SE9504326L - Sätt och anordning vid kantavkänning - Google Patents
Sätt och anordning vid kantavkänningInfo
- Publication number
- SE9504326L SE9504326L SE9504326A SE9504326A SE9504326L SE 9504326 L SE9504326 L SE 9504326L SE 9504326 A SE9504326 A SE 9504326A SE 9504326 A SE9504326 A SE 9504326A SE 9504326 L SE9504326 L SE 9504326L
- Authority
- SE
- Sweden
- Prior art keywords
- edge
- image
- illuminated
- edge detection
- dimensions
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9504326A SE516607C2 (sv) | 1995-12-04 | 1995-12-04 | Sätt och anordning vid kantavkänning |
EP96119460A EP0778462A3 (en) | 1995-12-04 | 1996-12-04 | Method and device for inspecting the edge of a board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9504326A SE516607C2 (sv) | 1995-12-04 | 1995-12-04 | Sätt och anordning vid kantavkänning |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9504326D0 SE9504326D0 (sv) | 1995-12-04 |
SE9504326L true SE9504326L (sv) | 1997-06-05 |
SE516607C2 SE516607C2 (sv) | 2002-02-05 |
Family
ID=20400455
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9504326A SE516607C2 (sv) | 1995-12-04 | 1995-12-04 | Sätt och anordning vid kantavkänning |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP0778462A3 (sv) |
SE (1) | SE516607C2 (sv) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2376068A (en) * | 2001-05-31 | 2002-12-04 | Millennium Venture Holdings Lt | Method and apparatus of in-process inspection |
DE102005032246B4 (de) * | 2005-07-09 | 2009-07-30 | Hema Elektronik Gmbh | Verfahren und Vorrichtung zur Detektierung des Durchfahrtsprofils eines 3D-Objektes |
WO2020174990A1 (ja) * | 2019-02-28 | 2020-09-03 | 吉野石膏株式会社 | 板状体の検査装置 |
JP7195706B2 (ja) * | 2019-04-01 | 2022-12-26 | 株式会社ディスコ | 測定方法 |
CN111504223B (zh) * | 2020-04-22 | 2022-05-31 | 荆亮 | 一种基于线激光传感器的叶片轮廓测量方法及装置和系统 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4741621A (en) * | 1986-08-18 | 1988-05-03 | Westinghouse Electric Corp. | Geometric surface inspection system with dual overlap light stripe generator |
US5083867A (en) * | 1988-11-28 | 1992-01-28 | Allegheny Ludlum Corporation | Slab surface contour monitor |
US5129010A (en) * | 1989-12-15 | 1992-07-07 | Kabushiki Kaisha Toyoto Chuo Kenkyusho | System for measuring shapes and dimensions of gaps and flushnesses on three dimensional surfaces of objects |
US5125746A (en) * | 1990-06-07 | 1992-06-30 | Harold Lipshitz | Surface topography measurement apparatus and method |
CA2070824A1 (en) * | 1990-10-24 | 1992-04-25 | Herbert Barg | Process and device for the opto-electronic measurement of objects |
DE4408291C2 (de) * | 1994-03-11 | 1997-04-10 | Abb Patent Gmbh | Verfahren zur automatisierten optischen Prüfung einer Schweißnaht eines Bauteils unter Anwendung des Lichtschnittverfahrens |
DE4411986A1 (de) * | 1994-04-10 | 1995-10-12 | Kjm Ges Fuer Opto Elektronisch | Verfahren und Vorrichtung zur Messung des Querschnitts von stabförmigen Objekten |
-
1995
- 1995-12-04 SE SE9504326A patent/SE516607C2/sv not_active IP Right Cessation
-
1996
- 1996-12-04 EP EP96119460A patent/EP0778462A3/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
EP0778462A2 (en) | 1997-06-11 |
EP0778462A3 (en) | 1998-03-11 |
SE516607C2 (sv) | 2002-02-05 |
SE9504326D0 (sv) | 1995-12-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |