SE0201044L - Anordning vid ett mätsystem - Google Patents
Anordning vid ett mätsystemInfo
- Publication number
- SE0201044L SE0201044L SE0201044A SE0201044A SE0201044L SE 0201044 L SE0201044 L SE 0201044L SE 0201044 A SE0201044 A SE 0201044A SE 0201044 A SE0201044 A SE 0201044A SE 0201044 L SE0201044 L SE 0201044L
- Authority
- SE
- Sweden
- Prior art keywords
- area
- degree
- resolution
- measurement system
- image
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
- 230000005670 electromagnetic radiation Effects 0.000 abstract 1
- 238000003384 imaging method Methods 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T1/00—General purpose image data processing
- G06T1/0007—Image acquisition
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Image Input (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0201044A SE523681C2 (sv) | 2002-04-05 | 2002-04-05 | System och sensor för avbildning av egenskaper hos ett objekt |
EP03708805.1A EP1492996B1 (en) | 2002-04-05 | 2003-03-19 | Arrangement in a measuring system |
JP2003584615A JP2005522920A (ja) | 2002-04-05 | 2003-03-19 | 測定システムにおける装置 |
AU2003212775A AU2003212775A1 (en) | 2002-04-05 | 2003-03-19 | Arrangement in a measuring system |
PCT/SE2003/000461 WO2003087713A1 (en) | 2002-04-05 | 2003-03-19 | Arrangement in a measuring system |
CA2477955A CA2477955C (en) | 2002-04-05 | 2003-03-19 | Arrangement in a measuring system |
US10/510,208 US20050151863A1 (en) | 2002-04-05 | 2003-03-19 | Arrangement in a measuring system |
CNB038068052A CN1293361C (zh) | 2002-04-05 | 2003-03-19 | 测量系统中的装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE0201044A SE523681C2 (sv) | 2002-04-05 | 2002-04-05 | System och sensor för avbildning av egenskaper hos ett objekt |
Publications (3)
Publication Number | Publication Date |
---|---|
SE0201044D0 SE0201044D0 (sv) | 2002-04-05 |
SE0201044L true SE0201044L (sv) | 2003-10-06 |
SE523681C2 SE523681C2 (sv) | 2004-05-11 |
Family
ID=20287507
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE0201044A SE523681C2 (sv) | 2002-04-05 | 2002-04-05 | System och sensor för avbildning av egenskaper hos ett objekt |
Country Status (8)
Country | Link |
---|---|
US (1) | US20050151863A1 (sv) |
EP (1) | EP1492996B1 (sv) |
JP (1) | JP2005522920A (sv) |
CN (1) | CN1293361C (sv) |
AU (1) | AU2003212775A1 (sv) |
CA (1) | CA2477955C (sv) |
SE (1) | SE523681C2 (sv) |
WO (1) | WO2003087713A1 (sv) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE502005003754D1 (de) * | 2004-05-25 | 2008-05-29 | Vdo Automotive Ag | Überwachungseinheit nebst assistenzsystem für kraftfahrzeuge |
US7780089B2 (en) | 2005-06-03 | 2010-08-24 | Hand Held Products, Inc. | Digital picture taking optical reader having hybrid monochrome and color image sensor array |
US7611060B2 (en) | 2005-03-11 | 2009-11-03 | Hand Held Products, Inc. | System and method to automatically focus an image reader |
US7568628B2 (en) | 2005-03-11 | 2009-08-04 | Hand Held Products, Inc. | Bar code reading device with global electronic shutter control |
EP3139593B1 (en) * | 2005-03-11 | 2021-08-18 | Hand Held Products, Inc. | Digital picture taking optical reader having hybrid monochrome and color image sensor array |
US7770799B2 (en) | 2005-06-03 | 2010-08-10 | Hand Held Products, Inc. | Optical reader having reduced specular reflection read failures |
US7528943B2 (en) * | 2005-12-27 | 2009-05-05 | Kla-Tencor Technologies Corporation | Method and apparatus for simultaneous high-speed acquisition of multiple images |
JP5538223B2 (ja) * | 2008-07-18 | 2014-07-02 | 瀬戸製材株式会社 | 木材の管理システム |
FI20106053A0 (sv) * | 2010-10-13 | 2010-10-13 | Metso Automation Oy | System för övervakning av bana och motsvarande förfarande för övervakning av bana |
CN102175172B (zh) * | 2010-12-30 | 2012-07-04 | 南京理工大学 | 一种基于图像识别的机动车辆外形尺寸检测系统 |
US11509880B2 (en) * | 2012-11-14 | 2022-11-22 | Qualcomm Incorporated | Dynamic adjustment of light source power in structured light active depth sensing systems |
DE102014213289A1 (de) * | 2014-07-09 | 2016-01-14 | Robert Bosch Gmbh | Verfahren und Vorrichtung zur dreidimensionalen optischen Erfassung eines Objekts |
JP2017098830A (ja) * | 2015-11-26 | 2017-06-01 | キヤノン株式会社 | 放射線撮像装置、放射線撮像システム及び放射線撮像装置の製造方法 |
DE102016220757A1 (de) * | 2016-10-21 | 2018-04-26 | Texmag Gmbh Vertriebsgesellschaft | Verfahren und Vorrichtung zur Materialbahnbeobachtung und Materialbahninspektion |
US11507097B2 (en) | 2018-02-05 | 2022-11-22 | Pixart Imaging Inc. | Control apparatus for auto clean machine and auto clean machine control method |
CN112019777B (zh) * | 2020-09-16 | 2021-10-26 | 南京大学 | 基于时间延迟积分(tdi)的图像传感器及其成像方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4204230A (en) | 1978-10-25 | 1980-05-20 | Xerox Corporation | High resolution input scanner using a two dimensional detector array |
NL8901156A (nl) | 1989-05-08 | 1990-12-03 | Imec Inter Uni Micro Electr | Stralingsgevoelig orgaan of sensor in retina-achtige configuratie. |
IL99823A0 (en) * | 1990-11-16 | 1992-08-18 | Orbot Instr Ltd | Optical inspection method and apparatus |
US5355309A (en) * | 1992-12-30 | 1994-10-11 | General Electric Company | Cone beam spotlight imaging using multi-resolution area detector |
KR100374463B1 (ko) * | 1994-09-22 | 2003-05-09 | 산요 덴키 가부시키가이샤 | 2차원영상을3차원영상으로변환하는방법 |
JP3604781B2 (ja) * | 1995-06-19 | 2004-12-22 | キヤノン株式会社 | 光学機器 |
GB9515311D0 (en) * | 1995-07-26 | 1995-09-20 | 3D Scanners Ltd | Stripe scanners and methods of scanning |
JPH09247545A (ja) * | 1996-03-11 | 1997-09-19 | Matsushita Electric Ind Co Ltd | スキャナ型電子カメラ |
JP3832902B2 (ja) * | 1996-08-30 | 2006-10-11 | 本田技研工業株式会社 | 半導体イメージセンサ |
US6122046A (en) * | 1998-10-02 | 2000-09-19 | Applied Materials, Inc. | Dual resolution combined laser spot scanning and area imaging inspection |
SE514859C2 (sv) * | 1999-01-18 | 2001-05-07 | Mydata Automation Ab | Förfarande och anordning för undersökning av objekt på ett substrat genom att ta bilder av substratet och analysera dessa |
US7034272B1 (en) * | 1999-10-05 | 2006-04-25 | Electro Scientific Industries, Inc. | Method and apparatus for evaluating integrated circuit packages having three dimensional features |
TW475330B (en) * | 1999-10-29 | 2002-02-01 | Hewlett Packard Co | Photosensor array with multiple different sensor areas |
US6750899B1 (en) * | 2000-01-07 | 2004-06-15 | Cyberoptics Corporation | Solder paste inspection system |
US6683704B1 (en) * | 2000-05-12 | 2004-01-27 | Hewlett-Packard Development Company, L.P. | Apparatus for determining the best image from a dual resolution photo sensor |
-
2002
- 2002-04-05 SE SE0201044A patent/SE523681C2/sv not_active IP Right Cessation
-
2003
- 2003-03-19 CN CNB038068052A patent/CN1293361C/zh not_active Expired - Lifetime
- 2003-03-19 EP EP03708805.1A patent/EP1492996B1/en not_active Expired - Lifetime
- 2003-03-19 US US10/510,208 patent/US20050151863A1/en not_active Abandoned
- 2003-03-19 JP JP2003584615A patent/JP2005522920A/ja active Pending
- 2003-03-19 AU AU2003212775A patent/AU2003212775A1/en not_active Abandoned
- 2003-03-19 CA CA2477955A patent/CA2477955C/en not_active Expired - Lifetime
- 2003-03-19 WO PCT/SE2003/000461 patent/WO2003087713A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
CN1293361C (zh) | 2007-01-03 |
JP2005522920A (ja) | 2005-07-28 |
WO2003087713A1 (en) | 2003-10-23 |
CA2477955C (en) | 2014-05-27 |
SE0201044D0 (sv) | 2002-04-05 |
US20050151863A1 (en) | 2005-07-14 |
SE523681C2 (sv) | 2004-05-11 |
CA2477955A1 (en) | 2003-10-23 |
AU2003212775A1 (en) | 2003-10-27 |
CN1643337A (zh) | 2005-07-20 |
EP1492996B1 (en) | 2014-03-12 |
EP1492996A1 (en) | 2005-01-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SE0201044L (sv) | Anordning vid ett mätsystem | |
CN101682687B (zh) | 放射线检测设备和放射线成像系统 | |
US20060244843A1 (en) | Illumination flicker detection | |
EP2095424B1 (en) | Pixel structure having shielded storage node | |
BR9206087A (pt) | Método aperfeiçoado de disparo e arranjo aperfeiçoado de detecção de raios x | |
AU3453000A (en) | A method and system for super resolution | |
DE69410685D1 (de) | Hochauflösendes Strahlungsabbildungssystem | |
AU2001282984A1 (en) | Method and apparatus for producing an electrical property image using a charge correlation matrix | |
CA2184429A1 (en) | Solid state radiation imager with gate electrode plane shield wires | |
BR0201953A (pt) | Aparelho para formação de imagens, tendo múltiplas matrizes fotossensoras lineares com diferentes resoluções espaciais | |
EP1351311A3 (en) | An interlined charge-coupled device having an extended dynamic range | |
DE60208058D1 (de) | Passive optoelektronische überwachungseinrichtung | |
WO2004081517A3 (fr) | Matrice de pixels detecteurs integree sur circuit de lecture de charges | |
ITMI912494A0 (it) | Sensore a telecamera ad alta risoluzione avente un insieme lineare di pixel | |
CN101939667B (zh) | 用于检测图像的设备和方法 | |
DE602004022131D1 (de) | Sensorelementanordnung | |
GB2370371A9 (en) | Imaging system having a distorting optical element | |
WO2015126021A1 (ko) | 3차원 영상 정보를 얻기 위한 이미지센서 및 2차원 영상과 3차원 영상 정보의 정합 방법 | |
KR20180037616A (ko) | 방사선 검출기 | |
KR100272819B1 (ko) | 고체 촬상 장치 | |
Moore et al. | Low cost thermal imaging for power systems applications using a conventional CCD camera | |
Mandl | Instrument-quality digital camera that transitioned to low-cost high-volume production | |
EP1014438A3 (en) | A measurement system | |
EP3445039B1 (en) | Detection circuit for photo sensor with stacked substrates | |
Scheffer et al. | 6.6 Mpixel Pixel CMOS Image Sensor for Electrostatic PCB Inspection |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |