SU563616A1 - Токовихревой преобразователь - Google Patents

Токовихревой преобразователь

Info

Publication number
SU563616A1
SU563616A1 SU7502100851A SU2100851A SU563616A1 SU 563616 A1 SU563616 A1 SU 563616A1 SU 7502100851 A SU7502100851 A SU 7502100851A SU 2100851 A SU2100851 A SU 2100851A SU 563616 A1 SU563616 A1 SU 563616A1
Authority
SU
USSR - Soviet Union
Prior art keywords
eddy current
current convertor
convertor
axis
magnetic circuit
Prior art date
Application number
SU7502100851A
Other languages
English (en)
Inventor
Петр Николаевич Шкатов
Василий Васильевич Сухоруков
Виктор Игоревич Рогачев
Original Assignee
Московский Ордена Ленина Энергетический Институт
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Московский Ордена Ленина Энергетический Институт filed Critical Московский Ордена Ленина Энергетический Институт
Priority to SU7502100851A priority Critical patent/SU563616A1/ru
Priority to US05/656,082 priority patent/US4060760A/en
Priority to SE7601433A priority patent/SE410659B/xx
Application granted granted Critical
Publication of SU563616A1 publication Critical patent/SU563616A1/ru

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805Bare printed circuit boards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006Details, e.g. in the structure or functioning of sensors

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Electrochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Computer Hardware Design (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Description

расположенные в плоскост х, перпендикул рных к оси магнитопровода и разнесенных одна относительно другой вдоль этой оси на рассто ние , превышающее диаметры катушек более , чем в три раза, отличающийс  тем, 5 что, с целью повышени  точности контрол , измерительные катушки расположены эксцентрично относительно осп магнитопровода в пределах контура, совпадающего с контактной площадкой контролируемого отверсти .
&
1 Рт х/хх ;.
SU7502100851A 1975-02-11 1975-02-11 Токовихревой преобразователь SU563616A1 (ru)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SU7502100851A SU563616A1 (ru) 1975-02-11 1975-02-11 Токовихревой преобразователь
US05/656,082 US4060760A (en) 1975-02-11 1976-02-06 Eddy current sensor for non-destructive testing the quality of electrically conductive through-hole plating in printed circuit boards
SE7601433A SE410659B (sv) 1975-02-11 1976-02-10 Virvelstromssond for icke-forstorande provning av beskaffenheten hos en elektriskt ledande beleggning i hal i tryckta kretskort

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU7502100851A SU563616A1 (ru) 1975-02-11 1975-02-11 Токовихревой преобразователь

Publications (1)

Publication Number Publication Date
SU563616A1 true SU563616A1 (ru) 1977-06-30

Family

ID=20608711

Family Applications (1)

Application Number Title Priority Date Filing Date
SU7502100851A SU563616A1 (ru) 1975-02-11 1975-02-11 Токовихревой преобразователь

Country Status (3)

Country Link
US (1) US4060760A (ru)
SE (1) SE410659B (ru)
SU (1) SU563616A1 (ru)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5446382A (en) * 1993-06-23 1995-08-29 The Babcock & Wilcox Company Eddy current probe having one yoke within another yoke for increased inspection depth, sensitivity and discrimination
US20050083048A1 (en) * 2003-10-21 2005-04-21 Applied Materials, Inc. Plating system with integrated substrate inspection
US9372208B2 (en) 2014-01-02 2016-06-21 International Business Machines Corporation Signal monitoring of through-wafer vias using a multi-layer inductor
US11774495B2 (en) 2018-01-18 2023-10-03 Atg Luther & Maelzer Gmbh Capacitive test needle for measuring electrically conductive layers in printed circuit board holes

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2985300A (en) * 1956-04-04 1961-05-23 Ibm Testing of magnetic materials
US3718855A (en) * 1970-11-30 1973-02-27 R Cordova Eddy current flaw detection system
US3840802A (en) * 1972-08-10 1974-10-08 Rockwell International Corp Mutual inductance coupling probe for testing the integrity of through-hole plating in printed circuit boards
US3825822A (en) * 1972-09-23 1974-07-23 F Forster Apparatus for inspecting the quality of short, electrically conductive workpieces by the eddy current test method

Also Published As

Publication number Publication date
US4060760A (en) 1977-11-29
SE7601433L (sv) 1976-08-12
SE410659B (sv) 1979-10-22

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