SE516607C2 - Sätt och anordning vid kantavkänning - Google Patents

Sätt och anordning vid kantavkänning

Info

Publication number
SE516607C2
SE516607C2 SE9504326A SE9504326A SE516607C2 SE 516607 C2 SE516607 C2 SE 516607C2 SE 9504326 A SE9504326 A SE 9504326A SE 9504326 A SE9504326 A SE 9504326A SE 516607 C2 SE516607 C2 SE 516607C2
Authority
SE
Sweden
Prior art keywords
edge
line
angle
dimensions
illuminating means
Prior art date
Application number
SE9504326A
Other languages
English (en)
Swedish (sv)
Other versions
SE9504326D0 (sv
SE9504326L (sv
Inventor
Bo Nyman
Original Assignee
Optonova Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optonova Ab filed Critical Optonova Ab
Priority to SE9504326A priority Critical patent/SE516607C2/sv
Publication of SE9504326D0 publication Critical patent/SE9504326D0/xx
Priority to EP96119460A priority patent/EP0778462A3/de
Publication of SE9504326L publication Critical patent/SE9504326L/
Publication of SE516607C2 publication Critical patent/SE516607C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SE9504326A 1995-12-04 1995-12-04 Sätt och anordning vid kantavkänning SE516607C2 (sv)

Priority Applications (2)

Application Number Priority Date Filing Date Title
SE9504326A SE516607C2 (sv) 1995-12-04 1995-12-04 Sätt och anordning vid kantavkänning
EP96119460A EP0778462A3 (de) 1995-12-04 1996-12-04 Verfahren und Vorrichtung zum Prüfen der Kante einer Platte

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9504326A SE516607C2 (sv) 1995-12-04 1995-12-04 Sätt och anordning vid kantavkänning

Publications (3)

Publication Number Publication Date
SE9504326D0 SE9504326D0 (sv) 1995-12-04
SE9504326L SE9504326L (sv) 1997-06-05
SE516607C2 true SE516607C2 (sv) 2002-02-05

Family

ID=20400455

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9504326A SE516607C2 (sv) 1995-12-04 1995-12-04 Sätt och anordning vid kantavkänning

Country Status (2)

Country Link
EP (1) EP0778462A3 (de)
SE (1) SE516607C2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2376068A (en) * 2001-05-31 2002-12-04 Millennium Venture Holdings Lt Method and apparatus of in-process inspection
DE102005032246B4 (de) * 2005-07-09 2009-07-30 Hema Elektronik Gmbh Verfahren und Vorrichtung zur Detektierung des Durchfahrtsprofils eines 3D-Objektes
SG11202107495UA (en) * 2019-02-28 2021-08-30 Yoshino Gypsum Co Ltd Apparatus for inspecting plate-like bodies
JP7195706B2 (ja) * 2019-04-01 2022-12-26 株式会社ディスコ 測定方法
CN111504223B (zh) * 2020-04-22 2022-05-31 荆亮 一种基于线激光传感器的叶片轮廓测量方法及装置和系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4741621A (en) * 1986-08-18 1988-05-03 Westinghouse Electric Corp. Geometric surface inspection system with dual overlap light stripe generator
US5083867A (en) * 1988-11-28 1992-01-28 Allegheny Ludlum Corporation Slab surface contour monitor
US5129010A (en) * 1989-12-15 1992-07-07 Kabushiki Kaisha Toyoto Chuo Kenkyusho System for measuring shapes and dimensions of gaps and flushnesses on three dimensional surfaces of objects
US5125746A (en) * 1990-06-07 1992-06-30 Harold Lipshitz Surface topography measurement apparatus and method
AU8869191A (en) * 1990-10-24 1992-05-26 Broken Hill Proprietary Company Limited, The Process and device for the opto-electronic measurement of objects
DE4408291C2 (de) * 1994-03-11 1997-04-10 Abb Patent Gmbh Verfahren zur automatisierten optischen Prüfung einer Schweißnaht eines Bauteils unter Anwendung des Lichtschnittverfahrens
DE4411986A1 (de) * 1994-04-10 1995-10-12 Kjm Ges Fuer Opto Elektronisch Verfahren und Vorrichtung zur Messung des Querschnitts von stabförmigen Objekten

Also Published As

Publication number Publication date
SE9504326D0 (sv) 1995-12-04
EP0778462A2 (de) 1997-06-11
SE9504326L (sv) 1997-06-05
EP0778462A3 (de) 1998-03-11

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Legal Events

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