SG11201801119YA - Lighting device for inspection and inspection system - Google Patents
Lighting device for inspection and inspection systemInfo
- Publication number
- SG11201801119YA SG11201801119YA SG11201801119YA SG11201801119YA SG11201801119YA SG 11201801119Y A SG11201801119Y A SG 11201801119YA SG 11201801119Y A SG11201801119Y A SG 11201801119YA SG 11201801119Y A SG11201801119Y A SG 11201801119YA SG 11201801119Y A SG11201801119Y A SG 11201801119YA
- Authority
- SG
- Singapore
- Prior art keywords
- inspection
- lighting device
- inspection system
- lighting
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95623—Inspecting patterns on the surface of objects using a spatial filtering method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0636—Reflectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015186170A JP5866586B1 (ja) | 2015-09-22 | 2015-09-22 | 検査用照明装置及び検査システム |
PCT/JP2015/076824 WO2017051447A1 (ja) | 2015-09-22 | 2015-09-23 | 検査用照明装置及び検査システム |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201801119YA true SG11201801119YA (en) | 2018-03-28 |
Family
ID=55347054
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201801119YA SG11201801119YA (en) | 2015-09-22 | 2015-09-23 | Lighting device for inspection and inspection system |
Country Status (10)
Country | Link |
---|---|
US (1) | US10598603B2 (zh) |
EP (1) | EP3355049B1 (zh) |
JP (1) | JP5866586B1 (zh) |
KR (1) | KR101857539B1 (zh) |
CN (1) | CN107615049B (zh) |
DK (1) | DK3355049T3 (zh) |
ES (1) | ES2868928T3 (zh) |
IL (1) | IL257398B (zh) |
SG (1) | SG11201801119YA (zh) |
WO (1) | WO2017051447A1 (zh) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11423632B2 (en) | 2017-10-24 | 2022-08-23 | Nec Corporation | Device and method for determining surface irregularities with irradiation angle |
JP6451821B1 (ja) * | 2017-12-05 | 2019-01-16 | マシンビジョンライティング株式会社 | 検査システム及び検査方法 |
JP6954142B2 (ja) * | 2018-01-17 | 2021-10-27 | オムロン株式会社 | 画像検査装置および照明装置 |
US10634618B2 (en) * | 2018-01-23 | 2020-04-28 | Hong Kong Applied Science and Technology Research Institute Company Limited | Apparatus and a method for inspecting a light transmissible optical component |
JP7027926B2 (ja) | 2018-02-07 | 2022-03-02 | オムロン株式会社 | 画像検査装置および照明装置 |
EP3524967B1 (en) | 2018-02-07 | 2024-01-31 | OMRON Corporation | Image inspection device and lighting device |
JP6939641B2 (ja) | 2018-02-23 | 2021-09-22 | オムロン株式会社 | 画像検査装置および画像検査方法 |
JP6939640B2 (ja) | 2018-02-23 | 2021-09-22 | オムロン株式会社 | 画像検査装置および画像検査方法 |
US11941849B2 (en) | 2019-02-15 | 2024-03-26 | Nec Corporation | Information processing device |
WO2020174596A1 (ja) | 2019-02-26 | 2020-09-03 | 日本電気株式会社 | 画像撮影装置 |
JP7178001B2 (ja) * | 2019-03-14 | 2022-11-25 | オムロン株式会社 | 検査装置 |
TWI705239B (zh) * | 2019-07-19 | 2020-09-21 | 緯創資通股份有限公司 | 檢測光源模組與檢測裝置 |
CN114746716B (zh) * | 2019-11-29 | 2024-06-04 | 机械视觉照明有限公司 | 形状复原方法和图像测量装置 |
KR102361860B1 (ko) | 2020-06-14 | 2022-02-14 | 머신 비전 라이팅 가부시키가이샤 | 검사 측정용 조명 장치 및 검사 측정 시스템 및 검사 측정 방식 |
JP6799272B1 (ja) * | 2020-06-14 | 2020-12-16 | マシンビジョンライティング株式会社 | 検査測定システム及び検査測定方法 |
JP7206020B2 (ja) | 2020-11-17 | 2023-01-17 | マシンビジョンライティング株式会社 | 画像観察装置及びその照明光学系 |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4037965A (en) * | 1976-03-23 | 1977-07-26 | Leeds & Northrup Company | Method and optical means for determining dimensional characteristics of the particle distribution in a collection of particles |
US4275960A (en) * | 1979-08-13 | 1981-06-30 | International Business Machines Corporation | System for enhanced light uniformity in a document scanning system |
US20040057044A1 (en) * | 1994-12-08 | 2004-03-25 | Mehrdad Nikoonahad | Scanning system for inspecting anamolies on surfaces |
TW313626B (zh) | 1995-03-31 | 1997-08-21 | Lintec Corp | |
US6201601B1 (en) * | 1997-09-19 | 2001-03-13 | Kla-Tencor Corporation | Sample inspection system |
CN2468075Y (zh) * | 2001-03-10 | 2001-12-26 | 耿向东 | 一种用于彩色立体摄影的装置 |
US6920981B2 (en) * | 2003-01-03 | 2005-07-26 | Ade, Inc. | Suspension packages and systems, cushioning panels, and methods of using same |
JP2004233163A (ja) * | 2003-01-29 | 2004-08-19 | Hitachi High-Technologies Corp | パターン欠陥検査方法およびその装置 |
US20050036143A1 (en) * | 2003-08-15 | 2005-02-17 | Nanometrics Incorporated | Reference calibration of metrology instrument |
TW200525141A (en) * | 2003-12-26 | 2005-08-01 | Nikon Corp | Defect inspection device and defect inspection method |
US7295303B1 (en) * | 2004-03-25 | 2007-11-13 | Kla-Tencor Technologies Corporation | Methods and apparatus for inspecting a sample |
US6980377B1 (en) * | 2004-05-28 | 2005-12-27 | Honeywell International Inc. | Chromatic vignetting in lens systems |
JP2006023221A (ja) * | 2004-07-09 | 2006-01-26 | Tokyo Seimitsu Co Ltd | 外観検査装置及び投影方法 |
US8175252B2 (en) * | 2005-06-28 | 2012-05-08 | Alcatel Lucent | Ringback tone bookmark request by calling party |
US7924434B2 (en) * | 2005-08-02 | 2011-04-12 | Kla-Tencor Technologies Corp. | Systems configured to generate output corresponding to defects on a specimen |
US7924517B2 (en) * | 2006-06-21 | 2011-04-12 | Applied Materials Israel, Ltd. | Spatial filter, a system and method for collecting light from an object |
JP5182090B2 (ja) * | 2006-08-02 | 2013-04-10 | 株式会社ニコン | 欠陥検出装置及び欠陥検出方法 |
CN101387724B (zh) * | 2007-09-14 | 2011-01-05 | 鸿富锦精密工业(深圳)有限公司 | 色轮 |
TW201100787A (en) * | 2009-02-18 | 2011-01-01 | Nikon Corp | Surface examining device and surface examining method |
US8891087B2 (en) * | 2011-06-01 | 2014-11-18 | Digital Light Innovations | System and method for hyperspectral imaging |
JP5611149B2 (ja) * | 2011-08-23 | 2014-10-22 | 株式会社日立ハイテクノロジーズ | 光学顕微鏡装置及びこれを備えた検査装置 |
JP5895305B2 (ja) | 2011-12-06 | 2016-03-30 | シーシーエス株式会社 | 検査用照明装置及び検査用照明方法 |
US9176069B2 (en) * | 2012-02-10 | 2015-11-03 | Kla-Tencor Corporation | System and method for apodization in a semiconductor device inspection system |
US10005072B2 (en) * | 2012-07-23 | 2018-06-26 | W. R. Grace & Co.-Conn | High matrix surface area catalytic cracking catalyst stabilized with magnesium and silica |
JP5451832B2 (ja) * | 2012-08-21 | 2014-03-26 | 株式会社ニューフレアテクノロジー | パターン検査装置 |
JP2014075780A (ja) * | 2012-09-14 | 2014-04-24 | Ricoh Co Ltd | 撮像装置及び撮像システム |
JP6086362B2 (ja) | 2012-12-03 | 2017-03-01 | シーシーエス株式会社 | 検査システム及び検査用照明装置 |
JP2016180591A (ja) * | 2013-07-24 | 2016-10-13 | 株式会社日立ハイテクノロジーズ | 検査装置 |
-
2015
- 2015-09-22 JP JP2015186170A patent/JP5866586B1/ja active Active
- 2015-09-23 EP EP15904704.2A patent/EP3355049B1/en active Active
- 2015-09-23 SG SG11201801119YA patent/SG11201801119YA/en unknown
- 2015-09-23 ES ES15904704T patent/ES2868928T3/es active Active
- 2015-09-23 WO PCT/JP2015/076824 patent/WO2017051447A1/ja active Application Filing
- 2015-09-23 US US15/580,087 patent/US10598603B2/en active Active
- 2015-09-23 CN CN201580080545.0A patent/CN107615049B/zh active Active
- 2015-09-23 DK DK15904704.2T patent/DK3355049T3/da active
- 2015-09-23 KR KR1020177036014A patent/KR101857539B1/ko active IP Right Grant
-
2018
- 2018-02-07 IL IL257398A patent/IL257398B/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR20180002864A (ko) | 2018-01-08 |
IL257398B (en) | 2018-07-31 |
DK3355049T3 (da) | 2021-07-05 |
KR101857539B1 (ko) | 2018-05-14 |
US20180299386A1 (en) | 2018-10-18 |
JP5866586B1 (ja) | 2016-02-17 |
EP3355049A1 (en) | 2018-08-01 |
CN107615049A (zh) | 2018-01-19 |
EP3355049B1 (en) | 2021-03-31 |
US10598603B2 (en) | 2020-03-24 |
JP2017062120A (ja) | 2017-03-30 |
WO2017051447A1 (ja) | 2017-03-30 |
EP3355049A4 (en) | 2018-08-01 |
ES2868928T3 (es) | 2021-10-22 |
CN107615049B (zh) | 2020-11-03 |
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