DE69410685D1 - Hochauflösendes Strahlungsabbildungssystem - Google Patents

Hochauflösendes Strahlungsabbildungssystem

Info

Publication number
DE69410685D1
DE69410685D1 DE69410685T DE69410685T DE69410685D1 DE 69410685 D1 DE69410685 D1 DE 69410685D1 DE 69410685 T DE69410685 T DE 69410685T DE 69410685 T DE69410685 T DE 69410685T DE 69410685 D1 DE69410685 D1 DE 69410685D1
Authority
DE
Germany
Prior art keywords
imaging system
high resolution
radiation imaging
resolution radiation
resolution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69410685T
Other languages
English (en)
Other versions
DE69410685T2 (de
Inventor
Jack Dean Kingsley
Chukka Srinivas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of DE69410685D1 publication Critical patent/DE69410685D1/de
Application granted granted Critical
Publication of DE69410685T2 publication Critical patent/DE69410685T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/48—Increasing resolution by shifting the sensor relative to the scene
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/2019—Shielding against direct hits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays

Landscapes

  • General Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Radiography Using Non-Light Waves (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
DE69410685T 1993-04-05 1994-03-29 Hochauflösendes Strahlungsabbildungssystem Expired - Lifetime DE69410685T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/043,116 US5340988A (en) 1993-04-05 1993-04-05 High resolution radiation imaging system

Publications (2)

Publication Number Publication Date
DE69410685D1 true DE69410685D1 (de) 1998-07-09
DE69410685T2 DE69410685T2 (de) 1999-02-18

Family

ID=21925584

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69410685T Expired - Lifetime DE69410685T2 (de) 1993-04-05 1994-03-29 Hochauflösendes Strahlungsabbildungssystem

Country Status (4)

Country Link
US (1) US5340988A (de)
EP (1) EP0619503B1 (de)
JP (1) JPH0737075A (de)
DE (1) DE69410685T2 (de)

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US5712890A (en) * 1994-11-23 1998-01-27 Thermotrex Corp. Full breast digital mammography device
WO1996015722A1 (en) * 1994-11-23 1996-05-30 Thermotrex Corporation X-ray imaging device
US5715292A (en) * 1994-11-25 1998-02-03 Loral Fairchild Corporation Digital sensor cassette for mammography
US5510623A (en) * 1995-02-24 1996-04-23 Loral Fairchild Corp. Center readout intra-oral image sensor
US7136452B2 (en) * 1995-05-31 2006-11-14 Goldpower Limited Radiation imaging system, device and method for scan imaging
US5841911A (en) * 1995-06-06 1998-11-24 Ben Gurion, University Of The Negev Method for the restoration of images disturbed by the atmosphere
US5693948A (en) * 1995-11-21 1997-12-02 Loral Fairchild Corporation Advanced CCD-based x-ray image sensor system
US6232607B1 (en) 1996-05-08 2001-05-15 Ifire Technology Inc. High resolution flat panel for radiation imaging
US6388258B1 (en) * 1996-11-24 2002-05-14 Ge. Medical Systems Israel Ltd. Solid state gamma camera
US5822392A (en) * 1996-12-26 1998-10-13 General Electric Company Multi-resolution detection for increasing in an x-ray imaging implementation of an object
US6166853A (en) * 1997-01-09 2000-12-26 The University Of Connecticut Method and apparatus for three-dimensional deconvolution of optical microscope images
US5847398A (en) * 1997-07-17 1998-12-08 Imarad Imaging Systems Ltd. Gamma-ray imaging with sub-pixel resolution
US6486470B2 (en) 1998-11-02 2002-11-26 1294339 Ontario, Inc. Compensation circuit for use in a high resolution amplified flat panel for radiation imaging
US6166384A (en) * 1998-11-06 2000-12-26 General Electric Company Method and apparatus for minimizing blurring and generating a high resolution image in a radiation imaging system
EP1014709A3 (de) * 1998-12-24 2000-12-13 Fuji Photo Film Co., Ltd. Strahlungsbildausleseverfahren und -vorrichtung
US6570613B1 (en) * 1999-02-26 2003-05-27 Paul Howell Resolution-enhancement method for digital imaging
US6350985B1 (en) 1999-04-26 2002-02-26 Direct Radiography Corp. Method for calculating gain correction factors in a digital imaging system
US6393098B1 (en) 1999-08-31 2002-05-21 General Electric Company Amplifier offset and gain correction system for X-ray imaging panel
US6266391B1 (en) 1999-08-31 2001-07-24 General Electric Company Artifact compensation system for matrix-addressed x-ray imaging panel
US6404851B1 (en) 2000-03-30 2002-06-11 General Electric Company Method and apparatus for automatic exposure control using localized capacitive coupling in a matrix-addressed imaging panel
US20020063923A1 (en) * 2000-06-02 2002-05-30 Lightchip, Inc. System and method for improving optical signal-to-noise ratio measurement range of a monitoring device
CN1273843C (zh) * 2000-12-22 2006-09-06 金色力量有限公司 一种用于扫描成像的辐射成像系统以及方法
US7132636B1 (en) * 2001-07-06 2006-11-07 Palantyr Research, Llc Imaging system and methodology employing reciprocal space optical design
KR100505355B1 (ko) * 2002-07-22 2005-08-01 남상희 고해상도 디지털 엑스레이 검출용 tft 기판
JP2005077913A (ja) * 2003-09-02 2005-03-24 Toshiba Matsushita Display Technology Co Ltd 表示装置
JP4624758B2 (ja) * 2003-10-20 2011-02-02 ジョーダン ヴァリー セミコンダクターズ リミテッド サンプルの検査方法及び装置
US7590306B2 (en) * 2003-11-26 2009-09-15 Ge Medical Systems Global Technology Company, Llc Resolution adaptive image filtering system and method
US7105828B2 (en) * 2004-02-10 2006-09-12 Ge Medical Systems Global Technology Company, Llc Hybrid x-ray detector
US20060018566A1 (en) * 2004-07-26 2006-01-26 Coleman Christopher R System and method for adding spatial frequency into an image
JP4640589B2 (ja) * 2005-05-12 2011-03-02 株式会社島津製作所 Ｘ線撮影装置
US7113566B1 (en) * 2005-07-15 2006-09-26 Jordan Valley Applied Radiation Ltd. Enhancing resolution of X-ray measurements by sample motion
US20070223572A1 (en) * 2006-03-24 2007-09-27 Samsung Electronics Co., Ltd. Method and system of pixel interleaving for improving video signal transmission quality in wireless communication
US8194750B2 (en) 2006-10-16 2012-06-05 Samsung Electronics Co., Ltd. System and method for digital communication having a circulant bit interleaver for equal error protection (EEP) and unequal error protection (UEP)
WO2009061439A2 (en) * 2007-11-06 2009-05-14 Tessera North America, Inc. Determinate and indeterminate optical systems
US8582052B2 (en) * 2008-08-22 2013-11-12 Gentex Corporation Discrete LED backlight control for a reduced power LCD display system
JP5106323B2 (ja) * 2008-09-04 2012-12-26 三菱電機株式会社 レーダ画像再生装置
JP2010066131A (ja) * 2008-09-11 2010-03-25 Mitsubishi Electric Corp 画像レーダ装置および画像レーダシステム
ITMI20081798A1 (it) * 2008-10-10 2010-04-11 Cnr Consiglio Naz Delle Ric Erche Dispositivo scintigrafico a super-risoluzione spaziale
US8243878B2 (en) 2010-01-07 2012-08-14 Jordan Valley Semiconductors Ltd. High-resolution X-ray diffraction measurement with enhanced sensitivity
US8687766B2 (en) 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
US8437450B2 (en) 2010-12-02 2013-05-07 Jordan Valley Semiconductors Ltd. Fast measurement of X-ray diffraction from tilted layers
US8781070B2 (en) 2011-08-11 2014-07-15 Jordan Valley Semiconductors Ltd. Detection of wafer-edge defects
JP6423415B2 (ja) 2013-04-04 2018-11-14 イリノイ トゥール ワークス インコーポレイティド ヘリカルコンピュータートモグラフィー
EP3035038B1 (de) 2013-04-12 2017-07-19 Illinois Tool Works Inc. Hochauflösende computertomografie
US9726624B2 (en) 2014-06-18 2017-08-08 Bruker Jv Israel Ltd. Using multiple sources/detectors for high-throughput X-ray topography measurement
US10261213B2 (en) * 2017-06-07 2019-04-16 General Electric Company Apparatus and method for flexible gamma ray detectors

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JPS574675A (en) * 1980-06-12 1982-01-11 Matsushita Electric Ind Co Ltd Band compressing device of video signal
JPS5856581A (ja) * 1981-09-30 1983-04-04 Hitachi Ltd ビデオカメラ
CA1219086A (en) * 1983-08-19 1987-03-10 Kazuhiro Iinuma Radiation imaging apparatus
GB8611432D0 (en) * 1986-05-09 1986-06-18 Flor Henry M Sheet sensor assembly
JPH0447288A (ja) * 1990-06-14 1992-02-17 Shimadzu Corp マルチラインセンサ型放射線像撮像装置
JPH04296064A (ja) * 1991-03-26 1992-10-20 Shimadzu Corp 放射線検出器アレイ
US5182652A (en) * 1991-09-06 1993-01-26 Eastman Kodak Company High resolution thermal printing by imaging a hard copy image in vertical and horizontal increments smaller than the pixel pitch of a video imager array

Also Published As

Publication number Publication date
JPH0737075A (ja) 1995-02-07
DE69410685T2 (de) 1999-02-18
US5340988A (en) 1994-08-23
EP0619503B1 (de) 1998-06-03
EP0619503A1 (de) 1994-10-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: ROEGER UND KOLLEGEN, 73728 ESSLINGEN