SE7910463L - Styrelektrodreglerad halvledaranordning - Google Patents

Styrelektrodreglerad halvledaranordning

Info

Publication number
SE7910463L
SE7910463L SE7910463A SE7910463A SE7910463L SE 7910463 L SE7910463 L SE 7910463L SE 7910463 A SE7910463 A SE 7910463A SE 7910463 A SE7910463 A SE 7910463A SE 7910463 L SE7910463 L SE 7910463L
Authority
SE
Sweden
Prior art keywords
electrode assembly
thyristor portion
semiconductor device
main
wafer
Prior art date
Application number
SE7910463A
Other languages
Unknown language ( )
English (en)
Other versions
SE445083B (sv
Inventor
T Sueoka
S Ishibashi
Original Assignee
Meidensha Electric Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Electric Mfg Co Ltd filed Critical Meidensha Electric Mfg Co Ltd
Publication of SE7910463L publication Critical patent/SE7910463L/sv
Publication of SE445083B publication Critical patent/SE445083B/sv

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/083Anode or cathode regions of thyristors or gated bipolar-mode devices
    • H01L29/0839Cathode regions of thyristors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/74Thyristor-type devices, e.g. having four-zone regenerative action
    • H01L29/7428Thyristor-type devices, e.g. having four-zone regenerative action having an amplifying gate structure, e.g. cascade (Darlington) configuration
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/74Thyristor-type devices, e.g. having four-zone regenerative action
    • H01L29/744Gate-turn-off devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Thyristors (AREA)
SE7910463A 1979-01-12 1979-12-19 Styrelektrodreglerad halvledaranordning SE445083B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP236479A JPS5595362A (en) 1979-01-12 1979-01-12 Turn-off thyristor

Publications (2)

Publication Number Publication Date
SE7910463L true SE7910463L (sv) 1980-07-13
SE445083B SE445083B (sv) 1986-05-26

Family

ID=11527196

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7910463A SE445083B (sv) 1979-01-12 1979-12-19 Styrelektrodreglerad halvledaranordning

Country Status (5)

Country Link
US (1) US4486768A (sv)
JP (1) JPS5595362A (sv)
DE (1) DE3000891A1 (sv)
GB (1) GB2039413B (sv)
SE (1) SE445083B (sv)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57117276A (en) * 1981-01-14 1982-07-21 Hitachi Ltd Semiconductor device
DE3118291A1 (de) * 1981-05-08 1982-12-02 Siemens AG, 1000 Berlin und 8000 München Triac und verfahren zu seinem betrieb
JPS5927571A (ja) * 1982-08-05 1984-02-14 Meidensha Electric Mfg Co Ltd ゲ−トタ−ンオフサイリスタ
DE3230741A1 (de) * 1982-08-18 1984-02-23 Siemens AG, 1000 Berlin und 8000 München Halbleiterschalter mit einem abschaltbaren thyristor
EP0108874B1 (en) * 1982-11-15 1987-11-25 Kabushiki Kaisha Toshiba Radiation-controllable thyristor
DE3855922T2 (de) * 1987-02-26 1998-01-02 Toshiba Kawasaki Kk An-Steuertechnik für Thyristor mit isolierter Steuerelektrode

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3544818A (en) * 1967-12-26 1970-12-01 Bell Telephone Labor Inc Thyristor switch circuit
US4217504A (en) * 1975-08-04 1980-08-12 Licentia-Patent Verwaltungs Gmbh Semiconductor switch with thyristors
DE2607678A1 (de) * 1976-02-25 1977-09-01 Siemens Ag Anordnung zum herabsetzen der freiwerdezeit eines thyristors
US4092703A (en) * 1977-03-15 1978-05-30 Kabushiki Kaisha Meidensha Gate controlled semiconductor device
US4115707A (en) * 1977-03-31 1978-09-19 Rca Corporation Circuit for single-line control of GTO controlled rectifier conduction
JPS5942991B2 (ja) * 1977-05-23 1984-10-18 株式会社日立製作所 サイリスタ
DE2748316C2 (de) * 1977-10-27 1986-09-04 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung zum Herabsetzen der Freiwerdezeit eines Thyristors

Also Published As

Publication number Publication date
DE3000891A1 (de) 1980-07-24
JPS5595362A (en) 1980-07-19
SE445083B (sv) 1986-05-26
GB2039413A (en) 1980-08-06
US4486768A (en) 1984-12-04
GB2039413B (en) 1983-09-14
DE3000891C2 (sv) 1988-07-28

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