SE9601178D0 - A field controlled semiconductor device of SiC and a method for production thereof - Google Patents
A field controlled semiconductor device of SiC and a method for production thereofInfo
- Publication number
- SE9601178D0 SE9601178D0 SE9601178A SE9601178A SE9601178D0 SE 9601178 D0 SE9601178 D0 SE 9601178D0 SE 9601178 A SE9601178 A SE 9601178A SE 9601178 A SE9601178 A SE 9601178A SE 9601178 D0 SE9601178 D0 SE 9601178D0
- Authority
- SE
- Sweden
- Prior art keywords
- layer
- region layer
- semiconductor device
- doped
- sic
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/1095—Body region, i.e. base region, of DMOS transistors or IGBTs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66053—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide
- H01L29/66068—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
- H01L29/7813—Vertical DMOS transistors, i.e. VDMOS transistors with trench gate electrode, e.g. UMOS transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7827—Vertical transistors
- H01L29/7828—Vertical transistors without inversion channel, e.g. vertical ACCUFETs, normally-on vertical MISFETs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/417—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
- H01L29/41725—Source or drain electrodes for field effect devices
- H01L29/41766—Source or drain electrodes for field effect devices with at least part of the source or drain electrode having contact below the semiconductor surface, e.g. the source or drain electrode formed at least partially in a groove or with inclusions of conductor inside the semiconductor
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Junction Field-Effect Transistors (AREA)
- Thyristors (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9601178A SE9601178D0 (sv) | 1996-03-27 | 1996-03-27 | A field controlled semiconductor device of SiC and a method for production thereof |
JP53430897A JP4708512B2 (ja) | 1996-03-27 | 1997-03-18 | SiCの電界制御型半導体デバイスおよびその生産方法 |
PCT/SE1997/000448 WO1997036313A2 (en) | 1996-03-27 | 1997-03-18 | A FIELD CONTROLLED SEMICONDUCTOR DEVICE OF SiC AND A METHOD FOR PRODUCTION THEREOF |
EP97915795A EP0958609B1 (en) | 1996-03-27 | 1997-03-18 | A FIELD CONTROLLED SEMICONDUCTOR DEVICE OF SiC AND A METHOD FOR PRODUCTION THEREOF |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9601178A SE9601178D0 (sv) | 1996-03-27 | 1996-03-27 | A field controlled semiconductor device of SiC and a method for production thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
SE9601178D0 true SE9601178D0 (sv) | 1996-03-27 |
Family
ID=20401971
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9601178A SE9601178D0 (sv) | 1996-03-27 | 1996-03-27 | A field controlled semiconductor device of SiC and a method for production thereof |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0958609B1 (ja) |
JP (1) | JP4708512B2 (ja) |
SE (1) | SE9601178D0 (ja) |
WO (1) | WO1997036313A2 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100629020B1 (ko) * | 1999-02-03 | 2006-09-27 | 인트린직 쎄미컨덕터 에이비 | SiC 측면 전계효과 트랜지스터, 그 제조 방법 및 상기 트랜지스터의 사용 방법 |
SE9900358D0 (sv) * | 1999-02-03 | 1999-02-03 | Ind Mikroelektronikcentrum Ab | A lateral field effect transistor of SiC, a method for production thereof and a use of such a transistor |
US8222649B2 (en) | 2006-02-07 | 2012-07-17 | Mitsubishi Electric Corporation | Semiconductor device and method of manufacturing the same |
JP4412335B2 (ja) | 2007-02-23 | 2010-02-10 | 株式会社デンソー | 炭化珪素半導体装置の製造方法 |
US8421148B2 (en) | 2007-09-14 | 2013-04-16 | Cree, Inc. | Grid-UMOSFET with electric field shielding of gate oxide |
US8084813B2 (en) * | 2007-12-03 | 2011-12-27 | Cree, Inc. | Short gate high power MOSFET and method of manufacture |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4454523A (en) * | 1981-03-30 | 1984-06-12 | Siliconix Incorporated | High voltage field effect transistor |
JPS59132671A (ja) * | 1983-01-19 | 1984-07-30 | Nissan Motor Co Ltd | 縦型mosトランジスタ |
JP3471823B2 (ja) * | 1992-01-16 | 2003-12-02 | 富士電機株式会社 | 絶縁ゲート型半導体装置およびその製造方法 |
US5396087A (en) | 1992-12-14 | 1995-03-07 | North Carolina State University | Insulated gate bipolar transistor with reduced susceptibility to parasitic latch-up |
US5323040A (en) * | 1993-09-27 | 1994-06-21 | North Carolina State University At Raleigh | Silicon carbide field effect device |
US5543637A (en) * | 1994-11-14 | 1996-08-06 | North Carolina State University | Silicon carbide semiconductor devices having buried silicon carbide conduction barrier layers therein |
JP3158973B2 (ja) * | 1995-07-20 | 2001-04-23 | 富士電機株式会社 | 炭化けい素縦型fet |
-
1996
- 1996-03-27 SE SE9601178A patent/SE9601178D0/xx unknown
-
1997
- 1997-03-18 WO PCT/SE1997/000448 patent/WO1997036313A2/en active Application Filing
- 1997-03-18 JP JP53430897A patent/JP4708512B2/ja not_active Expired - Lifetime
- 1997-03-18 EP EP97915795A patent/EP0958609B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP4708512B2 (ja) | 2011-06-22 |
WO1997036313A2 (en) | 1997-10-02 |
EP0958609A2 (en) | 1999-11-24 |
EP0958609B1 (en) | 2011-11-16 |
WO1997036313A3 (en) | 1997-11-20 |
JP2000507394A (ja) | 2000-06-13 |
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