JPS56164965A - Noncontact type electrometer - Google Patents
Noncontact type electrometerInfo
- Publication number
- JPS56164965A JPS56164965A JP6778980A JP6778980A JPS56164965A JP S56164965 A JPS56164965 A JP S56164965A JP 6778980 A JP6778980 A JP 6778980A JP 6778980 A JP6778980 A JP 6778980A JP S56164965 A JPS56164965 A JP S56164965A
- Authority
- JP
- Japan
- Prior art keywords
- aperture
- casing
- power source
- external layer
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
- G01R15/165—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices measuring electrostatic potential, e.g. with electrostatic voltmeters or electrometers, when the design of the sensor is essential
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
PURPOSE:To make the use of a standard power source possible and lower its cost by forming an external part consisting of a metallic material on the peripheral part of the aperture on the outside surface of a casing, and applying output high voltage which is negatively fed back only to this external layer. CONSTITUTION:An aperture 2a of a diameter Da is formed on the surface 2b opposing to an object to be measured 3 in the casing 2 of a probe 1. An external layer 5 consisting of a metallic material is provided by way of an insulating material 4 to the peripheral part of this aperture 2a, and the output high voltage Vf of the electrometer is negatively fed back and applied to this external layer. On the other hand, a detecting electode 6 is provided in opposition to the aperture 2a to the inside of the casing 2, and a vibrating electrode 7 is interposed between both. Thereby, the use of a standard power source as a power source for drivng the buffer amplifier or the like in the probe is made possible and the cost is lowered.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6778980A JPS56164965A (en) | 1980-05-23 | 1980-05-23 | Noncontact type electrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6778980A JPS56164965A (en) | 1980-05-23 | 1980-05-23 | Noncontact type electrometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56164965A true JPS56164965A (en) | 1981-12-18 |
Family
ID=13355065
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6778980A Pending JPS56164965A (en) | 1980-05-23 | 1980-05-23 | Noncontact type electrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56164965A (en) |
-
1980
- 1980-05-23 JP JP6778980A patent/JPS56164965A/en active Pending
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