HK1224467A1 - 用於投影儀校準的方法和系統 - Google Patents

用於投影儀校準的方法和系統

Info

Publication number
HK1224467A1
HK1224467A1 HK16112425.2A HK16112425A HK1224467A1 HK 1224467 A1 HK1224467 A1 HK 1224467A1 HK 16112425 A HK16112425 A HK 16112425A HK 1224467 A1 HK1224467 A1 HK 1224467A1
Authority
HK
Hong Kong
Prior art keywords
projector calibration
projector
calibration
Prior art date
Application number
HK16112425.2A
Other languages
English (en)
Inventor
Grundhfer Anselm
Original Assignee
Disney Entpr Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Disney Entpr Inc filed Critical Disney Entpr Inc
Publication of HK1224467A1 publication Critical patent/HK1224467A1/zh

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N9/00Details of colour television systems
    • H04N9/12Picture reproducers
    • H04N9/31Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
    • H04N9/3179Video signal processing therefor
    • H04N9/3185Geometric adjustment, e.g. keystone or convergence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504Calibration devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G06T3/18
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N9/00Details of colour television systems
    • H04N9/12Picture reproducers
    • H04N9/31Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
    • H04N9/3191Testing thereof
    • H04N9/3194Testing thereof including sensor feedback

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Geometry (AREA)
  • Projection Apparatus (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Transforming Electric Information Into Light Information (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
HK16112425.2A 2014-11-06 2016-10-28 用於投影儀校準的方法和系統 HK1224467A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US14/534,855 US10080004B2 (en) 2014-11-06 2014-11-06 Method and system for projector calibration

Publications (1)

Publication Number Publication Date
HK1224467A1 true HK1224467A1 (zh) 2017-08-18

Family

ID=54359745

Family Applications (1)

Application Number Title Priority Date Filing Date
HK16112425.2A HK1224467A1 (zh) 2014-11-06 2016-10-28 用於投影儀校準的方法和系統

Country Status (4)

Country Link
US (2) US10080004B2 (zh)
EP (1) EP3018903B1 (zh)
CN (1) CN105592310B (zh)
HK (1) HK1224467A1 (zh)

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DE102017202652A1 (de) * 2017-02-20 2018-08-23 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur Kalibrierung mittels projizierter Muster
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CN110784692B (zh) * 2018-07-31 2022-07-05 中强光电股份有限公司 投影装置、投影系统及影像校正方法
KR20210094517A (ko) * 2018-09-18 2021-07-29 니어맵 오스트레일리아 프로프라이어테리 리미티드 3d 기하학 추출을 위해 복수의 이미지들로부터 상보적 이미지를 선택하는 시스템 및 방법
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CN114830190A (zh) * 2019-12-29 2022-07-29 魔眼公司 将三维坐标与二维特征点相关联
CN111311686B (zh) * 2020-01-15 2023-05-02 浙江大学 一种基于边缘感知的投影仪失焦校正方法
US11303864B2 (en) * 2020-09-09 2022-04-12 Christie Digital Systems Usa, Inc. System and method for projector alignment using detected image features
CN112614075B (zh) * 2020-12-29 2024-03-08 凌云光技术股份有限公司 一种面结构光3d系统的畸变校正方法及设备
CN114727073B (zh) * 2021-01-05 2023-09-01 成都极米科技股份有限公司 一种图像的投影方法、装置、可读存储介质及电子设备
CN113251951B (zh) * 2021-04-26 2024-03-01 湖北汽车工业学院 基于单标定面映射的线结构光视觉测量系统的标定方法
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Also Published As

Publication number Publication date
EP3018903A2 (en) 2016-05-11
US20160134851A1 (en) 2016-05-12
US20180376116A1 (en) 2018-12-27
EP3018903A3 (en) 2016-09-28
CN105592310A (zh) 2016-05-18
CN105592310B (zh) 2019-02-12
EP3018903B1 (en) 2021-03-24
US11115633B2 (en) 2021-09-07
US10080004B2 (en) 2018-09-18

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