SG107676A1 - Diffuser plate and method of making same - Google Patents

Diffuser plate and method of making same

Info

Publication number
SG107676A1
SG107676A1 SG200400112A SG200400112A SG107676A1 SG 107676 A1 SG107676 A1 SG 107676A1 SG 200400112 A SG200400112 A SG 200400112A SG 200400112 A SG200400112 A SG 200400112A SG 107676 A1 SG107676 A1 SG 107676A1
Authority
SG
Singapore
Prior art keywords
diffuser plate
making same
making
same
diffuser
Prior art date
Application number
SG200400112A
Other languages
English (en)
Inventor
H Augustyn Walter
A Gontin Richard
Original Assignee
Asml Holding Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Holding Nv filed Critical Asml Holding Nv
Publication of SG107676A1 publication Critical patent/SG107676A1/en

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70591—Testing optical components
    • G03F7/706—Aberration measurement
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7085—Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
SG200400112A 2003-01-15 2004-01-12 Diffuser plate and method of making same SG107676A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US44005303P 2003-01-15 2003-01-15
US10/688,923 US7002747B2 (en) 2003-01-15 2003-10-21 Diffuser plate and method of making same

Publications (1)

Publication Number Publication Date
SG107676A1 true SG107676A1 (en) 2004-12-29

Family

ID=32600287

Family Applications (2)

Application Number Title Priority Date Filing Date
SG200400112A SG107676A1 (en) 2003-01-15 2004-01-12 Diffuser plate and method of making same
SG200602856-7A SG143070A1 (en) 2003-01-15 2004-01-12 Diffuser plate and method of making same

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG200602856-7A SG143070A1 (en) 2003-01-15 2004-01-12 Diffuser plate and method of making same

Country Status (8)

Country Link
US (2) US7002747B2 (ja)
EP (1) EP1439426B1 (ja)
JP (1) JP4131704B2 (ja)
KR (1) KR100586344B1 (ja)
CN (1) CN1278142C (ja)
DE (1) DE602004009841T2 (ja)
SG (2) SG107676A1 (ja)
TW (1) TWI287693B (ja)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7837361B2 (en) * 2000-07-14 2010-11-23 Ledalite Architectural Products Light control devices implemented with diffusers having controllable diffusion characteristics
US6867846B2 (en) * 2003-01-15 2005-03-15 Asml Holding Nv Tailored reflecting diffractor for EUV lithographic system aberration measurement
US7027164B2 (en) * 2003-01-15 2006-04-11 Asml Holding N.V. Speckle reduction method and system for EUV interferometry
US7268891B2 (en) * 2003-01-15 2007-09-11 Asml Holding N.V. Transmission shear grating in checkerboard configuration for EUV wavefront sensor
US7081956B1 (en) * 2003-12-04 2006-07-25 Advanced Micro Devices, Inc. Method and device for determining reflection lens pupil transmission distribution and illumination intensity distribution in reflective imaging system
US20050259269A1 (en) * 2004-05-19 2005-11-24 Asml Holding N.V. Shearing interferometer with dynamic pupil fill
US20050275841A1 (en) * 2004-06-09 2005-12-15 Asml Netherlands B.V. Alignment marker and lithographic apparatus and device manufacturing method using the same
JP4518078B2 (ja) 2004-09-22 2010-08-04 株式会社ニコン 照明装置、露光装置及びマイクロデバイスの製造方法
JP2006332586A (ja) * 2005-04-25 2006-12-07 Canon Inc 測定装置、露光装置及び方法、並びに、デバイス製造方法
KR100735530B1 (ko) * 2006-02-02 2007-07-04 삼성전자주식회사 단차를 가진 반사층을 포함하는 반사형 포토마스크 및 그 제조방법
EP2145130B1 (en) * 2007-04-10 2014-12-17 Ledalite Architectural Products, Inc. Light control device exhibiting batwing luminous intensity distributions in upper and lower hemispheres
NL1036305A1 (nl) * 2007-12-21 2009-06-23 Asml Netherlands Bv Grating for EUV-radiation, method for manufacturing the grating and wavefront measurement system.
US7821900B2 (en) * 2008-05-15 2010-10-26 Northrop Grumman Systems Corporation Diffractive optical element and method of designing the same
NL2002838A1 (nl) * 2008-05-30 2009-12-01 Asml Netherlands Bv Radiation system, radiation collector, radiation beam conditioning system, spectral purity filter for a radiation system and method of forming a spectral purity filter.
CN101907781B (zh) * 2010-07-13 2012-04-18 杭州电子科技大学 一种具有光束会聚功能的光学平板制作方法
WO2013113537A2 (en) * 2012-01-30 2013-08-08 Asml Netherlands B.V. Optical element, lithographic apparatus incorporating such an element, method of manufacturing an optical element
CN104111120B (zh) * 2014-07-25 2017-05-31 中国科学院上海光学精密机械研究所 基于朗奇剪切干涉仪的相位提取方法
DE102014221313A1 (de) 2014-10-21 2016-04-21 Carl Zeiss Smt Gmbh Beleuchtung für die EUV-Projektionslithografie
WO2019079010A1 (en) * 2017-10-19 2019-04-25 Cymer, Llc FORMATION OF MULTIPLE AERIAL IMAGES IN ONE LITHOGRAPHIC EXPOSURE PASSAGE
CN108709160A (zh) * 2018-06-15 2018-10-26 浙江彩丞照明科技有限公司 一种可对光线进行漫反射的眩光抑制板
US20200379336A1 (en) * 2019-06-03 2020-12-03 Kla Corporation Wave-Front Aberration Metrology of Extreme Ultraviolet Mask Inspection Systems

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5641593A (en) * 1993-10-15 1997-06-24 Canon Kabushiki Kaisha Lithographic mask and exposure apparatus using the same
JP2000266914A (ja) * 1999-03-12 2000-09-29 Toppan Printing Co Ltd 光拡散体およびそれを用いた表示装置
US6163405A (en) * 1999-04-15 2000-12-19 Industrial Technology Research Institute Structure of a reflection-type light diffuser in a LCD
US20010051304A1 (en) * 1999-12-30 2001-12-13 Stivers Alan R. Method and apparatus for a reflective mask that is inspected at a first wavelength and exposed during semiconductor manufacturing at a second wavelength
US6392792B1 (en) * 2000-12-05 2002-05-21 The Regents Of The University Of California Method of fabricating reflection-mode EUV diffraction elements

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2269055B (en) * 1992-07-09 1996-06-05 Flat Antenna Co Ltd Phase correcting zone plate
EP0712012A1 (en) * 1994-11-09 1996-05-15 International Business Machines Corporation Authentication label and authenticating pattern incorporating diffracting structure and method of fabricating them
US5958629A (en) * 1997-12-22 1999-09-28 Intel Corporation Using thin films as etch stop in EUV mask fabrication process
US6072631A (en) * 1998-07-09 2000-06-06 3M Innovative Properties Company Diffractive homogenizer with compensation for spatial coherence
DE19958201A1 (de) * 1999-12-02 2001-06-21 Infineon Technologies Ag Lithographieverfahren und Maske zu dessen Durchführung
GB9928483D0 (en) 1999-12-03 2000-02-02 Renishaw Plc Opto-electronic scale reading apparatus
EP1197803B1 (en) 2000-10-10 2012-02-01 ASML Netherlands B.V. Lithographic apparatus
US6656643B2 (en) 2001-02-20 2003-12-02 Chartered Semiconductor Manufacturing Ltd. Method of extreme ultraviolet mask engineering
US7027226B2 (en) * 2001-09-17 2006-04-11 Euv Llc Diffractive optical element for extreme ultraviolet wavefront control

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5641593A (en) * 1993-10-15 1997-06-24 Canon Kabushiki Kaisha Lithographic mask and exposure apparatus using the same
JP2000266914A (ja) * 1999-03-12 2000-09-29 Toppan Printing Co Ltd 光拡散体およびそれを用いた表示装置
US6163405A (en) * 1999-04-15 2000-12-19 Industrial Technology Research Institute Structure of a reflection-type light diffuser in a LCD
US20010051304A1 (en) * 1999-12-30 2001-12-13 Stivers Alan R. Method and apparatus for a reflective mask that is inspected at a first wavelength and exposed during semiconductor manufacturing at a second wavelength
US6392792B1 (en) * 2000-12-05 2002-05-21 The Regents Of The University Of California Method of fabricating reflection-mode EUV diffraction elements

Also Published As

Publication number Publication date
DE602004009841D1 (de) 2007-12-20
US7002747B2 (en) 2006-02-21
TW200417814A (en) 2004-09-16
US7164534B2 (en) 2007-01-16
KR100586344B1 (ko) 2006-06-08
CN1519590A (zh) 2004-08-11
EP1439426A3 (en) 2005-02-16
EP1439426A2 (en) 2004-07-21
US20050248743A1 (en) 2005-11-10
TWI287693B (en) 2007-10-01
DE602004009841T2 (de) 2008-02-21
US20040136075A1 (en) 2004-07-15
SG143070A1 (en) 2008-06-27
CN1278142C (zh) 2006-10-04
KR20040066017A (ko) 2004-07-23
EP1439426B1 (en) 2007-11-07
JP2004221599A (ja) 2004-08-05
JP4131704B2 (ja) 2008-08-13

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