SE7904305L - Schottky-diod och sett att framstella densamma - Google Patents

Schottky-diod och sett att framstella densamma

Info

Publication number
SE7904305L
SE7904305L SE7904305A SE7904305A SE7904305L SE 7904305 L SE7904305 L SE 7904305L SE 7904305 A SE7904305 A SE 7904305A SE 7904305 A SE7904305 A SE 7904305A SE 7904305 L SE7904305 L SE 7904305L
Authority
SE
Sweden
Prior art keywords
diod
schottky
way
same
present
Prior art date
Application number
SE7904305A
Other languages
English (en)
Other versions
SE440293B (sv
Inventor
H J Gould
Original Assignee
Int Rectifier Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Int Rectifier Corp filed Critical Int Rectifier Corp
Publication of SE7904305L publication Critical patent/SE7904305L/sv
Publication of SE440293B publication Critical patent/SE440293B/sv

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861Diodes
    • H01L29/872Schottky diodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28512Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
    • H01L21/28537Deposition of Schottky electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/47Schottky barrier electrodes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/139Schottky barrier

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Electrodes Of Semiconductors (AREA)
SE7904305A 1978-06-02 1979-05-16 Schottky-diod och sett att framstella densamma SE440293B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/911,764 US4206540A (en) 1978-06-02 1978-06-02 Schottky device and method of manufacture using palladium and platinum intermetallic alloys and titanium barrier

Publications (2)

Publication Number Publication Date
SE7904305L true SE7904305L (sv) 1979-12-03
SE440293B SE440293B (sv) 1985-07-22

Family

ID=25430828

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7904305A SE440293B (sv) 1978-06-02 1979-05-16 Schottky-diod och sett att framstella densamma

Country Status (8)

Country Link
US (1) US4206540A (sv)
JP (1) JPS54159183A (sv)
DE (1) DE2921971C2 (sv)
ES (1) ES481012A1 (sv)
FR (1) FR2427688A1 (sv)
GB (2) GB2022318B (sv)
IT (1) IT1165084B (sv)
SE (1) SE440293B (sv)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4546374A (en) * 1981-03-23 1985-10-08 Motorola Inc. Semiconductor device including plateless package
US4398344A (en) * 1982-03-08 1983-08-16 International Rectifier Corporation Method of manufacture of a schottky using platinum encapsulated between layers of palladium sintered into silicon surface
US4638551A (en) * 1982-09-24 1987-01-27 General Instrument Corporation Schottky barrier device and method of manufacture
JPS59210642A (ja) * 1983-05-16 1984-11-29 Hitachi Ltd 半導体装置の製造方法
US4899199A (en) * 1983-09-30 1990-02-06 International Rectifier Corporation Schottky diode with titanium or like layer contacting the dielectric layer
US4742377A (en) * 1985-02-21 1988-05-03 General Instrument Corporation Schottky barrier device with doped composite guard ring
US4687537A (en) * 1986-04-15 1987-08-18 Rca Corporation Epitaxial metal silicide layers
JPS6373660A (ja) * 1986-09-17 1988-04-04 Fujitsu Ltd 半導体装置
US5130172A (en) * 1988-10-21 1992-07-14 The Regents Of The University Of California Low temperature organometallic deposition of metals
GB2265636B (en) * 1989-09-21 1994-05-18 Int Rectifier Corp Platinum diffusion process
US4925812A (en) * 1989-09-21 1990-05-15 International Rectifier Corporation Platinum diffusion process
AT399419B (de) * 1989-09-21 1995-05-26 Int Rectifier Corp Verfahren zur einführung von platinatomen in eine siliziumscheibe zur verringerung der minoritätsträger-lebensdauer
IT1247293B (it) * 1990-05-09 1994-12-12 Int Rectifier Corp Dispositivo transistore di potenza presentante una regione ultra-profonda, a maggior concentrazione
US5047367A (en) * 1990-06-08 1991-09-10 Intel Corporation Process for formation of a self aligned titanium nitride/cobalt silicide bilayer
US5536684A (en) * 1994-06-30 1996-07-16 Intel Corporation Process for formation of epitaxial cobalt silicide and shallow junction of silicon
US5888891A (en) * 1996-08-23 1999-03-30 International Rectifier Corporation Process for manufacturing a schottky diode with enhanced barrier height and high thermal stability
DE19939484A1 (de) * 1998-09-01 2000-03-09 Int Rectifier Corp Schottky-Diode
US6184564B1 (en) * 1998-12-28 2001-02-06 International Rectifier Corp. Schottky diode with adjusted barrier height and process for its manufacture
US6690037B1 (en) 2000-08-31 2004-02-10 Agere Systems Inc. Field plated Schottky diode
JP2002353182A (ja) * 2001-05-25 2002-12-06 Mitsubishi Electric Corp 半導体装置の洗浄方法および洗浄装置、ならびに半導体装置の製造方法
US7061067B2 (en) * 2003-07-04 2006-06-13 Matsushita Electric Industrial Co., Ltd. Schottky barrier diode
US7812441B2 (en) * 2004-10-21 2010-10-12 Siliconix Technology C.V. Schottky diode with improved surge capability
TWI278090B (en) * 2004-10-21 2007-04-01 Int Rectifier Corp Solderable top metal for SiC device
US9419092B2 (en) * 2005-03-04 2016-08-16 Vishay-Siliconix Termination for SiC trench devices
US7834376B2 (en) 2005-03-04 2010-11-16 Siliconix Technology C. V. Power semiconductor switch
US7923362B2 (en) * 2005-06-08 2011-04-12 Telefunken Semiconductors Gmbh & Co. Kg Method for manufacturing a metal-semiconductor contact in semiconductor components
DE102005026301B3 (de) * 2005-06-08 2007-01-11 Atmel Germany Gmbh Verfahren zum Herstellen eines Metall- Halbleiter-Kontakts bei Halbleiterbauelementen
JP2008545279A (ja) * 2005-07-05 2008-12-11 インターナショナル レクティファイアー コーポレイション サージ能力が向上されたショットキーダイオード
US8368165B2 (en) 2005-10-20 2013-02-05 Siliconix Technology C. V. Silicon carbide Schottky diode
US7749877B2 (en) * 2006-03-07 2010-07-06 Siliconix Technology C. V. Process for forming Schottky rectifier with PtNi silicide Schottky barrier
US9627552B2 (en) 2006-07-31 2017-04-18 Vishay-Siliconix Molybdenum barrier metal for SiC Schottky diode and process of manufacture
DE102009018971A1 (de) * 2009-04-25 2010-11-04 Secos Halbleitertechnologie Gmbh Konstruktion einer Schottkydiode mit verbessertem Hochstromverhalten und Verfahren zu deren Herstellung
US8784572B2 (en) * 2011-10-19 2014-07-22 Intermolecular, Inc. Method for cleaning platinum residues on a semiconductor substrate
DE102016110203B4 (de) 2015-06-02 2019-11-21 Diotec Semiconductor Ag Verbesserte Halbleiteranordnung mit Schottky-Diode und Verfahren zu deren Herstellung
CN109585570A (zh) * 2018-12-19 2019-04-05 吉林麦吉柯半导体有限公司 肖特基二极管、nipt95合金及肖特基二极管的制造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1107700A (en) * 1966-03-29 1968-03-27 Matsushita Electronics Corp A method for manufacturing semiconductor devices
NL6911534A (sv) * 1968-08-01 1970-02-03
US3669730A (en) * 1970-04-24 1972-06-13 Bell Telephone Labor Inc Modifying barrier layer devices
IT1002232B (it) * 1972-12-26 1976-05-20 Gen Electric Contatti a barriera schottky e metodi per fare i medesimi
US3938243A (en) * 1973-02-20 1976-02-17 Signetics Corporation Schottky barrier diode semiconductor structure and method
US3906540A (en) * 1973-04-02 1975-09-16 Nat Semiconductor Corp Metal-silicide Schottky diode employing an aluminum connector
US3968272A (en) * 1974-01-25 1976-07-06 Microwave Associates, Inc. Zero-bias Schottky barrier detector diodes
US4110488A (en) * 1976-04-09 1978-08-29 Rca Corporation Method for making schottky barrier diodes
US4063964A (en) * 1976-12-27 1977-12-20 International Business Machines Corporation Method for forming a self-aligned schottky barrier device guardring

Also Published As

Publication number Publication date
GB2022318B (en) 1982-09-15
JPS6226593B2 (sv) 1987-06-09
FR2427688A1 (fr) 1979-12-28
GB2022318A (en) 1979-12-12
FR2427688B1 (sv) 1984-10-26
DE2921971A1 (de) 1979-12-06
JPS54159183A (en) 1979-12-15
DE2921971C2 (de) 1983-09-29
IT1165084B (it) 1987-04-22
US4206540A (en) 1980-06-10
ES481012A1 (es) 1980-07-16
IT7923215A0 (it) 1979-06-01
GB2044534B (en) 1982-09-08
SE440293B (sv) 1985-07-22
GB2044534A (en) 1980-10-15

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