JPS5796274A - Ohmmeter device - Google Patents

Ohmmeter device

Info

Publication number
JPS5796274A
JPS5796274A JP56161086A JP16108681A JPS5796274A JP S5796274 A JPS5796274 A JP S5796274A JP 56161086 A JP56161086 A JP 56161086A JP 16108681 A JP16108681 A JP 16108681A JP S5796274 A JPS5796274 A JP S5796274A
Authority
JP
Japan
Prior art keywords
ohmmeter
ohmmeter device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56161086A
Other languages
English (en)
Inventor
Shiyataniiru Mishieru
Poruta Mishieru
Buriyueeru Aran
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OFUISU NASHIONAARU DECHIYUUDO E DO RISHIERUSHIE EROSUPACHIARU
Office National dEtudes et de Recherches Aerospatiales ONERA
Original Assignee
OFUISU NASHIONAARU DECHIYUUDO E DO RISHIERUSHIE EROSUPACHIARU
Office National dEtudes et de Recherches Aerospatiales ONERA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by OFUISU NASHIONAARU DECHIYUUDO E DO RISHIERUSHIE EROSUPACHIARU, Office National dEtudes et de Recherches Aerospatiales ONERA filed Critical OFUISU NASHIONAARU DECHIYUUDO E DO RISHIERUSHIE EROSUPACHIARU
Publication of JPS5796274A publication Critical patent/JPS5796274A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
JP56161086A 1980-10-17 1981-10-12 Ohmmeter device Pending JPS5796274A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8022329A FR2492535A1 (fr) 1980-10-17 1980-10-17 Resistivimetre de surface

Publications (1)

Publication Number Publication Date
JPS5796274A true JPS5796274A (en) 1982-06-15

Family

ID=9247057

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56161086A Pending JPS5796274A (en) 1980-10-17 1981-10-12 Ohmmeter device

Country Status (7)

Country Link
US (2) US4446424A (ja)
JP (1) JPS5796274A (ja)
DE (1) DE3140753C2 (ja)
FR (1) FR2492535A1 (ja)
GB (2) GB2089051B (ja)
IT (1) IT1147501B (ja)
SE (1) SE445783B (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6169165U (ja) * 1984-10-11 1986-05-12
JP2010256145A (ja) * 2009-04-24 2010-11-11 Hioki Ee Corp シート抵抗測定装置およびシート抵抗測定方法

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2535850A1 (fr) * 1982-11-10 1984-05-11 Chauvin Arnoux Sa Accessoire pouvant etre connecte a un multimetre pour la mesure de resistances de terre
IE55213B1 (en) * 1984-05-02 1990-07-04 Wardell Gerald Edward A method for measuring the homogeneity of dispersion of a filler in a polymeric composite
US4789829A (en) * 1986-07-18 1988-12-06 Science Application International Corporation Method and apparatus for determining RE gasket shielding effectiveness
US4837518A (en) * 1987-08-18 1989-06-06 Atlantic Richfield Company Method and apparatus for measuring the electrical resistivity of geologic formations through metal drill pipe or casing
JPH073444B2 (ja) * 1987-10-27 1995-01-18 株式会社日本システム研究所 導電性測定装置
US4833415A (en) * 1988-01-11 1989-05-23 Ali Nourai Apparatus and method for detecting current leakage through insulating structure
US4862065A (en) * 1988-04-07 1989-08-29 Eastman Kodak Company On-line web internal resistivity measuring apparatus
US4922182A (en) * 1988-08-03 1990-05-01 Monroe Electronics, Inc. Auto reactance compensated non-contacting resistivity measuring device
US4902981A (en) * 1988-12-09 1990-02-20 Atlantic Richfield Company Well casing potential measurement tool with compensated DC errors
DE3910610A1 (de) * 1989-04-01 1990-10-04 Asea Brown Boveri Vorrichtung zur messung des oberflaechenwiderstandes
US5093626A (en) * 1990-05-11 1992-03-03 E. I. Dupont De Nemours And Company Contact measuring device for determining the dry film thickness of a paint on a conductive primer adhered to a plastic substrate
US5136252A (en) * 1990-12-17 1992-08-04 At&T Bell Laboratories Apparatus and methods for evaluating resistive bodies
US5378991A (en) * 1992-05-27 1995-01-03 Anderson; Thomas F. Detecting degradation of non-conductive inert wall layers in fluid containers
US5691648A (en) * 1992-11-10 1997-11-25 Cheng; David Method and apparatus for measuring sheet resistance and thickness of thin films and substrates
US5432457A (en) * 1994-01-28 1995-07-11 Northrop Grumman Corporation Capacitive disk probe
US5486768A (en) * 1994-05-31 1996-01-23 Southwest Research Institute Surface resistivity meter for determining surface degradation of high resistivity materials
US5955887A (en) * 1995-12-22 1999-09-21 The B. F. Goodrich Company Impedance type ice detector
US6508709B1 (en) 1999-06-18 2003-01-21 Jayant S. Karmarkar Virtual distributed multimedia gaming method and system based on actual regulated casino games
FR2850459B1 (fr) * 2003-01-29 2005-06-24 Pass Technologies Dispositif de surveillance de l'integrite du contact d'un joint
US8398489B2 (en) 2007-04-05 2013-03-19 Cfph, Llc Sorting games of chance
US8216056B2 (en) 2007-02-13 2012-07-10 Cfph, Llc Card picks for progressive prize
US8393954B2 (en) 2006-12-29 2013-03-12 Cfph, Llc Top performers
US7833101B2 (en) * 2006-08-24 2010-11-16 Cfph, Llc Secondary game
US8398481B2 (en) 2006-08-31 2013-03-19 Cfph, Llc Secondary game
US8764541B2 (en) 2006-09-19 2014-07-01 Cfph, Llc Secondary game
US7585217B2 (en) * 2006-09-05 2009-09-08 Cfph, Llc Secondary game
US8070582B2 (en) 2007-03-01 2011-12-06 Cfph, Llc Automatic game play
US8323102B2 (en) * 2006-10-06 2012-12-04 Cfph, Llc Remote play of a table game through a mobile device
US10607435B2 (en) 2007-04-11 2020-03-31 Cfph, Llc Game of chance display
US8758109B2 (en) 2008-08-20 2014-06-24 Cfph, Llc Game of chance systems and methods
US8932124B2 (en) 2006-08-31 2015-01-13 Cfph, Llc Game of chance systems and methods
US9595169B2 (en) 2006-08-31 2017-03-14 Cfph, Llc Game of chance systems and methods
US9600959B2 (en) 2007-01-09 2017-03-21 Cfph, Llp System for managing promotions
US9754444B2 (en) 2006-12-06 2017-09-05 Cfph, Llc Method and apparatus for advertising on a mobile gaming device
JP4926688B2 (ja) * 2006-12-15 2012-05-09 日本碍子株式会社 静電チャックの誘電体層の体積抵抗率測定装置及びその装置を用いた測定方法
US8771058B2 (en) 2007-02-15 2014-07-08 Cfph, Llc Zone dependent payout percentage
US8500533B2 (en) 2007-08-29 2013-08-06 Cfph, Llc Game with chance element and strategy component that can be copied
US8142283B2 (en) 2008-08-20 2012-03-27 Cfph, Llc Game of chance processing apparatus
US8758111B2 (en) 2008-08-20 2014-06-24 Cfph, Llc Game of chance systems and methods
US8688517B2 (en) 2009-02-13 2014-04-01 Cfph, Llc Method and apparatus for advertising on a mobile gaming device
CZ2016398A3 (cs) * 2016-06-30 2017-05-24 Univerzita PalackĂ©ho v Olomouci Způsob měření rychlých změn nízkých hodnot povrchové vodivosti dielektrik v prostředí elektromagnetické interference síťového napětí a zařízení pro provádění tohoto způsobu měření

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3967191A (en) * 1975-02-28 1976-06-29 Gte Sylvania Incorporated Method and apparatus for non-destructively measuring internal film resistance in a fluorescent lamp

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1333449A (fr) * 1962-09-12 1963-07-26 électrodes à caoutchouc conducteur pour mesure de résistances de surfaces
CS202665B1 (cs) * 1975-10-01 1981-01-30 Milos Jurca Zařízení pro měření specifického odporu vodivých a polovodivých materiálů
US4142143A (en) * 1977-11-18 1979-02-27 The United States Of America As Represented By The Secretary Of The Navy Lightning ground system attachable admittance testing instrument
US4218650A (en) * 1978-06-23 1980-08-19 Nasa Apparatus for measuring semiconductor device resistance
US4335350A (en) * 1980-05-23 1982-06-15 Chen James T C Apparatus for probing semiconductor wafers

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3967191A (en) * 1975-02-28 1976-06-29 Gte Sylvania Incorporated Method and apparatus for non-destructively measuring internal film resistance in a fluorescent lamp

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6169165U (ja) * 1984-10-11 1986-05-12
JP2010256145A (ja) * 2009-04-24 2010-11-11 Hioki Ee Corp シート抵抗測定装置およびシート抵抗測定方法

Also Published As

Publication number Publication date
FR2492535B1 (ja) 1982-11-12
SE8106102L (sv) 1982-04-18
IT8184138A0 (it) 1981-10-19
FR2492535A1 (fr) 1982-04-23
GB2089051B (en) 1985-09-25
DE3140753C2 (de) 1983-04-07
SE445783B (sv) 1986-07-14
GB2089051A (en) 1982-06-16
GB2143957B (en) 1985-09-25
US4446424A (en) 1984-05-01
IT1147501B (it) 1986-11-19
GB8409005D0 (en) 1984-05-16
DE3140753A1 (de) 1982-06-24
GB2143957A (en) 1985-02-20
US4546310A (en) 1985-10-08

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