage protection circuit |
ATE7926T1 (en) | 1980-02-01 | 1984-06-15 | Imperial Chemical Industries Plc | WATER-BASED PAINTS AND THEIR USE. |
SE422131B (en) | 1980-06-23 | 1982-02-15 | Asea Ab | OVER MONEY PROTECTION |
US5473498A (en) | 1993-06-28 | 1995-12-05 | Rockwell International Corporation | Power amplifier over-voltage protection circuit |
JPH0843488A (en) * | 1994-07-27 | 1996-02-16 | Mitsubishi Electric Corp | Semiconductor testing apparatus |
JP3469351B2 (en) * | 1995-04-17 | 2003-11-25 | 三菱電機株式会社 | Ringing prevention circuit, device under test board, pin electronics card and semiconductor device |
US6127879A (en) | 1998-02-26 | 2000-10-03 | Lockheed Martin Corporation | Multi-channel overvoltage protection circuit |
JP4119060B2 (en) * | 1999-10-01 | 2008-07-16 | 株式会社アドバンテスト | Test equipment |
US6940703B1 (en) | 1999-12-15 | 2005-09-06 | Tripath Technology, Inc. | Overvoltage protection circuit |
CA2380464C (en) | 2000-06-01 | 2006-05-09 | Everbrite, Inc. | Gas-discharge lamp including a fault protection circuit |
US6882513B2 (en) | 2002-09-13 | 2005-04-19 | Ami Semiconductor, Inc. | Integrated overvoltage and reverse voltage protection circuit |
US7248035B2 (en) | 2002-12-12 | 2007-07-24 | Analog Devices, Inc. | Automatic test equipment pin channel with T-coil compensation |
JP4390515B2 (en) | 2003-09-30 | 2009-12-24 | Necエレクトロニクス株式会社 | Output MOS transistor overvoltage protection circuit |
US7098694B2 (en) | 2004-11-12 | 2006-08-29 | Agere Systems Inc. | Overvoltage tolerant input buffer |
US7403030B2 (en) | 2004-12-17 | 2008-07-22 | Teradyne, Inc. | Using parametric measurement units as a source of power for a device under test |
US7135881B2 (en) * | 2004-12-21 | 2006-11-14 | Teradyne, Inc. | Method and system for producing signals to test semiconductor devices |
US7327148B2 (en) * | 2005-06-29 | 2008-02-05 | Agilent Technologies, Inc. | Method for using internal semiconductor junctions to aid in non-contact testing |
US20080062603A1 (en) | 2006-09-12 | 2008-03-13 | Klaus Richter | Apparatus and method for overload protection of electronic circuitry |
US7446554B2 (en) | 2006-11-15 | 2008-11-04 | Advantest Corporation | Direct current measuring apparatus and limiting circuit |
US8139329B2 (en) | 2007-08-03 | 2012-03-20 | Linear Technology Corporation | Over-voltage protection circuit |
CN101378194B (en) | 2007-08-28 | 2012-05-30 | 鸿富锦精密工业(深圳)有限公司 | Voltage protection circuit |
US7602205B2 (en) | 2008-02-19 | 2009-10-13 | Qualitau, Inc. | Electromigration tester for high capacity and high current |
JP5711000B2 (en) | 2011-02-16 | 2015-04-30 | ラピスセミコンダクタ株式会社 | Overvoltage protection circuit and semiconductor integrated circuit |
US9829526B2 (en) * | 2012-02-21 | 2017-11-28 | Texas Instruments Incorporated | Transmission line pulsing |
CN104155590B (en) * | 2014-08-14 | 2015-09-02 | 温州大学 | Diode forward recovers parametric synthesis test analysis platform |
US9219420B1 (en) | 2014-11-07 | 2015-12-22 | Power Integrations, Inc. | Overvoltage protection using a tapFET |
CN104780682B (en) | 2015-04-15 | 2016-03-30 | 深圳市稳先微电子有限公司 | A kind of overvoltage crowbar, driving chip and power module |
-
2016
- 2016-11-08 US US15/346,230 patent/US10283958B2/en active Active
-
2017
- 2017-09-28 JP JP2019515339A patent/JP7001680B2/en active Active
- 2017-09-28 CN CN201780057863.4A patent/CN109792148B/en active Active
- 2017-09-28 SG SG11201903115PA patent/SG11201903115PA/en unknown
- 2017-09-28 WO PCT/US2017/053868 patent/WO2018089124A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
US10283958B2 (en) | 2019-05-07 |
WO2018089124A1 (en) | 2018-05-17 |
CN109792148A (en) | 2019-05-21 |
US20180131180A1 (en) | 2018-05-10 |
JP2019534447A (en) | 2019-11-28 |
JP7001680B2 (en) | 2022-01-19 |
CN109792148B (en) | 2021-11-30 |
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