SE0201044D0 - Anordning vid ett mätsystem - Google Patents

Anordning vid ett mätsystem

Info

Publication number
SE0201044D0
SE0201044D0 SE0201044A SE0201044A SE0201044D0 SE 0201044 D0 SE0201044 D0 SE 0201044D0 SE 0201044 A SE0201044 A SE 0201044A SE 0201044 A SE0201044 A SE 0201044A SE 0201044 D0 SE0201044 D0 SE 0201044D0
Authority
SE
Sweden
Prior art keywords
area
degree
resolution
measurement system
image
Prior art date
Application number
SE0201044A
Other languages
English (en)
Other versions
SE0201044L (sv
SE523681C2 (sv
Inventor
Mattias Johannesson
Anders Murhed
Original Assignee
Integrated Vision Prod
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Integrated Vision Prod filed Critical Integrated Vision Prod
Priority to SE0201044A priority Critical patent/SE523681C2/sv
Publication of SE0201044D0 publication Critical patent/SE0201044D0/sv
Priority to US10/510,208 priority patent/US20050151863A1/en
Priority to AU2003212775A priority patent/AU2003212775A1/en
Priority to CNB038068052A priority patent/CN1293361C/zh
Priority to EP03708805.1A priority patent/EP1492996B1/en
Priority to JP2003584615A priority patent/JP2005522920A/ja
Priority to CA2477955A priority patent/CA2477955C/en
Priority to PCT/SE2003/000461 priority patent/WO2003087713A1/en
Publication of SE0201044L publication Critical patent/SE0201044L/sv
Publication of SE523681C2 publication Critical patent/SE523681C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0007—Image acquisition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Image Input (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SE0201044A 2002-04-05 2002-04-05 System och sensor för avbildning av egenskaper hos ett objekt SE523681C2 (sv)

Priority Applications (8)

Application Number Priority Date Filing Date Title
SE0201044A SE523681C2 (sv) 2002-04-05 2002-04-05 System och sensor för avbildning av egenskaper hos ett objekt
US10/510,208 US20050151863A1 (en) 2002-04-05 2003-03-19 Arrangement in a measuring system
AU2003212775A AU2003212775A1 (en) 2002-04-05 2003-03-19 Arrangement in a measuring system
CNB038068052A CN1293361C (zh) 2002-04-05 2003-03-19 测量系统中的装置
EP03708805.1A EP1492996B1 (en) 2002-04-05 2003-03-19 Arrangement in a measuring system
JP2003584615A JP2005522920A (ja) 2002-04-05 2003-03-19 測定システムにおける装置
CA2477955A CA2477955C (en) 2002-04-05 2003-03-19 Arrangement in a measuring system
PCT/SE2003/000461 WO2003087713A1 (en) 2002-04-05 2003-03-19 Arrangement in a measuring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0201044A SE523681C2 (sv) 2002-04-05 2002-04-05 System och sensor för avbildning av egenskaper hos ett objekt

Publications (3)

Publication Number Publication Date
SE0201044D0 true SE0201044D0 (sv) 2002-04-05
SE0201044L SE0201044L (sv) 2003-10-06
SE523681C2 SE523681C2 (sv) 2004-05-11

Family

ID=20287507

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0201044A SE523681C2 (sv) 2002-04-05 2002-04-05 System och sensor för avbildning av egenskaper hos ett objekt

Country Status (8)

Country Link
US (1) US20050151863A1 (sv)
EP (1) EP1492996B1 (sv)
JP (1) JP2005522920A (sv)
CN (1) CN1293361C (sv)
AU (1) AU2003212775A1 (sv)
CA (1) CA2477955C (sv)
SE (1) SE523681C2 (sv)
WO (1) WO2003087713A1 (sv)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005115820A1 (de) * 2004-05-25 2005-12-08 Siemens Aktiengesellschaft Überwachungseinheit nebst assistenzsystem für kraftfahrzeuge
US7780089B2 (en) 2005-06-03 2010-08-24 Hand Held Products, Inc. Digital picture taking optical reader having hybrid monochrome and color image sensor array
US7611060B2 (en) 2005-03-11 2009-11-03 Hand Held Products, Inc. System and method to automatically focus an image reader
EP3920079B1 (en) * 2005-03-11 2023-06-28 Hand Held Products, Inc. Digital picture taking optical reader having hybrid monochrome and color image sensor array
US7568628B2 (en) 2005-03-11 2009-08-04 Hand Held Products, Inc. Bar code reading device with global electronic shutter control
US7770799B2 (en) 2005-06-03 2010-08-10 Hand Held Products, Inc. Optical reader having reduced specular reflection read failures
US7528943B2 (en) * 2005-12-27 2009-05-05 Kla-Tencor Technologies Corporation Method and apparatus for simultaneous high-speed acquisition of multiple images
JP5538223B2 (ja) * 2008-07-18 2014-07-02 瀬戸製材株式会社 木材の管理システム
FI20106053A0 (sv) * 2010-10-13 2010-10-13 Metso Automation Oy System för övervakning av bana och motsvarande förfarande för övervakning av bana
CN102175172B (zh) * 2010-12-30 2012-07-04 南京理工大学 一种基于图像识别的机动车辆外形尺寸检测系统
US11509880B2 (en) * 2012-11-14 2022-11-22 Qualcomm Incorporated Dynamic adjustment of light source power in structured light active depth sensing systems
DE102014213289A1 (de) * 2014-07-09 2016-01-14 Robert Bosch Gmbh Verfahren und Vorrichtung zur dreidimensionalen optischen Erfassung eines Objekts
JP2017098830A (ja) * 2015-11-26 2017-06-01 キヤノン株式会社 放射線撮像装置、放射線撮像システム及び放射線撮像装置の製造方法
DE102016220757A1 (de) * 2016-10-21 2018-04-26 Texmag Gmbh Vertriebsgesellschaft Verfahren und Vorrichtung zur Materialbahnbeobachtung und Materialbahninspektion
US11507097B2 (en) * 2018-02-05 2022-11-22 Pixart Imaging Inc. Control apparatus for auto clean machine and auto clean machine control method
CN112019777B (zh) * 2020-09-16 2021-10-26 南京大学 基于时间延迟积分(tdi)的图像传感器及其成像方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4204230A (en) 1978-10-25 1980-05-20 Xerox Corporation High resolution input scanner using a two dimensional detector array
NL8901156A (nl) * 1989-05-08 1990-12-03 Imec Inter Uni Micro Electr Stralingsgevoelig orgaan of sensor in retina-achtige configuratie.
IL99823A0 (en) * 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
US5355309A (en) * 1992-12-30 1994-10-11 General Electric Company Cone beam spotlight imaging using multi-resolution area detector
EP0703716B1 (en) * 1994-09-22 2002-11-27 Sanyo Electric Co. Ltd Method of converting two-dimensional images into three-dimensional images
JP3604781B2 (ja) 1995-06-19 2004-12-22 キヤノン株式会社 光学機器
GB9515311D0 (en) 1995-07-26 1995-09-20 3D Scanners Ltd Stripe scanners and methods of scanning
JPH09247545A (ja) * 1996-03-11 1997-09-19 Matsushita Electric Ind Co Ltd スキャナ型電子カメラ
JP3832902B2 (ja) * 1996-08-30 2006-10-11 本田技研工業株式会社 半導体イメージセンサ
US6122046A (en) * 1998-10-02 2000-09-19 Applied Materials, Inc. Dual resolution combined laser spot scanning and area imaging inspection
SE514859C2 (sv) * 1999-01-18 2001-05-07 Mydata Automation Ab Förfarande och anordning för undersökning av objekt på ett substrat genom att ta bilder av substratet och analysera dessa
US7034272B1 (en) * 1999-10-05 2006-04-25 Electro Scientific Industries, Inc. Method and apparatus for evaluating integrated circuit packages having three dimensional features
TW475330B (en) * 1999-10-29 2002-02-01 Hewlett Packard Co Photosensor array with multiple different sensor areas
US6750899B1 (en) * 2000-01-07 2004-06-15 Cyberoptics Corporation Solder paste inspection system
US6683704B1 (en) * 2000-05-12 2004-01-27 Hewlett-Packard Development Company, L.P. Apparatus for determining the best image from a dual resolution photo sensor

Also Published As

Publication number Publication date
EP1492996A1 (en) 2005-01-05
CN1293361C (zh) 2007-01-03
SE0201044L (sv) 2003-10-06
EP1492996B1 (en) 2014-03-12
SE523681C2 (sv) 2004-05-11
CN1643337A (zh) 2005-07-20
WO2003087713A1 (en) 2003-10-23
JP2005522920A (ja) 2005-07-28
US20050151863A1 (en) 2005-07-14
AU2003212775A1 (en) 2003-10-27
CA2477955A1 (en) 2003-10-23
CA2477955C (en) 2014-05-27

Similar Documents

Publication Publication Date Title
SE0201044D0 (sv) Anordning vid ett mätsystem
JP6410824B2 (ja) 画像センサのフリッカ検出
CN101682687A (zh) 放射线检测设备和放射线成像系统
Simoni et al. A Digital Camera for Machine Vision
US20060244843A1 (en) Illumination flicker detection
EP2095424B1 (en) Pixel structure having shielded storage node
BR9206087A (pt) Método aperfeiçoado de disparo e arranjo aperfeiçoado de detecção de raios x
DE69410685D1 (de) Hochauflösendes Strahlungsabbildungssystem
AU2001282984A1 (en) Method and apparatus for producing an electrical property image using a charge correlation matrix
JP5309284B2 (ja) 電荷伝達効率測定用光学試験装置
EP1351311A3 (en) An interlined charge-coupled device having an extended dynamic range
DE60208058D1 (de) Passive optoelektronische überwachungseinrichtung
WO2004081517A3 (fr) Matrice de pixels detecteurs integree sur circuit de lecture de charges
ITMI912494A0 (it) Sensore a telecamera ad alta risoluzione avente un insieme lineare di pixel
ATE437527T1 (de) Sensorelementanordnung
DE69510454D1 (de) Cmos-bildmatrix mit aktiven bildelementen
CN101939667B (zh) 用于检测图像的设备和方法
JP4408593B2 (ja) 放射線検出装置及びシステム
WO2015126021A1 (ko) 3차원 영상 정보를 얻기 위한 이미지센서 및 2차원 영상과 3차원 영상 정보의 정합 방법
GB2370371A9 (en) Imaging system having a distorting optical element
KR100272819B1 (ko) 고체 촬상 장치
Moore et al. Low cost thermal imaging for power systems applications using a conventional CCD camera
Mandl Instrument-quality digital camera that transitioned to low-cost high-volume production
EP1014438A3 (en) A measurement system
JP2003249637A (ja) 画像検出器

Legal Events

Date Code Title Description
NUG Patent has lapsed