RU2578252C2 - Пиксель детектора со счетом фотонов, который имеет анод, содержащий два или более поочередно выбираемых и раздельных под-анода - Google Patents
Пиксель детектора со счетом фотонов, который имеет анод, содержащий два или более поочередно выбираемых и раздельных под-анода Download PDFInfo
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- RU2578252C2 RU2578252C2 RU2013138461/28A RU2013138461A RU2578252C2 RU 2578252 C2 RU2578252 C2 RU 2578252C2 RU 2013138461/28 A RU2013138461/28 A RU 2013138461/28A RU 2013138461 A RU2013138461 A RU 2013138461A RU 2578252 C2 RU2578252 C2 RU 2578252C2
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- 230000005855 radiation Effects 0.000 claims abstract description 35
- 238000006243 chemical reaction Methods 0.000 claims abstract description 20
- 238000003384 imaging method Methods 0.000 claims abstract description 16
- 229910000679 solder Inorganic materials 0.000 claims abstract description 4
- 238000012545 processing Methods 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 13
- 238000001465 metallisation Methods 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 12
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 claims description 5
- 239000011159 matrix material Substances 0.000 claims description 5
- 230000004044 response Effects 0.000 claims description 5
- 238000012800 visualization Methods 0.000 claims description 5
- CEKJAYFBQARQNG-UHFFFAOYSA-N cadmium zinc Chemical compound [Zn].[Cd] CEKJAYFBQARQNG-UHFFFAOYSA-N 0.000 claims description 2
- 238000007794 visualization technique Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 2
- 239000011248 coating agent Substances 0.000 abstract 2
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- 238000002591 computed tomography Methods 0.000 description 6
- 238000004891 communication Methods 0.000 description 4
- 230000000295 complement effect Effects 0.000 description 4
- 230000003595 spectral effect Effects 0.000 description 4
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- 229910004611 CdZnTe Inorganic materials 0.000 description 2
- 241001417495 Serranidae Species 0.000 description 2
- 230000002730 additional effect Effects 0.000 description 2
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- 238000005259 measurement Methods 0.000 description 2
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- 230000008569 process Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 241001465754 Metazoa Species 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 210000000988 bone and bone Anatomy 0.000 description 1
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 description 1
- 238000000701 chemical imaging Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
- A61B6/4233—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using matrix detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/56—Switching-on; Switching-off
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- Measurement Of Radiation (AREA)
- Signal Processing (AREA)
- Multimedia (AREA)
- Engineering & Computer Science (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161433336P | 2011-01-17 | 2011-01-17 | |
| US61/433,336 | 2011-01-17 | ||
| PCT/IB2012/050105 WO2012098477A2 (en) | 2011-01-17 | 2012-01-10 | Photon counting detector pixel having an anode including two or more alternatively selectable and separate sub-anodes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| RU2013138461A RU2013138461A (ru) | 2015-02-27 |
| RU2578252C2 true RU2578252C2 (ru) | 2016-03-27 |
Family
ID=45540921
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| RU2013138461/28A RU2578252C2 (ru) | 2011-01-17 | 2012-01-10 | Пиксель детектора со счетом фотонов, который имеет анод, содержащий два или более поочередно выбираемых и раздельных под-анода |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9318518B2 (enExample) |
| EP (1) | EP2666035B1 (enExample) |
| JP (1) | JP2014508567A (enExample) |
| CN (1) | CN103329007B (enExample) |
| RU (1) | RU2578252C2 (enExample) |
| WO (1) | WO2012098477A2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2932299B1 (en) * | 2012-12-14 | 2019-03-27 | Koninklijke Philips N.V. | Detector unit with pulse shaper |
| WO2015087663A1 (ja) * | 2013-12-09 | 2015-06-18 | 浜松ホトニクス株式会社 | 二次元フォトンカウンティング素子 |
| US10117628B2 (en) * | 2014-10-01 | 2018-11-06 | Toshiba Medical Systems Corporation | Photon counting apparatus |
| WO2016066850A1 (en) * | 2014-10-31 | 2016-05-06 | Koninklijke Philips N.V. | Sensor device and imaging system for detecting radiation signals |
| CN108449982B (zh) * | 2015-08-27 | 2020-12-15 | 深圳帧观德芯科技有限公司 | 利用能够分辨光子能量的检测器的x射线成像 |
| WO2017196713A1 (en) * | 2016-05-10 | 2017-11-16 | Carestream Health, Inc. | Flexible substrate chip-on flex repair |
| EP3658033A4 (en) * | 2017-07-26 | 2021-02-24 | Shenzhen Xpectvision Technology Co., Ltd. | SYSTEM WITH A SPATIAL EXTENSION X-RAY SOURCE FOR X-RAY IMAGING |
| US10324202B1 (en) * | 2018-01-02 | 2019-06-18 | General Electric Company | Systems and methods for collecting radiation detection |
| EP3978959B1 (en) * | 2020-09-30 | 2024-07-17 | Detection Technology Oyj | Detector pixels in floating or detection modes |
| US11953452B2 (en) * | 2021-03-01 | 2024-04-09 | Redlen Technologies, Inc. | Ionizing radiation detector with reduced street width and improved count rate stability |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5677539A (en) * | 1995-10-13 | 1997-10-14 | Digirad | Semiconductor radiation detector with enhanced charge collection |
| RU2339973C2 (ru) * | 2002-01-21 | 2008-11-27 | Юропиэн Организэйшн Фор Нуклеа Ресеч | Обнаружение заряда или частицы |
| WO2010073189A1 (en) * | 2008-12-22 | 2010-07-01 | Koninklijke Philips Electronics N.V. | Radiation detector with improved charge collection and minimized leakage currents |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5461226A (en) * | 1993-10-29 | 1995-10-24 | Loral Infrared & Imaging Systems, Inc. | Photon counting ultraviolet spatial image sensor with microchannel photomultiplying plates |
| CN2273016Y (zh) * | 1995-09-22 | 1998-01-21 | 清华大学 | X、γ辐射成象正比计数器阵列探测装置 |
| US6037595A (en) | 1995-10-13 | 2000-03-14 | Digirad Corporation | Radiation detector with shielding electrode |
| US6034373A (en) | 1997-12-11 | 2000-03-07 | Imrad Imaging Systems Ltd. | Semiconductor radiation detector with reduced surface effects |
| JP3900992B2 (ja) * | 2002-04-02 | 2007-04-04 | 株式会社日立製作所 | 放射線検出器及び放射線検査装置 |
| US7170049B2 (en) | 2003-12-30 | 2007-01-30 | Dxray, Inc. | Pixelated cadmium zinc telluride based photon counting mode detector |
| US7916836B2 (en) | 2007-09-26 | 2011-03-29 | General Electric Company | Method and apparatus for flexibly binning energy discriminating data |
| US20100252744A1 (en) * | 2009-04-06 | 2010-10-07 | Koninklijke Philips Electronics N.V. | Radiation detector with a plurality of electrode systems |
| US9000385B2 (en) * | 2009-12-30 | 2015-04-07 | General Electric Company | Method and apparatus for acquiring radiation data |
-
2012
- 2012-01-10 US US13/979,707 patent/US9318518B2/en active Active
- 2012-01-10 WO PCT/IB2012/050105 patent/WO2012098477A2/en not_active Ceased
- 2012-01-10 EP EP12701380.3A patent/EP2666035B1/en active Active
- 2012-01-10 JP JP2013548914A patent/JP2014508567A/ja not_active Ceased
- 2012-01-10 RU RU2013138461/28A patent/RU2578252C2/ru not_active IP Right Cessation
- 2012-01-10 CN CN201280005817.7A patent/CN103329007B/zh active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5677539A (en) * | 1995-10-13 | 1997-10-14 | Digirad | Semiconductor radiation detector with enhanced charge collection |
| RU2339973C2 (ru) * | 2002-01-21 | 2008-11-27 | Юропиэн Организэйшн Фор Нуклеа Ресеч | Обнаружение заряда или частицы |
| WO2010073189A1 (en) * | 2008-12-22 | 2010-07-01 | Koninklijke Philips Electronics N.V. | Radiation detector with improved charge collection and minimized leakage currents |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2666035B1 (en) | 2015-10-21 |
| RU2013138461A (ru) | 2015-02-27 |
| JP2014508567A (ja) | 2014-04-10 |
| US9318518B2 (en) | 2016-04-19 |
| WO2012098477A3 (en) | 2012-11-15 |
| CN103329007B (zh) | 2015-11-25 |
| US20130287172A1 (en) | 2013-10-31 |
| CN103329007A (zh) | 2013-09-25 |
| WO2012098477A2 (en) | 2012-07-26 |
| EP2666035A2 (en) | 2013-11-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | The patent is invalid due to non-payment of fees |
Effective date: 20180111 |