GB9910116D0 - A method and apparatus for testing an analogue component - Google Patents

A method and apparatus for testing an analogue component

Info

Publication number
GB9910116D0
GB9910116D0 GB9910116A GB9910116A GB9910116D0 GB 9910116 D0 GB9910116 D0 GB 9910116D0 GB 9910116 A GB9910116 A GB 9910116A GB 9910116 A GB9910116 A GB 9910116A GB 9910116 D0 GB9910116 D0 GB 9910116D0
Authority
GB
United Kingdom
Prior art keywords
testing
analogue
analogue component
component
characteristic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB9910116A
Other versions
GB2349523A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SGS THOMSON MICROELECTRONICS
Original Assignee
SGS THOMSON MICROELECTRONICS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS THOMSON MICROELECTRONICS filed Critical SGS THOMSON MICROELECTRONICS
Priority to GB9910116A priority Critical patent/GB2349523A/en
Publication of GB9910116D0 publication Critical patent/GB9910116D0/en
Publication of GB2349523A publication Critical patent/GB2349523A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/1085—Measuring or testing using domain transforms, e.g. Fast Fourier Transform
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

A method of testing at least one characteristic of an analogue component such as as an analogue to digital converter or operational amplifier, includes, the steps of applying white noise to the input of the analogue component 42 and analysing the output of the analogue component to determine the characteristic.
GB9910116A 1999-04-30 1999-04-30 Testing an analogue component Withdrawn GB2349523A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9910116A GB2349523A (en) 1999-04-30 1999-04-30 Testing an analogue component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9910116A GB2349523A (en) 1999-04-30 1999-04-30 Testing an analogue component

Publications (2)

Publication Number Publication Date
GB9910116D0 true GB9910116D0 (en) 1999-06-30
GB2349523A GB2349523A (en) 2000-11-01

Family

ID=10852652

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9910116A Withdrawn GB2349523A (en) 1999-04-30 1999-04-30 Testing an analogue component

Country Status (1)

Country Link
GB (1) GB2349523A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007007357B4 (en) * 2007-02-14 2018-06-21 Infineon Technologies Ag Integrated circuit arrangement
US8559885B2 (en) * 2011-04-14 2013-10-15 Accel Telecom Ltd. System and method for measurement of parameters of radio-frequency transmission devices

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD138828A1 (en) * 1978-09-08 1979-11-21 Anke Luedge METHOD FOR TESTING AD-TRANSFORMERS
JP2617945B2 (en) * 1987-08-14 1997-06-11 矢吉 肥後 Non-destructive inspection method for joints
JPH112643A (en) * 1997-06-12 1999-01-06 Denso Corp Equipment for inspecting frequency characteristic of acceleration sensor

Also Published As

Publication number Publication date
GB2349523A (en) 2000-11-01

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)