SG11201707507RA - Semiconductor x-ray detector - Google Patents
Semiconductor x-ray detectorInfo
- Publication number
- SG11201707507RA SG11201707507RA SG11201707507RA SG11201707507RA SG11201707507RA SG 11201707507R A SG11201707507R A SG 11201707507RA SG 11201707507R A SG11201707507R A SG 11201707507RA SG 11201707507R A SG11201707507R A SG 11201707507RA SG 11201707507R A SG11201707507R A SG 11201707507RA
- Authority
- SG
- Singapore
- Prior art keywords
- semiconductor
- ray detector
- ray
- detector
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
- A61B6/4233—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using matrix detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/48—Diagnostic techniques
- A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Medical Informatics (AREA)
- Engineering & Computer Science (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Heart & Thoracic Surgery (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Animal Behavior & Ethology (AREA)
- Biophysics (AREA)
- Surgery (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Optics & Photonics (AREA)
- Radiology & Medical Imaging (AREA)
- Biomedical Technology (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2015/075950 WO2016161544A1 (en) | 2015-04-07 | 2015-04-07 | Semiconductor x-ray detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG11201707507RA true SG11201707507RA (en) | 2017-10-30 |
Family
ID=57071690
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11201707507RA SG11201707507RA (en) | 2015-04-07 | 2015-04-07 | Semiconductor x-ray detector |
Country Status (10)
| Country | Link |
|---|---|
| US (4) | US10061038B2 (zh) |
| EP (1) | EP3281039B1 (zh) |
| JP (1) | JP6385591B2 (zh) |
| KR (1) | KR101941899B1 (zh) |
| CN (1) | CN108271415B (zh) |
| ES (1) | ES2795831T3 (zh) |
| IL (1) | IL254526B (zh) |
| SG (1) | SG11201707507RA (zh) |
| TW (1) | TWI672517B (zh) |
| WO (1) | WO2016161544A1 (zh) |
Families Citing this family (43)
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| ES2795831T3 (es) * | 2015-04-07 | 2020-11-24 | Shenzhen Xpectvision Tech Co Ltd | Detector de rayos X semiconductor |
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| WO2018006258A1 (en) * | 2016-07-05 | 2018-01-11 | Shenzhen Xpectvision Technology Co., Ltd. | Bonding materials of dissimilar coefficients of thermal expansion |
| US10775323B2 (en) * | 2016-10-18 | 2020-09-15 | Kla-Tencor Corporation | Full beam metrology for X-ray scatterometry systems |
| EP3532873B1 (en) | 2016-10-27 | 2021-06-23 | Shenzhen Xpectvision Technology Co., Ltd. | Dark noise compensation in a radiation detector |
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| EP3571530B1 (en) | 2017-01-23 | 2024-07-17 | Shenzhen Xpectvision Technology Co., Ltd. | A radiation detector with dynamically allocated memory for particle counting |
| EP3571531A4 (en) * | 2017-01-23 | 2020-08-05 | Shenzhen Xpectvision Technology Co., Ltd. | X-RAY DETECTORS CAPABLE OF IDENTIFYING AND MANAGING LOAD SHARING |
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| CN110914713B (zh) * | 2017-07-26 | 2023-07-18 | 深圳帧观德芯科技有限公司 | 能够管理周边电荷共享的x射线检测器 |
| CN110892292B (zh) | 2017-07-26 | 2023-09-22 | 深圳帧观德芯科技有限公司 | 辐射检测器和用于从该辐射检测器输出数据的方法 |
| WO2019080036A1 (en) | 2017-10-26 | 2019-05-02 | Shenzhen Xpectvision Technology Co., Ltd. | RADIATION DETECTOR CAPABLE OF PROCESSING NOISE |
| CN111279222B (zh) * | 2017-10-30 | 2023-07-28 | 深圳源光科技有限公司 | 具有高时间分辨率的lidar检测器 |
| CN111226136B (zh) | 2017-10-30 | 2023-07-18 | 深圳帧观德芯科技有限公司 | 辐射检测器中的暗噪声补偿 |
| US20190154852A1 (en) * | 2017-11-16 | 2019-05-23 | NueVue Solutions, Inc. | Analog Direct Digital X-Ray Photon Counting Detector For Resolving Photon Energy In Spectral X-Ray CT |
| WO2019144324A1 (en) * | 2018-01-24 | 2019-08-01 | Shenzhen Xpectvision Technology Co., Ltd. | Packaging of radiation detectors in an image sensor |
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| EP3525229A1 (en) * | 2018-02-13 | 2019-08-14 | Universiteit Maastricht | Incident particle localization method and system |
| US11464470B2 (en) | 2018-04-11 | 2022-10-11 | University Of Florida Research Foundation, Incorporated | X-ray backscatter systems and methods for performing imaging tomosynthesis |
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| WO2020056613A1 (en) * | 2018-09-19 | 2020-03-26 | Shenzhen Xpectvision Technology Co., Ltd. | An imaging method |
| CN112930485A (zh) * | 2018-11-06 | 2021-06-08 | 深圳帧观德芯科技有限公司 | 一种前列腺成像装置 |
| CN112888967B (zh) * | 2018-11-06 | 2024-06-28 | 深圳帧观德芯科技有限公司 | 具有辐射检测器和掩模的图像传感器 |
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Also Published As
| Publication number | Publication date |
|---|---|
| EP3281039A4 (en) | 2018-07-11 |
| TWI672517B (zh) | 2019-09-21 |
| IL254526A0 (en) | 2017-11-30 |
| CN108271415A (zh) | 2018-07-10 |
| EP3281039A1 (en) | 2018-02-14 |
| US10514472B2 (en) | 2019-12-24 |
| US10061038B2 (en) | 2018-08-28 |
| US20180224563A1 (en) | 2018-08-09 |
| US11013479B2 (en) | 2021-05-25 |
| US20210007685A1 (en) | 2021-01-14 |
| ES2795831T3 (es) | 2020-11-24 |
| EP3281039B1 (en) | 2020-03-11 |
| WO2016161544A1 (en) | 2016-10-13 |
| CN108271415B (zh) | 2019-03-05 |
| US10820867B2 (en) | 2020-11-03 |
| TW201640142A (zh) | 2016-11-16 |
| KR101941899B1 (ko) | 2019-01-24 |
| JP2018511809A (ja) | 2018-04-26 |
| KR20170140175A (ko) | 2017-12-20 |
| US20180017685A1 (en) | 2018-01-18 |
| IL254526B (en) | 2019-07-31 |
| US20200064499A1 (en) | 2020-02-27 |
| JP6385591B2 (ja) | 2018-09-05 |
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