SE8106102L - Resistansmetare - Google Patents

Resistansmetare

Info

Publication number
SE8106102L
SE8106102L SE8106102A SE8106102A SE8106102L SE 8106102 L SE8106102 L SE 8106102L SE 8106102 A SE8106102 A SE 8106102A SE 8106102 A SE8106102 A SE 8106102A SE 8106102 L SE8106102 L SE 8106102L
Authority
SE
Sweden
Prior art keywords
voltage
electrode
electrodes
load resistor
central
Prior art date
Application number
SE8106102A
Other languages
Unknown language ( )
English (en)
Other versions
SE445783B (sv
Inventor
M Chatanier
M Portat
A Bruere
Original Assignee
Onera (Off Nat Aerospatiale)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Onera (Off Nat Aerospatiale) filed Critical Onera (Off Nat Aerospatiale)
Publication of SE8106102L publication Critical patent/SE8106102L/sv
Publication of SE445783B publication Critical patent/SE445783B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Electrochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Relating To Insulation (AREA)
SE8106102A 1980-10-17 1981-10-15 Anordning for metning av ytmotstandet hos ett foremal SE445783B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8022329A FR2492535A1 (fr) 1980-10-17 1980-10-17 Resistivimetre de surface

Publications (2)

Publication Number Publication Date
SE8106102L true SE8106102L (sv) 1982-04-18
SE445783B SE445783B (sv) 1986-07-14

Family

ID=9247057

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8106102A SE445783B (sv) 1980-10-17 1981-10-15 Anordning for metning av ytmotstandet hos ett foremal

Country Status (7)

Country Link
US (2) US4446424A (sv)
JP (1) JPS5796274A (sv)
DE (1) DE3140753C2 (sv)
FR (1) FR2492535A1 (sv)
GB (2) GB2089051B (sv)
IT (1) IT1147501B (sv)
SE (1) SE445783B (sv)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2535850A1 (fr) * 1982-11-10 1984-05-11 Chauvin Arnoux Sa Accessoire pouvant etre connecte a un multimetre pour la mesure de resistances de terre
IE55213B1 (en) * 1984-05-02 1990-07-04 Wardell Gerald Edward A method for measuring the homogeneity of dispersion of a filler in a polymeric composite
JPS6169165U (sv) * 1984-10-11 1986-05-12
US4789829A (en) * 1986-07-18 1988-12-06 Science Application International Corporation Method and apparatus for determining RE gasket shielding effectiveness
US4837518A (en) * 1987-08-18 1989-06-06 Atlantic Richfield Company Method and apparatus for measuring the electrical resistivity of geologic formations through metal drill pipe or casing
JPH073444B2 (ja) * 1987-10-27 1995-01-18 株式会社日本システム研究所 導電性測定装置
US4833415A (en) * 1988-01-11 1989-05-23 Ali Nourai Apparatus and method for detecting current leakage through insulating structure
US4862065A (en) * 1988-04-07 1989-08-29 Eastman Kodak Company On-line web internal resistivity measuring apparatus
US4922182A (en) * 1988-08-03 1990-05-01 Monroe Electronics, Inc. Auto reactance compensated non-contacting resistivity measuring device
US4902981A (en) * 1988-12-09 1990-02-20 Atlantic Richfield Company Well casing potential measurement tool with compensated DC errors
DE3910610A1 (de) * 1989-04-01 1990-10-04 Asea Brown Boveri Vorrichtung zur messung des oberflaechenwiderstandes
US5093626A (en) * 1990-05-11 1992-03-03 E. I. Dupont De Nemours And Company Contact measuring device for determining the dry film thickness of a paint on a conductive primer adhered to a plastic substrate
US5136252A (en) * 1990-12-17 1992-08-04 At&T Bell Laboratories Apparatus and methods for evaluating resistive bodies
US5378991A (en) * 1992-05-27 1995-01-03 Anderson; Thomas F. Detecting degradation of non-conductive inert wall layers in fluid containers
US5691648A (en) * 1992-11-10 1997-11-25 Cheng; David Method and apparatus for measuring sheet resistance and thickness of thin films and substrates
US5432457A (en) * 1994-01-28 1995-07-11 Northrop Grumman Corporation Capacitive disk probe
US5486768A (en) * 1994-05-31 1996-01-23 Southwest Research Institute Surface resistivity meter for determining surface degradation of high resistivity materials
US5955887A (en) * 1995-12-22 1999-09-21 The B. F. Goodrich Company Impedance type ice detector
US6508709B1 (en) 1999-06-18 2003-01-21 Jayant S. Karmarkar Virtual distributed multimedia gaming method and system based on actual regulated casino games
FR2850459B1 (fr) * 2003-01-29 2005-06-24 Pass Technologies Dispositif de surveillance de l'integrite du contact d'un joint
US8216056B2 (en) 2007-02-13 2012-07-10 Cfph, Llc Card picks for progressive prize
US8323102B2 (en) * 2006-10-06 2012-12-04 Cfph, Llc Remote play of a table game through a mobile device
US8764541B2 (en) 2006-09-19 2014-07-01 Cfph, Llc Secondary game
US10607435B2 (en) 2007-04-11 2020-03-31 Cfph, Llc Game of chance display
US8398481B2 (en) 2006-08-31 2013-03-19 Cfph, Llc Secondary game
US8070582B2 (en) 2007-03-01 2011-12-06 Cfph, Llc Automatic game play
US7585217B2 (en) * 2006-09-05 2009-09-08 Cfph, Llc Secondary game
US7833101B2 (en) 2006-08-24 2010-11-16 Cfph, Llc Secondary game
US8393954B2 (en) 2006-12-29 2013-03-12 Cfph, Llc Top performers
US8398489B2 (en) 2007-04-05 2013-03-19 Cfph, Llc Sorting games of chance
US8932124B2 (en) 2006-08-31 2015-01-13 Cfph, Llc Game of chance systems and methods
US8758109B2 (en) 2008-08-20 2014-06-24 Cfph, Llc Game of chance systems and methods
US9595169B2 (en) 2006-08-31 2017-03-14 Cfph, Llc Game of chance systems and methods
US9600959B2 (en) 2007-01-09 2017-03-21 Cfph, Llp System for managing promotions
US9754444B2 (en) 2006-12-06 2017-09-05 Cfph, Llc Method and apparatus for advertising on a mobile gaming device
JP4926688B2 (ja) * 2006-12-15 2012-05-09 日本碍子株式会社 静電チャックの誘電体層の体積抵抗率測定装置及びその装置を用いた測定方法
US8771058B2 (en) 2007-02-15 2014-07-08 Cfph, Llc Zone dependent payout percentage
US8500533B2 (en) 2007-08-29 2013-08-06 Cfph, Llc Game with chance element and strategy component that can be copied
US8758111B2 (en) 2008-08-20 2014-06-24 Cfph, Llc Game of chance systems and methods
US8142283B2 (en) 2008-08-20 2012-03-27 Cfph, Llc Game of chance processing apparatus
US8688517B2 (en) 2009-02-13 2014-04-01 Cfph, Llc Method and apparatus for advertising on a mobile gaming device
JP5350063B2 (ja) * 2009-04-24 2013-11-27 日置電機株式会社 シート抵抗測定装置およびシート抵抗測定方法
CZ306726B6 (cs) * 2016-06-30 2017-05-24 Univerzita PalackĂ©ho v Olomouci Způsob měření rychlých změn nízkých hodnot povrchové vodivosti dielektrik v prostředí elektromagnetické interference síťového napětí a zařízení pro provádění tohoto způsobu měření

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1333449A (fr) * 1962-09-12 1963-07-26 électrodes à caoutchouc conducteur pour mesure de résistances de surfaces
US3967191A (en) * 1975-02-28 1976-06-29 Gte Sylvania Incorporated Method and apparatus for non-destructively measuring internal film resistance in a fluorescent lamp
CS202665B1 (cs) * 1975-10-01 1981-01-30 Milos Jurca Zařízení pro měření specifického odporu vodivých a polovodivých materiálů
US4142143A (en) * 1977-11-18 1979-02-27 The United States Of America As Represented By The Secretary Of The Navy Lightning ground system attachable admittance testing instrument
US4218650A (en) * 1978-06-23 1980-08-19 Nasa Apparatus for measuring semiconductor device resistance
US4335350A (en) * 1980-05-23 1982-06-15 Chen James T C Apparatus for probing semiconductor wafers

Also Published As

Publication number Publication date
US4546310A (en) 1985-10-08
DE3140753A1 (de) 1982-06-24
GB2089051A (en) 1982-06-16
IT1147501B (it) 1986-11-19
IT8184138A0 (it) 1981-10-19
FR2492535A1 (fr) 1982-04-23
FR2492535B1 (sv) 1982-11-12
SE445783B (sv) 1986-07-14
GB2143957A (en) 1985-02-20
DE3140753C2 (de) 1983-04-07
GB8409005D0 (en) 1984-05-16
US4446424A (en) 1984-05-01
GB2089051B (en) 1985-09-25
JPS5796274A (en) 1982-06-15
GB2143957B (en) 1985-09-25

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