SG11201606945PA - Workpiece double-disc grinding method - Google Patents
Workpiece double-disc grinding methodInfo
- Publication number
- SG11201606945PA SG11201606945PA SG11201606945PA SG11201606945PA SG11201606945PA SG 11201606945P A SG11201606945P A SG 11201606945PA SG 11201606945P A SG11201606945P A SG 11201606945PA SG 11201606945P A SG11201606945P A SG 11201606945PA SG 11201606945P A SG11201606945P A SG 11201606945PA
- Authority
- SG
- Singapore
- Prior art keywords
- grinding method
- disc grinding
- workpiece double
- workpiece
- double
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/10—Single-purpose machines or devices
- B24B7/16—Single-purpose machines or devices for grinding end-faces, e.g. of gauges, rollers, nuts, piston rings
- B24B7/17—Single-purpose machines or devices for grinding end-faces, e.g. of gauges, rollers, nuts, piston rings for simultaneously grinding opposite and parallel end faces, e.g. double disc grinders
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02013—Grinding, lapping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014031004A JP6040947B2 (en) | 2014-02-20 | 2014-02-20 | Double-head grinding method for workpieces |
PCT/JP2015/000295 WO2015125412A1 (en) | 2014-02-20 | 2015-01-23 | Double-headed workpiece grinding method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201606945PA true SG11201606945PA (en) | 2016-10-28 |
Family
ID=53877940
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201606945PA SG11201606945PA (en) | 2014-02-20 | 2015-01-23 | Workpiece double-disc grinding method |
Country Status (8)
Country | Link |
---|---|
US (1) | US9962802B2 (en) |
JP (1) | JP6040947B2 (en) |
KR (1) | KR102098260B1 (en) |
CN (1) | CN105980103B (en) |
DE (1) | DE112015000522T5 (en) |
SG (1) | SG11201606945PA (en) |
TW (1) | TWI602656B (en) |
WO (1) | WO2015125412A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7159861B2 (en) | 2018-12-27 | 2022-10-25 | 株式会社Sumco | Double-headed grinding method |
CN110118683B (en) * | 2019-06-12 | 2020-06-19 | 华东理工大学 | Micro-sample grinding device |
CN114227524A (en) * | 2021-12-30 | 2022-03-25 | 西安奕斯伟材料科技有限公司 | Double-side polishing apparatus and double-side polishing method |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3616578A (en) * | 1969-01-10 | 1971-11-02 | Ingersoll Milling Machine Co | Method for turning workpieces |
JPS5733928A (en) * | 1980-07-29 | 1982-02-24 | Inoue Japax Res Inc | Carbon electrode for electric discharge machining |
JPS5871062A (en) * | 1981-10-24 | 1983-04-27 | Ntn Toyo Bearing Co Ltd | Machining method of inner ring in tapered roller bearing |
US5643051A (en) * | 1995-06-16 | 1997-07-01 | The University Of Connecticut | Centerless grinding process and apparatus therefor |
KR100227924B1 (en) * | 1995-07-28 | 1999-11-01 | 가이데 히사오 | Wafer fabricating method and polishing method therefor and apparatus thereof |
JP3471167B2 (en) * | 1996-05-21 | 2003-11-25 | 昭和電工株式会社 | Method for producing cubic boron nitride |
TW589415B (en) * | 1998-03-09 | 2004-06-01 | Shinetsu Handotai Kk | Method for producing silicon single crystal wafer and silicon single crystal wafer |
JP2000052209A (en) * | 1998-08-06 | 2000-02-22 | Nippon Sheet Glass Co Ltd | Double-headed flat surface grinding device and grinding method using it |
JP2005238444A (en) * | 1999-05-07 | 2005-09-08 | Shin Etsu Handotai Co Ltd | Double-sided simultaneous grinding method, double-sided simultaneous grinding machine, double-sided simultaneous lapping method and double-sided simultaneous lapping machine |
GB2357720B (en) * | 1999-10-27 | 2003-05-07 | Unova Uk Ltd | Crankpin grinding method |
DE10023002B4 (en) * | 2000-05-11 | 2006-10-26 | Siltronic Ag | Set of carriers and its use |
US6709981B2 (en) * | 2000-08-16 | 2004-03-23 | Memc Electronic Materials, Inc. | Method and apparatus for processing a semiconductor wafer using novel final polishing method |
JP4038429B2 (en) * | 2000-10-26 | 2008-01-23 | 信越半導体株式会社 | Wafer manufacturing method, polishing apparatus, and wafer |
DE10058305A1 (en) * | 2000-11-24 | 2002-06-06 | Wacker Siltronic Halbleitermat | Process for the surface polishing of silicon wafers |
JP4093793B2 (en) * | 2002-04-30 | 2008-06-04 | 信越半導体株式会社 | Semiconductor wafer manufacturing method and wafer |
JP2005246510A (en) * | 2004-03-02 | 2005-09-15 | Nissan Motor Co Ltd | Highly smooth grinding method for metal material, and highly smooth grinding device for metal material |
JP4420023B2 (en) * | 2004-08-17 | 2010-02-24 | 信越半導体株式会社 | Semiconductor wafer measurement method, manufacturing process management method, and semiconductor wafer manufacturing method |
CN101056741B (en) * | 2004-11-19 | 2010-12-08 | 丰田万磨株式会社 | Grinding wheel |
JP4670566B2 (en) * | 2005-09-29 | 2011-04-13 | 信越半導体株式会社 | Semiconductor wafer double-head grinding apparatus, hydrostatic pad and double-head grinding method using the same |
JP2007210054A (en) * | 2006-02-08 | 2007-08-23 | Toshiba Ceramics Co Ltd | Cup type grinding wheel, double-end grinder and double-end grinding method |
JP5141072B2 (en) * | 2006-04-25 | 2013-02-13 | 日本精工株式会社 | Manufacturing method of outer ring for bearing unit |
DE102006032455A1 (en) * | 2006-07-13 | 2008-04-10 | Siltronic Ag | Method for simultaneous double-sided grinding of a plurality of semiconductor wafers and semiconductor wafer with excellent flatness |
KR100772034B1 (en) * | 2006-12-08 | 2007-10-31 | 주식회사 썬텍인더스트리 | Method for preparing abrasive sheet having coated three-dimensional abrasive structures |
JP2009094326A (en) | 2007-10-10 | 2009-04-30 | Disco Abrasive Syst Ltd | Method of grinding wafer |
JP4985451B2 (en) * | 2008-02-14 | 2012-07-25 | 信越半導体株式会社 | Double-head grinding apparatus for workpiece and double-head grinding method for workpiece |
JP6032087B2 (en) * | 2012-03-30 | 2016-11-24 | 三菱化学株式会社 | Method for producing group 13 nitride crystal substrate |
JP5724958B2 (en) * | 2012-07-03 | 2015-05-27 | 信越半導体株式会社 | Double-head grinding apparatus and double-head grinding method for workpiece |
-
2014
- 2014-02-20 JP JP2014031004A patent/JP6040947B2/en active Active
-
2015
- 2015-01-23 WO PCT/JP2015/000295 patent/WO2015125412A1/en active Application Filing
- 2015-01-23 KR KR1020167022753A patent/KR102098260B1/en active IP Right Grant
- 2015-01-23 CN CN201580008363.2A patent/CN105980103B/en active Active
- 2015-01-23 US US15/116,130 patent/US9962802B2/en active Active
- 2015-01-23 SG SG11201606945PA patent/SG11201606945PA/en unknown
- 2015-01-23 DE DE112015000522.6T patent/DE112015000522T5/en active Pending
- 2015-02-09 TW TW104104270A patent/TWI602656B/en active
Also Published As
Publication number | Publication date |
---|---|
JP2015155129A (en) | 2015-08-27 |
CN105980103B (en) | 2017-12-01 |
TW201600247A (en) | 2016-01-01 |
JP6040947B2 (en) | 2016-12-07 |
US20170136596A1 (en) | 2017-05-18 |
DE112015000522T5 (en) | 2016-10-13 |
US9962802B2 (en) | 2018-05-08 |
CN105980103A (en) | 2016-09-28 |
KR102098260B1 (en) | 2020-04-07 |
WO2015125412A1 (en) | 2015-08-27 |
KR20160124110A (en) | 2016-10-26 |
TWI602656B (en) | 2017-10-21 |
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