SG10202111784SA - System for controlling a scrubbing process system, method of a controller controlling a scrubbing process, and program - Google Patents
System for controlling a scrubbing process system, method of a controller controlling a scrubbing process, and programInfo
- Publication number
- SG10202111784SA SG10202111784SA SG10202111784SA SG10202111784SA SG10202111784SA SG 10202111784S A SG10202111784S A SG 10202111784SA SG 10202111784S A SG10202111784S A SG 10202111784SA SG 10202111784S A SG10202111784S A SG 10202111784SA SG 10202111784S A SG10202111784S A SG 10202111784SA
- Authority
- SG
- Singapore
- Prior art keywords
- scrubbing process
- controlling
- program
- controller controlling
- controller
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/12—Lapping plates for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/12—Lapping plates for working plane surfaces
- B24B37/14—Lapping plates for working plane surfaces characterised by the composition or properties of the plate materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/02—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
- B24B49/03—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent according to the final size of the previously ground workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/02—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
- B24B49/04—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent involving measurement of the workpiece at the place of grinding during grinding operation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/06—Dust extraction equipment on grinding or polishing machines
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016204676A JP6817778B2 (en) | 2016-10-18 | 2016-10-18 | Local polishing equipment, local polishing methods and programs |
JP2016204678A JP6753758B2 (en) | 2016-10-18 | 2016-10-18 | Polishing equipment, polishing methods and programs |
JP2016204675A JP6782145B2 (en) | 2016-10-18 | 2016-10-18 | Board processing control system, board processing control method, and program |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10202111784SA true SG10202111784SA (en) | 2021-12-30 |
Family
ID=62019303
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202111784SA SG10202111784SA (en) | 2016-10-18 | 2017-09-07 | System for controlling a scrubbing process system, method of a controller controlling a scrubbing process, and program |
SG10202111787PA SG10202111787PA (en) | 2016-10-18 | 2017-09-07 | Local polisher, method of a local polisher and program |
SG11201902651QA SG11201902651QA (en) | 2016-10-18 | 2017-09-07 | Substrate processing control system, substrate processing control method, and program |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202111787PA SG10202111787PA (en) | 2016-10-18 | 2017-09-07 | Local polisher, method of a local polisher and program |
SG11201902651QA SG11201902651QA (en) | 2016-10-18 | 2017-09-07 | Substrate processing control system, substrate processing control method, and program |
Country Status (4)
Country | Link |
---|---|
US (1) | US20190240799A1 (en) |
SG (3) | SG10202111784SA (en) |
TW (2) | TWI775569B (en) |
WO (1) | WO2018074091A1 (en) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7023455B2 (en) * | 2017-01-23 | 2022-02-22 | 不二越機械工業株式会社 | Work polishing method and work polishing equipment |
KR20200120958A (en) | 2018-03-13 | 2020-10-22 | 어플라이드 머티어리얼스, 인코포레이티드 | Machine learning systems for monitoring semiconductor processing |
JP6830464B2 (en) * | 2018-09-26 | 2021-02-17 | 株式会社Kokusai Electric | Substrate processing equipment, semiconductor device manufacturing methods and recording media. |
JP2020053550A (en) * | 2018-09-27 | 2020-04-02 | 株式会社荏原製作所 | Polishing device, polishing method, and machine learning device |
US11731232B2 (en) * | 2018-10-30 | 2023-08-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Irregular mechanical motion detection systems and method |
JP7220573B2 (en) * | 2019-01-24 | 2023-02-10 | 株式会社荏原製作所 | Information processing system, information processing method, program and substrate processing apparatus |
WO2020161534A1 (en) * | 2019-02-05 | 2020-08-13 | 3M Innovative Properties Company | Paint repair process by scenario |
JP7224265B2 (en) * | 2019-09-18 | 2023-02-17 | 株式会社荏原製作所 | machine learning device, substrate processing device, trained model, machine learning method, machine learning program |
JP2021108367A (en) * | 2019-12-27 | 2021-07-29 | 株式会社Screenホールディングス | Substrate processing apparatus, substrate processing method, substrate processing system, and learning data generation method |
JP7408421B2 (en) | 2020-01-30 | 2024-01-05 | 株式会社Screenホールディングス | Processing condition specifying method, substrate processing method, substrate product manufacturing method, computer program, storage medium, processing condition specifying device, and substrate processing device |
JP7390945B2 (en) | 2020-03-19 | 2023-12-04 | 株式会社荏原製作所 | Polishing equipment, information processing system and program |
US20220288774A1 (en) * | 2020-07-31 | 2022-09-15 | GrayMatter Robotics Inc. | System and method for autonomously scanning and processing a part |
JPWO2022070309A1 (en) * | 2020-09-30 | 2022-04-07 | ||
JP2022108789A (en) * | 2021-01-14 | 2022-07-27 | 株式会社荏原製作所 | Polishing device, polishing method, and method for outputting visualized information on film thickness distribution of base plate |
JP7420328B2 (en) | 2021-12-27 | 2024-01-23 | 株式会社レゾナック | Waviness prediction device, waviness prediction method, method and program for processing objects to be polished |
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JPH0349846A (en) * | 1989-07-13 | 1991-03-04 | Omron Corp | Control device adapted to grinding work |
JPH10264011A (en) * | 1997-03-24 | 1998-10-06 | Canon Inc | Precision polishing device and method |
JPH1190816A (en) * | 1997-09-22 | 1999-04-06 | Toshiba Corp | Polishing device and polishing method |
KR20010032223A (en) * | 1997-11-18 | 2001-04-16 | 카리 홀란드 | Method and apparatus for modeling a chemical mechanical polishing process |
JP4067164B2 (en) * | 1998-02-27 | 2008-03-26 | 東京エレクトロン株式会社 | Polishing method and polishing apparatus |
US6592429B1 (en) * | 2000-07-28 | 2003-07-15 | Advanced Micro Devices, Inc. | Method and apparatus for controlling wafer uniformity in a chemical mechanical polishing tool using carrier head signatures |
TWI221435B (en) * | 2001-01-20 | 2004-10-01 | Guo-Jen Wang | Method for optimizing timing control process parameters in chemical mechanical polishing |
US6540591B1 (en) * | 2001-04-18 | 2003-04-01 | Alexander J. Pasadyn | Method and apparatus for post-polish thickness and uniformity control |
JP2002343753A (en) * | 2001-05-21 | 2002-11-29 | Nikon Corp | Simulation method and apparatus thereof, machining apparatus, machining system, and semiconductor device manufacturing method |
US7160739B2 (en) * | 2001-06-19 | 2007-01-09 | Applied Materials, Inc. | Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles |
US6594024B1 (en) * | 2001-06-21 | 2003-07-15 | Advanced Micro Devices, Inc. | Monitor CMP process using scatterometry |
JP3811376B2 (en) * | 2001-08-08 | 2006-08-16 | 大日本スクリーン製造株式会社 | Substrate cleaning method and substrate cleaning apparatus |
US6630360B2 (en) * | 2002-01-10 | 2003-10-07 | Advanced Micro Devices, Inc. | Advanced process control (APC) of copper thickness for chemical mechanical planarization (CMP) optimization |
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JPWO2004075276A1 (en) * | 2003-02-18 | 2006-06-01 | 株式会社ニコン | Polishing apparatus, polishing method, and semiconductor device manufacturing method |
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TW200600263A (en) * | 2004-06-18 | 2006-01-01 | Trancom Technology Inc | Voiceprint data monitor system of chemical mechanical polishing equipment |
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JP2009028856A (en) * | 2007-07-27 | 2009-02-12 | Tokyo Seimitsu Co Ltd | Polishing end point detection method using torque change and apparatus thereof |
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JP2009194134A (en) * | 2008-02-14 | 2009-08-27 | Ebara Corp | Polishing method and polishing apparatus |
KR101170760B1 (en) * | 2009-07-24 | 2012-08-03 | 세메스 주식회사 | Substrate polishing apparatus |
JP2011060977A (en) * | 2009-09-09 | 2011-03-24 | Toshiba Corp | Manufacturing apparatus of semiconductor device and manufacturing method |
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US10065288B2 (en) * | 2012-02-14 | 2018-09-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical mechanical polishing (CMP) platform for local profile control |
JP2013176828A (en) * | 2012-02-29 | 2013-09-09 | Ebara Corp | Remote monitoring system of polishing end point detection device |
US20130241075A1 (en) * | 2012-03-13 | 2013-09-19 | Macronix International Co., Ltd. | Contact or via critical dimension control with novel closed loop control system in chemical mechanical planarization process |
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KR102211533B1 (en) * | 2013-10-23 | 2021-02-03 | 어플라이드 머티어리얼스, 인코포레이티드 | Polishing system with local area rate control |
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TWI692385B (en) * | 2014-07-17 | 2020-05-01 | 美商應用材料股份有限公司 | Method, system and polishing pad for chemical mechancal polishing |
CN106463384B (en) * | 2014-07-18 | 2020-03-17 | 应用材料公司 | Modifying a substrate thickness profile |
US10183374B2 (en) * | 2014-08-26 | 2019-01-22 | Ebara Corporation | Buffing apparatus, and substrate processing apparatus |
JP2016058724A (en) * | 2014-09-11 | 2016-04-21 | 株式会社荏原製作所 | Processing module, processor, and processing method |
-
2017
- 2017-09-07 SG SG10202111784SA patent/SG10202111784SA/en unknown
- 2017-09-07 SG SG10202111787PA patent/SG10202111787PA/en unknown
- 2017-09-07 SG SG11201902651QA patent/SG11201902651QA/en unknown
- 2017-09-07 US US16/338,931 patent/US20190240799A1/en active Pending
- 2017-09-07 WO PCT/JP2017/032306 patent/WO2018074091A1/en active Application Filing
- 2017-09-20 TW TW110130065A patent/TWI775569B/en active
- 2017-09-20 TW TW106132250A patent/TWI739906B/en active
Also Published As
Publication number | Publication date |
---|---|
TW201832872A (en) | 2018-09-16 |
TWI775569B (en) | 2022-08-21 |
US20190240799A1 (en) | 2019-08-08 |
TWI739906B (en) | 2021-09-21 |
SG11201902651QA (en) | 2019-05-30 |
SG10202111787PA (en) | 2021-11-29 |
TW202204090A (en) | 2022-02-01 |
WO2018074091A1 (en) | 2018-04-26 |
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