SE9804398L - Mätinstrument och förfarande för mätning av damm- och smutsbeläggningsgrad på en yta - Google Patents
Mätinstrument och förfarande för mätning av damm- och smutsbeläggningsgrad på en ytaInfo
- Publication number
- SE9804398L SE9804398L SE9804398A SE9804398A SE9804398L SE 9804398 L SE9804398 L SE 9804398L SE 9804398 A SE9804398 A SE 9804398A SE 9804398 A SE9804398 A SE 9804398A SE 9804398 L SE9804398 L SE 9804398L
- Authority
- SE
- Sweden
- Prior art keywords
- measurement
- dust
- intended
- measuring
- test film
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9804398A SE521948C2 (sv) | 1998-12-17 | 1998-12-17 | Mätinstrument och förfarande för mätning av damm- och smutsbeläggningsgrad på en yta |
JP2000591416A JP2002533717A (ja) | 1998-12-17 | 1999-12-17 | 表面の粉塵および汚れの程度を測定するための機器および方法 |
EP99964901A EP1147404A1 (en) | 1998-12-17 | 1999-12-17 | An instrument and a method for measuring the degree of dust and dirt on a surface |
PCT/SE1999/002405 WO2000039566A1 (en) | 1998-12-17 | 1999-12-17 | An instrument and a method for measuring the degree of dust and dirt on a surface |
AU30931/00A AU3093100A (en) | 1998-12-17 | 1999-12-17 | An instrument and a method for measuring the degree of dust and dirt on a surface |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9804398A SE521948C2 (sv) | 1998-12-17 | 1998-12-17 | Mätinstrument och förfarande för mätning av damm- och smutsbeläggningsgrad på en yta |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9804398D0 SE9804398D0 (sv) | 1998-12-17 |
SE9804398L true SE9804398L (sv) | 2000-06-18 |
SE521948C2 SE521948C2 (sv) | 2003-12-23 |
Family
ID=20413725
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9804398A SE521948C2 (sv) | 1998-12-17 | 1998-12-17 | Mätinstrument och förfarande för mätning av damm- och smutsbeläggningsgrad på en yta |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1147404A1 (sv) |
JP (1) | JP2002533717A (sv) |
AU (1) | AU3093100A (sv) |
SE (1) | SE521948C2 (sv) |
WO (1) | WO2000039566A1 (sv) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10145985C2 (de) * | 2001-09-18 | 2003-11-13 | Fkfs Forschungsinstitut Fuer K | Verfahren und Vorrichtungen zur Bestimmung der quantitativen Verschmutzung von Oberflächen |
EP1635167B1 (de) * | 2004-09-10 | 2007-10-31 | Cognis IP Management GmbH | Verfahren zur quantitativen Messung von Ablagerung auf festen Oberflächen |
US8174690B2 (en) | 2007-05-11 | 2012-05-08 | Argos Solutions As | Apparatus for characterizing a surface structure |
EP2410317A1 (de) * | 2010-07-13 | 2012-01-25 | Krämer AG Bassersdorf | Verfahren zum Beurteilen von an einem Körper anhaftenden Partikeln |
SE1250056A1 (sv) | 2012-01-27 | 2013-07-28 | Spaarab Produkter Ab | Detektering av kontaminerade områden |
KR101582461B1 (ko) * | 2014-10-22 | 2016-01-05 | 주식회사 제덱스 | 클린룸의 표면 입자 검출용 시험 필름 |
KR101809009B1 (ko) * | 2017-08-02 | 2017-12-15 | 주식회사 제덱스 | 투명 또는 반투명 필름의 표면 이물 검출기 |
CN110108536B (zh) * | 2019-06-18 | 2021-10-01 | 中国计量大学 | 一种用于定日镜面积灰度检测比对的标准板制作方法 |
DE102020212563A1 (de) | 2020-10-05 | 2022-04-07 | Carl Zeiss Smt Gmbh | Verfahren zur Bestimmung der Partikelbelastung einer Oberfläche |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1240052A (en) * | 1984-11-30 | 1988-08-02 | Motoji Shiozumi | Method of and apparatus for determining glossinesses of surface of body |
US5083161A (en) * | 1989-08-25 | 1992-01-21 | Xerox Corporation | Densitometer for measuring developability |
DK163538C (da) * | 1990-03-22 | 1992-08-03 | Abk Bygge & Miljoeteknik | Fremgangsmaade og maaleapparat til rengoeringskontrol |
US5461481A (en) * | 1992-12-29 | 1995-10-24 | Research Technology International Company | System, apparatus and/or method for analyzing light intensities of light reflected from a surface of a sample |
US5412221A (en) * | 1994-04-26 | 1995-05-02 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Particle fallout/activity sensor |
NO307675B1 (no) * | 1997-04-18 | 2000-05-08 | Lasse Leirfall | Anvendelse av en mÕleanordning til indikering av en forurenset, tilsmusset eller brannfarlig tilstand |
-
1998
- 1998-12-17 SE SE9804398A patent/SE521948C2/sv not_active IP Right Cessation
-
1999
- 1999-12-17 AU AU30931/00A patent/AU3093100A/en not_active Abandoned
- 1999-12-17 JP JP2000591416A patent/JP2002533717A/ja not_active Withdrawn
- 1999-12-17 WO PCT/SE1999/002405 patent/WO2000039566A1/en not_active Application Discontinuation
- 1999-12-17 EP EP99964901A patent/EP1147404A1/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
EP1147404A1 (en) | 2001-10-24 |
AU3093100A (en) | 2000-07-31 |
WO2000039566A1 (en) | 2000-07-06 |
SE521948C2 (sv) | 2003-12-23 |
SE9804398D0 (sv) | 1998-12-17 |
JP2002533717A (ja) | 2002-10-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI285737B (en) | Inspection of transparent substrates for defects | |
US5657124A (en) | Method of measuring the thickness of a transparent material | |
DE69739604D1 (de) | Vorrichtung und verfahren zum messen der optischen eigenschaften eines objektes | |
WO2000026609A3 (en) | Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing | |
WO1991000993A1 (en) | Measuring apparatus and method | |
ATE237122T1 (de) | Verfahren und vorrichtungen zur prüfung von beschichtungen | |
US5572322A (en) | Apparatus for measuring particle properties | |
SE9804398L (sv) | Mätinstrument och förfarande för mätning av damm- och smutsbeläggningsgrad på en yta | |
DE59207100D1 (de) | Einrichtung für Oberflächeninspektionen | |
JPH11344316A (ja) | 膜厚測定方法 | |
FI78355C (sv) | Metod för mätning av glans och apparatur för tillämpning av metoden | |
KR20200058287A (ko) | 응결 수단을 이용한 표면 검측 장치 및 그 방법 | |
JP2019518197A (ja) | マイクロエレクトロニクス用または光学用の基板をレーザドップラ効果によって検査するための方法およびシステム | |
JPS6038827A (ja) | 自動異物検査装置の感度校正方法 | |
US20060102831A1 (en) | Method and device for in-line measurment of characteristics of the surface coating of a metallurgy product | |
ATE127919T1 (de) | Verfahren zur diffusen beleuchtung einer messfläche in einem testträgeranalysegerät. | |
JPH06118009A (ja) | 異物検査装置および異物検査方法 | |
JP5163933B2 (ja) | 膜厚測定装置 | |
JP4709430B2 (ja) | 濃度測定装置 | |
JP2521581B2 (ja) | 塗装面のスリキズ性測定装置 | |
KOBA | Novel in situ spectroscopic ellipsometer for real time analysis of CVD diamond films(Final Technical Report, 30 Sep. 1988- 30 Aug.)(1989) | |
SU872955A1 (ru) | Способ измерени толщины сло и устройство дл его осуществлени | |
JPS62135751A (ja) | 表面検査装置 | |
Walecki et al. | Interferometric metrology for thin and ultra-thin compound semiconductor structures mounted on insulating carriers | |
JP2598970Y2 (ja) | 検出ヘッド |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |