SE0100663L - Införande av kalibreringstestsekvens hos A/D-omvandlare - Google Patents

Införande av kalibreringstestsekvens hos A/D-omvandlare

Info

Publication number
SE0100663L
SE0100663L SE0100663A SE0100663A SE0100663L SE 0100663 L SE0100663 L SE 0100663L SE 0100663 A SE0100663 A SE 0100663A SE 0100663 A SE0100663 A SE 0100663A SE 0100663 L SE0100663 L SE 0100663L
Authority
SE
Sweden
Prior art keywords
converter
test sequence
converters
introduction
calibration test
Prior art date
Application number
SE0100663A
Other languages
English (en)
Other versions
SE520277C2 (sv
SE0100663D0 (sv
Inventor
Bengt Erik Jonsson
Christer Alf Jansson
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE0100663A priority Critical patent/SE520277C2/sv
Publication of SE0100663D0 publication Critical patent/SE0100663D0/sv
Priority to SE0101423A priority patent/SE522569C2/sv
Priority to ES02711591T priority patent/ES2243698T3/es
Priority to EP02711591A priority patent/EP1366571B1/en
Priority to PCT/SE2002/000220 priority patent/WO2002069501A1/en
Priority to AT02711591T priority patent/ATE297071T1/de
Priority to DE60204433T priority patent/DE60204433T2/de
Priority to US10/468,234 priority patent/US7405681B2/en
Priority to EP02712557A priority patent/EP1364461B1/en
Priority to AT02712557T priority patent/ATE332589T1/de
Priority to PCT/SE2002/000239 priority patent/WO2002069502A1/en
Priority to DE60212940T priority patent/DE60212940T2/de
Priority to US10/466,706 priority patent/US6816103B2/en
Priority to ES02712557T priority patent/ES2267995T3/es
Publication of SE0100663L publication Critical patent/SE0100663L/sv
Publication of SE520277C2 publication Critical patent/SE520277C2/sv

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/108—Converters having special provisions for facilitating access for testing purposes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
    • H03M1/164—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages
    • H03M1/167—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages all stages comprising simultaneous converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Cash Registers Or Receiving Machines (AREA)
SE0100663A 2001-02-27 2001-02-27 Införande av kalibreringssekvens hos en A/D-omvandlare SE520277C2 (sv)

Priority Applications (14)

Application Number Priority Date Filing Date Title
SE0100663A SE520277C2 (sv) 2001-02-27 2001-02-27 Införande av kalibreringssekvens hos en A/D-omvandlare
SE0101423A SE522569C2 (sv) 2001-02-27 2001-04-24 Dynamisk elemetanpassning i a/d-omvandlare
US10/468,234 US7405681B2 (en) 2001-02-27 2002-02-08 A/D converter calibration test sequence insertion
DE60204433T DE60204433T2 (de) 2001-02-27 2002-02-08 Kalibrationstestsequenzeinfügung für A/D-Umsetzer
EP02711591A EP1366571B1 (en) 2001-02-27 2002-02-08 A/d converter calibration test sequence insertion
PCT/SE2002/000220 WO2002069501A1 (en) 2001-02-27 2002-02-08 A/d converter calibration test sequence insertion
AT02711591T ATE297071T1 (de) 2001-02-27 2002-02-08 Kalibrationstestsequenz einfügung für a/d- umsetzer
ES02711591T ES2243698T3 (es) 2001-02-27 2002-02-08 Introduccion de una secuencia de ensayo para el calibrado de un convertidor a/n.
ES02712557T ES2267995T3 (es) 2001-02-27 2002-02-13 Emparejamiento dinamico de elementos para convertidores a/d.
AT02712557T ATE332589T1 (de) 2001-02-27 2002-02-13 Vergleich dynamischer elemente in a/d-umsetzern
EP02712557A EP1364461B1 (en) 2001-02-27 2002-02-13 Dynamic element matching in a/d converters
PCT/SE2002/000239 WO2002069502A1 (en) 2001-02-27 2002-02-13 Dynamic element matching in a/d converters
DE60212940T DE60212940T2 (de) 2001-02-27 2002-02-13 Vergleich dynamischer elemente in a/d-umsetzern
US10/466,706 US6816103B2 (en) 2001-02-27 2002-02-13 Dynamic element matching in A/D converters

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0100663A SE520277C2 (sv) 2001-02-27 2001-02-27 Införande av kalibreringssekvens hos en A/D-omvandlare

Publications (3)

Publication Number Publication Date
SE0100663D0 SE0100663D0 (sv) 2001-02-27
SE0100663L true SE0100663L (sv) 2002-08-28
SE520277C2 SE520277C2 (sv) 2003-06-17

Family

ID=20283143

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0100663A SE520277C2 (sv) 2001-02-27 2001-02-27 Införande av kalibreringssekvens hos en A/D-omvandlare

Country Status (7)

Country Link
US (1) US7405681B2 (sv)
EP (1) EP1366571B1 (sv)
AT (1) ATE297071T1 (sv)
DE (1) DE60204433T2 (sv)
ES (1) ES2243698T3 (sv)
SE (1) SE520277C2 (sv)
WO (1) WO2002069501A1 (sv)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7046179B1 (en) * 2004-02-13 2006-05-16 National Semiconductor Corporation Apparatus and method for on-chip ADC calibration
JP4811339B2 (ja) * 2006-09-21 2011-11-09 株式会社デンソー Ａ／ｄ変換器
US20090073126A1 (en) 2007-07-16 2009-03-19 Srivastava Aditya Narain Standardized method and systems for providing configurable keypads
KR101059460B1 (ko) * 2008-10-06 2011-08-25 한국전자통신연구원 알고리즘 아날로그-디지털 변환기
US8188753B2 (en) 2009-02-18 2012-05-29 Analog Devices, Inc. Analog computation
US8068045B2 (en) * 2010-03-01 2011-11-29 Analog Devices, Inc. Calibration methods and structures for pipelined converter systems
JP5018920B2 (ja) * 2010-03-24 2012-09-05 株式会社デンソー Ａ／ｄ変換器
TWI419475B (zh) * 2010-04-02 2013-12-11 Faraday Tech Corp 類比數位轉換器的測試系統與測試方法
EP2532177B1 (en) * 2010-08-18 2017-02-01 Analog Devices, Inc. Charge sharing analog computation circuitry and applications
KR101684748B1 (ko) 2011-06-06 2016-12-08 아날로그 디바이시스, 인코포레이티드 전하 공유 시간 영역 필터
US8723707B2 (en) 2011-11-14 2014-05-13 Analog Devices, Inc. Correlation-based background calibration for reducing inter-stage gain error and non-linearity in pipelined analog-to-digital converters
US8742961B2 (en) * 2012-01-24 2014-06-03 Synopsys, Inc. Gain and dither capacitor calibration in pipeline analog-to-digital converter stages
US8773294B2 (en) * 2012-06-07 2014-07-08 Analog Devices, Inc. Background techniques for comparator calibration
US8736471B2 (en) 2012-08-22 2014-05-27 Hittite Microwave Corporation Methods and apparatus for calibrating stages in pipeline analog-to-digital converters
US9503059B1 (en) * 2015-09-30 2016-11-22 Integrated Device Technology, Inc. Integrated circuit devices having oscillator circuits therein that support fixed frequency generation over process-voltage-temperature (PVT) variations
US9692436B2 (en) * 2015-10-22 2017-06-27 Multiphy Ltd. Background calibration of sampler timing errors in flash analog to digital converters
US11563442B2 (en) * 2020-08-07 2023-01-24 Analog Devices International Unlimited Company Calibration of continuous-time residue generation systems for analog-to-digital converters

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2092666A1 (en) 1993-04-27 1994-10-28 William Martin Snelgrove Self-calibration technique for high-speed two-stage and pipelined multi-stage analog-to-digital converters
US5416485A (en) 1993-12-20 1995-05-16 Lee; Hae-Seung Analog-to-digital conversion circuit with improved differential linearity
US5499027A (en) * 1994-02-24 1996-03-12 Massachusetts Institute Of Technology Digitally self-calibrating pipeline analog-to-digital converter
US5990814A (en) * 1997-09-05 1999-11-23 Cirrus Logic, Inc. Method and circuit for calibration of flash analog to digital converters
US5861828A (en) * 1997-10-14 1999-01-19 National Semiconductor Corporation Apparatus and method for monotonic digital calibration of a pipeline analog-to-digital converter
US6633249B1 (en) * 1999-08-06 2003-10-14 Insyte Innovative Systems & Technology Corporation Low power, scalable analog to digital converter having circuit for compensating system non-linearity
DE10007408A1 (de) * 2000-02-18 2001-09-06 Infineon Technologies Ag Analog/Digital-Wandlerschaltungsanordnung
US6411233B1 (en) * 2000-06-06 2002-06-25 Marvell International Ltd Method and apparatus for direct RAM analog-to-digital converter calibration
SE518900C2 (sv) * 2001-03-26 2002-12-03 Ericsson Telefon Ab L M Metod och anordning för kalibrering av A/D-omvandlare med bubbelhantering
US6894631B1 (en) * 2004-03-31 2005-05-17 Analog Devices, Inc. Pipeline ADC digital dithering for increased digital calibration resolution

Also Published As

Publication number Publication date
SE520277C2 (sv) 2003-06-17
WO2002069501A1 (en) 2002-09-06
EP1366571A1 (en) 2003-12-03
US20040075599A1 (en) 2004-04-22
DE60204433D1 (de) 2005-07-07
EP1366571B1 (en) 2005-06-01
DE60204433T2 (de) 2005-11-03
ES2243698T3 (es) 2005-12-01
ATE297071T1 (de) 2005-06-15
SE0100663D0 (sv) 2001-02-27
US7405681B2 (en) 2008-07-29

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