SE0300453D0 - Pattern generation method - Google Patents
Pattern generation methodInfo
- Publication number
- SE0300453D0 SE0300453D0 SE0300453A SE0300453A SE0300453D0 SE 0300453 D0 SE0300453 D0 SE 0300453D0 SE 0300453 A SE0300453 A SE 0300453A SE 0300453 A SE0300453 A SE 0300453A SE 0300453 D0 SE0300453 D0 SE 0300453D0
- Authority
- SE
- Sweden
- Prior art keywords
- electromagnetic radiation
- pattern
- generation method
- pattern generation
- workpiece
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70383—Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70791—Large workpieces, e.g. glass substrates for flat panel displays or solar panels
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
- Dynamo-Electric Clutches, Dynamo-Electric Brakes (AREA)
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0300453A SE0300453D0 (sv) | 2003-02-20 | 2003-02-20 | Pattern generation method |
KR1020057012247A KR20050099609A (ko) | 2003-02-20 | 2004-02-20 | 패턴 생성 방법 |
EP04713277A EP1595184A1 (en) | 2003-02-20 | 2004-02-20 | Pattern generation method |
JP2006502808A JP2006518484A (ja) | 2003-02-20 | 2004-02-20 | パターン発生方法 |
PCT/SE2004/000233 WO2004074940A1 (en) | 2003-02-20 | 2004-02-20 | Pattern generation method |
CNA200480004777XA CN1751273A (zh) | 2003-02-20 | 2004-02-20 | 图案产生方法 |
US11/206,197 US7488957B2 (en) | 2003-02-20 | 2005-08-18 | Pattern generation methods and apparatuses |
US11/980,441 US20080078960A1 (en) | 2003-02-20 | 2007-10-31 | Pattern generation methods and apparatuses |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0300453A SE0300453D0 (sv) | 2003-02-20 | 2003-02-20 | Pattern generation method |
Publications (1)
Publication Number | Publication Date |
---|---|
SE0300453D0 true SE0300453D0 (sv) | 2003-02-20 |
Family
ID=20290453
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE0300453A SE0300453D0 (sv) | 2003-02-20 | 2003-02-20 | Pattern generation method |
Country Status (7)
Country | Link |
---|---|
US (2) | US7488957B2 (ja) |
EP (1) | EP1595184A1 (ja) |
JP (1) | JP2006518484A (ja) |
KR (1) | KR20050099609A (ja) |
CN (1) | CN1751273A (ja) |
SE (1) | SE0300453D0 (ja) |
WO (1) | WO2004074940A1 (ja) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE0300453D0 (sv) | 2003-02-20 | 2003-02-20 | Micronic Laser Systems Ab | Pattern generation method |
US7501601B2 (en) * | 2003-09-03 | 2009-03-10 | Xenetech U.S.A., Inc. | Automated laser engraver |
US7388663B2 (en) * | 2004-10-28 | 2008-06-17 | Asml Netherlands B.V. | Optical position assessment apparatus and method |
DE102006008075A1 (de) * | 2005-04-19 | 2006-10-26 | Kleo Halbleitertechnik Gmbh & Co Kg | Belichtungsanlage |
DE102006008080A1 (de) | 2006-02-22 | 2007-08-30 | Kleo Maschinenbau Ag | Belichtungsanlage |
JP5154178B2 (ja) * | 2007-09-14 | 2013-02-27 | ヤマザキマザック株式会社 | 複合加工旋盤 |
KR20100110996A (ko) * | 2009-04-06 | 2010-10-14 | 주식회사 프로텍 | 그리드 이미지와 스테이지의 이동 각도 조절에 의한 레이저빔 간 피치조절 방법 |
DE102010010071A1 (de) * | 2010-02-26 | 2011-09-01 | Bundesdruckerei Gmbh | Markierungsvorrichtung und Verfahren zum Markieren von Wert- oder Sicherheitsdokumenten unter Verwendung von Lichtleitfasern |
TW201224678A (en) * | 2010-11-04 | 2012-06-16 | Orc Mfg Co Ltd | Exposure device |
CN102841507B (zh) * | 2011-06-23 | 2014-06-25 | 虎尾科技大学 | 激光直写式纳米周期性结构图案制造设备 |
JP6552410B2 (ja) * | 2012-05-30 | 2019-07-31 | ロリク アーゲーRolic Ag | 個別にパターン化された異方性を有する素子の高速な製造 |
US9145332B2 (en) | 2012-08-16 | 2015-09-29 | Infineon Technologies Ag | Etching apparatus and method |
FR3006068B1 (fr) * | 2013-05-24 | 2015-04-24 | Saint Gobain | Procede d'obtention d'un substrat |
CN104459858B (zh) * | 2014-12-30 | 2017-02-22 | 中国科学院长春光学精密机械与物理研究所 | 一种双气浮导轨式光栅刻划刀架驱动装置 |
US9718291B2 (en) * | 2015-10-16 | 2017-08-01 | Oce-Technologies B.V. | Printer carriage support structure |
CN105290664B (zh) * | 2015-12-09 | 2017-04-19 | 重庆镭宝激光智能机器人制造有限公司 | 一种焊接机器人高精度移动装置 |
CN108196433A (zh) * | 2018-02-14 | 2018-06-22 | 温培彬 | 激光光绘机 |
CN109270803B (zh) * | 2018-10-22 | 2020-08-11 | 上海理工大学 | 一种多版并列光刻的排版系统 |
CN112130418A (zh) * | 2019-06-25 | 2020-12-25 | 无锡星微科技有限公司 | 一种用于光栅尺刻写的大尺寸激光直写运动台 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4063103A (en) * | 1975-04-11 | 1977-12-13 | Tokyo Shibaura Electric Co., Ltd. | Electron beam exposure apparatus |
US4445485A (en) | 1981-11-27 | 1984-05-01 | Chamness Jr Addison B | Engine fuel system |
DE4022732A1 (de) | 1990-07-17 | 1992-02-20 | Micronic Laser Systems Ab | Auf einem lichtempfindlich beschichteten substrat durch fokussierte laserstrahlung hergestellte struktur sowie verfahren und vorrichtung zu ihrer herstellung |
DE69226511T2 (de) * | 1992-03-05 | 1999-01-28 | Micronic Laser Systems Ab, Taeby | Verfahren und Vorrichtung zur Belichtung von Substraten |
US6134981A (en) * | 1999-12-03 | 2000-10-24 | Nikon Research Corporation Of America | Precision scanning apparatus and method with fixed and movable guide members |
US5623853A (en) * | 1994-10-19 | 1997-04-29 | Nikon Precision Inc. | Precision motion stage with single guide beam and follower stage |
JPH11237744A (ja) * | 1997-12-18 | 1999-08-31 | Sanee Giken Kk | 露光装置および露光方法 |
US6816302B2 (en) * | 1998-03-02 | 2004-11-09 | Micronic Laser Systems Ab | Pattern generator |
US6816602B2 (en) * | 2001-03-01 | 2004-11-09 | Lockheed Martin Corporation | System and method of deferred postal address processing |
JP4320694B2 (ja) * | 2001-08-08 | 2009-08-26 | 株式会社オーク製作所 | 多重露光描画装置および多重露光式描画方法 |
US7001481B2 (en) * | 2001-11-30 | 2006-02-21 | Micron Technology, Inc. | Method and system providing high flux of point of use activated reactive species for semiconductor processing |
SE0300453D0 (sv) | 2003-02-20 | 2003-02-20 | Micronic Laser Systems Ab | Pattern generation method |
-
2003
- 2003-02-20 SE SE0300453A patent/SE0300453D0/xx unknown
-
2004
- 2004-02-20 JP JP2006502808A patent/JP2006518484A/ja active Pending
- 2004-02-20 KR KR1020057012247A patent/KR20050099609A/ko not_active Application Discontinuation
- 2004-02-20 CN CNA200480004777XA patent/CN1751273A/zh active Pending
- 2004-02-20 WO PCT/SE2004/000233 patent/WO2004074940A1/en active Application Filing
- 2004-02-20 EP EP04713277A patent/EP1595184A1/en not_active Withdrawn
-
2005
- 2005-08-18 US US11/206,197 patent/US7488957B2/en not_active Expired - Lifetime
-
2007
- 2007-10-31 US US11/980,441 patent/US20080078960A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2004074940A1 (en) | 2004-09-02 |
US7488957B2 (en) | 2009-02-10 |
JP2006518484A (ja) | 2006-08-10 |
KR20050099609A (ko) | 2005-10-14 |
CN1751273A (zh) | 2006-03-22 |
US20060027538A1 (en) | 2006-02-09 |
EP1595184A1 (en) | 2005-11-16 |
US20080078960A1 (en) | 2008-04-03 |
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