SE0201140D0 - Method and kit for proximity probing with multivalent proximity probes - Google Patents
Method and kit for proximity probing with multivalent proximity probesInfo
- Publication number
- SE0201140D0 SE0201140D0 SE0201140A SE0201140A SE0201140D0 SE 0201140 D0 SE0201140 D0 SE 0201140D0 SE 0201140 A SE0201140 A SE 0201140A SE 0201140 A SE0201140 A SE 0201140A SE 0201140 D0 SE0201140 D0 SE 0201140D0
- Authority
- SE
- Sweden
- Prior art keywords
- proximity
- kit
- probing
- multivalent
- probes
- Prior art date
Links
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0201140A SE0201140D0 (sv) | 2002-04-12 | 2002-04-12 | Method and kit for proximity probing with multivalent proximity probes |
PCT/SE2002/002133 WO2003044231A1 (en) | 2001-11-23 | 2002-11-22 | Method and kit for proximity probing with multivalent proximity probes |
EP02789085A EP1451356A1 (en) | 2001-11-23 | 2002-11-22 | Method and kit for proximity probing with multivalent proximity probes |
US10/496,385 US8013134B2 (en) | 2001-11-23 | 2002-11-22 | Kit for proximity probing with multivalent proximity probes |
CA002462819A CA2462819A1 (en) | 2001-11-23 | 2002-11-22 | Method and kit for proximity probing with multivalent proximity probes |
AU2002353713A AU2002353713A1 (en) | 2001-11-23 | 2002-11-22 | Method and kit for proximity probing with multivalent proximity probes |
JP2003545851A JP2005509444A (ja) | 2001-11-23 | 2002-11-22 | 多価近接プローブにより近接プロービングするための方法およびキット |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0201140A SE0201140D0 (sv) | 2002-04-12 | 2002-04-12 | Method and kit for proximity probing with multivalent proximity probes |
Publications (1)
Publication Number | Publication Date |
---|---|
SE0201140D0 true SE0201140D0 (sv) | 2002-04-12 |
Family
ID=20287588
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE0201140A SE0201140D0 (sv) | 2001-11-23 | 2002-04-12 | Method and kit for proximity probing with multivalent proximity probes |
Country Status (1)
Country | Link |
---|---|
SE (1) | SE0201140D0 (sv) |
-
2002
- 2002-04-12 SE SE0201140A patent/SE0201140D0/sv unknown
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE602004022347D1 (de) | Testeinrichtung und Testverfahren | |
EP1783503A4 (en) | TESTER AND TEST METHOD | |
IL172986A0 (en) | Hairpin -labeled probes and methods of use | |
DE60226941D1 (de) | Verfahren zum Prüfen der Haut an mehreren Stellen | |
NO20043157L (no) | Nedhulls proveapparat samt fremgangsmate | |
NO20030193D0 (no) | Testremsedeler | |
DE60334958D1 (de) | Ultraschallsonde und Herstellungsverfahren hiervon | |
EP1746385A4 (en) | MEASURING METHOD AND INSTRUMENT FOR SMALL SHOPS | |
DE60303066D1 (de) | Prüfspitze für integrierte Schaltungen | |
DE60110149D1 (de) | Testkopf für Mikrostrukturen | |
EP1821099A4 (en) | ULTRASONIC TEST METHOD AND ULTRASONIC TEST UNIT USED THEREFOR | |
DE50015973D1 (de) | Messgerät mit Seilsonde und Verfahren zum Kürzen der Seilsonde | |
GB2423588B (en) | Probe testing structure | |
EP1617468A4 (en) | PROBE WITH OPTICAL LENGTH MEASURING UNIT AND PROBE PROCESSING | |
DE60308965D1 (de) | Münzprüfverfahren und -vorrichtung | |
DE60141507D1 (de) | Teststreifenmessverfahren | |
GB2395281B (en) | Test probe | |
FI20000292A0 (sv) | Testarrangemang och testförfarande | |
DE10197150T1 (de) | LSI-Prüfvorrichtung | |
FI20021500A0 (sv) | Batterianordning för sonder samt sond | |
SG121985A1 (en) | Method and apparatus for a wobble fixture probe for probing test access point structures | |
DE602004016159D1 (de) | Testeinrichtung | |
ATA2792002A (de) | Temperaturfühler | |
SE0201140D0 (sv) | Method and kit for proximity probing with multivalent proximity probes | |
KR100527793B1 (en) | Probe for detecting hanwoo and method of detecting hanwoo using the same |