SE7601433L - Virvelstromssond for icke-forstorande provning av beskaffenheten hos elektriskt ledande beleggning, i synnerhet i genomgaende hal i tryckta kretskort - Google Patents
Virvelstromssond for icke-forstorande provning av beskaffenheten hos elektriskt ledande beleggning, i synnerhet i genomgaende hal i tryckta kretskortInfo
- Publication number
- SE7601433L SE7601433L SE7601433A SE7601433A SE7601433L SE 7601433 L SE7601433 L SE 7601433L SE 7601433 A SE7601433 A SE 7601433A SE 7601433 A SE7601433 A SE 7601433A SE 7601433 L SE7601433 L SE 7601433L
- Authority
- SE
- Sweden
- Prior art keywords
- hall
- nature
- throughout
- electrically conductive
- conductive coating
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9006—Details, e.g. in the structure or functioning of sensors
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Electrochemistry (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU7502100851A SU563616A1 (ru) | 1975-02-11 | 1975-02-11 | Токовихревой преобразователь |
Publications (2)
Publication Number | Publication Date |
---|---|
SE7601433L true SE7601433L (sv) | 1976-08-12 |
SE410659B SE410659B (sv) | 1979-10-22 |
Family
ID=20608711
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE7601433A SE410659B (sv) | 1975-02-11 | 1976-02-10 | Virvelstromssond for icke-forstorande provning av beskaffenheten hos en elektriskt ledande beleggning i hal i tryckta kretskort |
Country Status (3)
Country | Link |
---|---|
US (1) | US4060760A (sv) |
SE (1) | SE410659B (sv) |
SU (1) | SU563616A1 (sv) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5446382A (en) * | 1993-06-23 | 1995-08-29 | The Babcock & Wilcox Company | Eddy current probe having one yoke within another yoke for increased inspection depth, sensitivity and discrimination |
US20050083048A1 (en) * | 2003-10-21 | 2005-04-21 | Applied Materials, Inc. | Plating system with integrated substrate inspection |
US9372208B2 (en) | 2014-01-02 | 2016-06-21 | International Business Machines Corporation | Signal monitoring of through-wafer vias using a multi-layer inductor |
KR20200110667A (ko) * | 2018-01-18 | 2020-09-24 | 엑세라 코포레이션 | 인쇄 회로 기판 홀들 내에서 전기 전도성 층들을 측정하기 위한 용량성 테스트 니들 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2985300A (en) * | 1956-04-04 | 1961-05-23 | Ibm | Testing of magnetic materials |
US3718855A (en) * | 1970-11-30 | 1973-02-27 | R Cordova | Eddy current flaw detection system |
US3840802A (en) * | 1972-08-10 | 1974-10-08 | Rockwell International Corp | Mutual inductance coupling probe for testing the integrity of through-hole plating in printed circuit boards |
US3825822A (en) * | 1972-09-23 | 1974-07-23 | F Forster | Apparatus for inspecting the quality of short, electrically conductive workpieces by the eddy current test method |
-
1975
- 1975-02-11 SU SU7502100851A patent/SU563616A1/ru active
-
1976
- 1976-02-06 US US05/656,082 patent/US4060760A/en not_active Expired - Lifetime
- 1976-02-10 SE SE7601433A patent/SE410659B/sv unknown
Also Published As
Publication number | Publication date |
---|---|
US4060760A (en) | 1977-11-29 |
SE410659B (sv) | 1979-10-22 |
SU563616A1 (ru) | 1977-06-30 |
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