HK1211703A1 - 檢查設備、方法和系統 - Google Patents

檢查設備、方法和系統

Info

Publication number
HK1211703A1
HK1211703A1 HK15112552.8A HK15112552A HK1211703A1 HK 1211703 A1 HK1211703 A1 HK 1211703A1 HK 15112552 A HK15112552 A HK 15112552A HK 1211703 A1 HK1211703 A1 HK 1211703A1
Authority
HK
Hong Kong
Prior art keywords
inspection device
inspection
Prior art date
Application number
HK15112552.8A
Other languages
English (en)
Inventor
麗楊戴天杙黃清萍 陳志强張
Original Assignee
Univ Tsinghua
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tsinghua, Nuctech Co Ltd filed Critical Univ Tsinghua
Publication of HK1211703A1 publication Critical patent/HK1211703A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01V5/222—
    • G01V5/223—
    • G01V5/232—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
HK15112552.8A 2014-03-04 2015-12-21 檢查設備、方法和系統 HK1211703A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410075765.1A CN104897703B (zh) 2014-03-04 2014-03-04 检查设备、方法和系统

Publications (1)

Publication Number Publication Date
HK1211703A1 true HK1211703A1 (zh) 2016-05-27

Family

ID=54030502

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15112552.8A HK1211703A1 (zh) 2014-03-04 2015-12-21 檢查設備、方法和系統

Country Status (11)

Country Link
US (1) US10408966B2 (zh)
EP (1) EP3115773B1 (zh)
JP (1) JP6306738B2 (zh)
KR (1) KR101862692B1 (zh)
CN (1) CN104897703B (zh)
AU (2) AU2015226613A1 (zh)
BR (1) BR112016016805B1 (zh)
ES (1) ES2871025T3 (zh)
HK (1) HK1211703A1 (zh)
RU (1) RU2636810C1 (zh)
WO (1) WO2015131802A1 (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106896121B (zh) 2015-12-18 2019-07-05 清华大学 检测系统和方法
CN108414546A (zh) * 2018-05-10 2018-08-17 同方威视技术股份有限公司 透射检查设备和检查方法
DE102019208888A1 (de) * 2019-06-19 2020-12-24 Friedrich-Alexander-Universität Erlangen-Nürnberg Verfahren zur Herstellung eines Streustrahlkollimators, Streustrahlkollimator und Röntgengerät mit Streustrahlkollimator
CN110428478B (zh) * 2019-07-15 2021-09-24 清华大学 交替光源扇束x射线ct采样方法及装置
CN115236757A (zh) * 2019-08-09 2022-10-25 同方威视技术股份有限公司 检查系统

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Publication number Priority date Publication date Assignee Title
SU1191796A1 (ru) * 1983-12-27 1985-11-15 Киевский Ордена Ленина Государственный Университет Им.Т.Г.Шевченко Малоугловой рентгеновский дифрактометр
US5263075A (en) * 1992-01-13 1993-11-16 Ion Track Instruments, Inc. High angular resolution x-ray collimator
GB2297835A (en) * 1995-02-08 1996-08-14 Secr Defence Three dimensional detection of contraband using x rays
CN1146890A (zh) * 1995-03-30 1997-04-09 西门子公司 用于电子束x线断层成相的固定隔板准直器
RU2119659C1 (ru) * 1997-01-24 1998-09-27 Закрытое акционерное общество "Кванта Инвест" Устройство для малоугловой топографии (варианты)
JP2000235007A (ja) * 1999-02-15 2000-08-29 Hitachi Engineering & Services Co Ltd Ｘ線ｃｔスキャナ装置およびｘ線貨物検査方法
DE19954664B4 (de) * 1999-11-13 2006-06-08 Smiths Heimann Gmbh Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien eines Gegenstandes
DE50100675D1 (de) * 2001-03-14 2003-10-30 Yxlon Int X Ray Gmbh Anordnung zum Messen des Impulsübertragungsspektrums von in einem Untersuchungsbereich für Behältnisse elastisch gestreuten Röntgenquanten
TW583463B (en) 2002-11-07 2004-04-11 Toppoly Optoelectronics Corp Transflective liquid crystal display
US7116751B2 (en) 2003-04-02 2006-10-03 Reveal Imaging Technologies, Inc. System and method for resolving threats in automated explosives detection in baggage and other parcels
US7092485B2 (en) * 2003-05-27 2006-08-15 Control Screening, Llc X-ray inspection system for detecting explosives and other contraband
WO2005120354A1 (en) * 2004-06-07 2005-12-22 Philips Intellectual Property & Standards Gmbh Coherent-scatter computer tomograph
US7697664B2 (en) * 2006-05-15 2010-04-13 Morpho Detection, Inc. Systems and methods for determining an atomic number of a substance
JP4860418B2 (ja) * 2006-10-10 2012-01-25 株式会社リガク Ｘ線光学系
US7742563B2 (en) * 2008-09-10 2010-06-22 Morpho Detection, Inc. X-ray source and detector configuration for a non-translational x-ray diffraction system
US20110188632A1 (en) * 2010-02-03 2011-08-04 Geoffrey Harding Multiple plane multi-inverse fan-beam detection systems and method for using the same
CN103153190A (zh) * 2010-10-13 2013-06-12 皇家飞利浦电子股份有限公司 多模态紧凑型膛成像系统
NL2009049C2 (en) * 2012-06-21 2013-12-24 Entech Scient B V Method and device for identifying unknown substances in an object.
CN103330570B (zh) * 2013-04-27 2016-06-08 中国人民解放军北京军区总医院 X射线准直器、x射线准直系统及移动ct扫描仪
CN103385732A (zh) * 2013-07-25 2013-11-13 中国科学院苏州生物医学工程技术研究所 一种静态ct扫描仪
CN203929678U (zh) * 2014-03-04 2014-11-05 清华大学 检查设备和系统

Also Published As

Publication number Publication date
BR112016016805B1 (pt) 2020-10-20
ES2871025T3 (es) 2021-10-28
EP3115773B1 (en) 2021-03-03
AU2015226613A1 (en) 2016-07-28
RU2636810C1 (ru) 2017-11-28
AU2017265073A1 (en) 2017-12-14
KR20160128365A (ko) 2016-11-07
KR101862692B1 (ko) 2018-05-31
JP2016540999A (ja) 2016-12-28
US10408966B2 (en) 2019-09-10
US20170075026A1 (en) 2017-03-16
AU2017265073B2 (en) 2019-04-18
BR112016016805A2 (zh) 2018-06-05
EP3115773A1 (en) 2017-01-11
JP6306738B2 (ja) 2018-04-04
EP3115773A4 (en) 2017-10-18
WO2015131802A1 (zh) 2015-09-11
CN104897703B (zh) 2018-09-28
CN104897703A (zh) 2015-09-09

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