JP2014508567A - 2つ又はこれ以上の代替的に選択可能で別々のサブ陽極を含む陽極を持つ光子計数検出器ピクセル - Google Patents
2つ又はこれ以上の代替的に選択可能で別々のサブ陽極を含む陽極を持つ光子計数検出器ピクセル Download PDFInfo
- Publication number
- JP2014508567A JP2014508567A JP2013548914A JP2013548914A JP2014508567A JP 2014508567 A JP2014508567 A JP 2014508567A JP 2013548914 A JP2013548914 A JP 2013548914A JP 2013548914 A JP2013548914 A JP 2013548914A JP 2014508567 A JP2014508567 A JP 2014508567A
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- JP
- Japan
- Prior art keywords
- sub
- anode
- imaging system
- anodes
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
- A61B6/4233—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using matrix detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/56—Switching-on; Switching-off
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- Measurement Of Radiation (AREA)
- Signal Processing (AREA)
- Multimedia (AREA)
- Engineering & Computer Science (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161433336P | 2011-01-17 | 2011-01-17 | |
| US61/433,336 | 2011-01-17 | ||
| PCT/IB2012/050105 WO2012098477A2 (en) | 2011-01-17 | 2012-01-10 | Photon counting detector pixel having an anode including two or more alternatively selectable and separate sub-anodes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2014508567A true JP2014508567A (ja) | 2014-04-10 |
| JP2014508567A5 JP2014508567A5 (enExample) | 2017-01-19 |
Family
ID=45540921
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013548914A Ceased JP2014508567A (ja) | 2011-01-17 | 2012-01-10 | 2つ又はこれ以上の代替的に選択可能で別々のサブ陽極を含む陽極を持つ光子計数検出器ピクセル |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9318518B2 (enExample) |
| EP (1) | EP2666035B1 (enExample) |
| JP (1) | JP2014508567A (enExample) |
| CN (1) | CN103329007B (enExample) |
| RU (1) | RU2578252C2 (enExample) |
| WO (1) | WO2012098477A2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2932299B1 (en) * | 2012-12-14 | 2019-03-27 | Koninklijke Philips N.V. | Detector unit with pulse shaper |
| WO2015087663A1 (ja) * | 2013-12-09 | 2015-06-18 | 浜松ホトニクス株式会社 | 二次元フォトンカウンティング素子 |
| US10117628B2 (en) * | 2014-10-01 | 2018-11-06 | Toshiba Medical Systems Corporation | Photon counting apparatus |
| WO2016066850A1 (en) * | 2014-10-31 | 2016-05-06 | Koninklijke Philips N.V. | Sensor device and imaging system for detecting radiation signals |
| CN108449982B (zh) * | 2015-08-27 | 2020-12-15 | 深圳帧观德芯科技有限公司 | 利用能够分辨光子能量的检测器的x射线成像 |
| WO2017196713A1 (en) * | 2016-05-10 | 2017-11-16 | Carestream Health, Inc. | Flexible substrate chip-on flex repair |
| EP3658033A4 (en) * | 2017-07-26 | 2021-02-24 | Shenzhen Xpectvision Technology Co., Ltd. | SYSTEM WITH A SPATIAL EXTENSION X-RAY SOURCE FOR X-RAY IMAGING |
| US10324202B1 (en) * | 2018-01-02 | 2019-06-18 | General Electric Company | Systems and methods for collecting radiation detection |
| EP3978959B1 (en) * | 2020-09-30 | 2024-07-17 | Detection Technology Oyj | Detector pixels in floating or detection modes |
| US11953452B2 (en) * | 2021-03-01 | 2024-04-09 | Redlen Technologies, Inc. | Ionizing radiation detector with reduced street width and improved count rate stability |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10512372A (ja) * | 1995-10-13 | 1998-11-24 | ディジラッド,インコーポレーテッド | 電荷収集能を高めた半導体放射線検出器 |
| JP2003294845A (ja) * | 2002-04-02 | 2003-10-15 | Hitachi Ltd | 放射線検出器及び放射線検査装置 |
| JP2009078143A (ja) * | 2007-09-26 | 2009-04-16 | General Electric Co <Ge> | エネルギ識別データを自在にまとめる方法及び装置 |
| WO2010073189A1 (en) * | 2008-12-22 | 2010-07-01 | Koninklijke Philips Electronics N.V. | Radiation detector with improved charge collection and minimized leakage currents |
| US20100252744A1 (en) * | 2009-04-06 | 2010-10-07 | Koninklijke Philips Electronics N.V. | Radiation detector with a plurality of electrode systems |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5461226A (en) * | 1993-10-29 | 1995-10-24 | Loral Infrared & Imaging Systems, Inc. | Photon counting ultraviolet spatial image sensor with microchannel photomultiplying plates |
| CN2273016Y (zh) * | 1995-09-22 | 1998-01-21 | 清华大学 | X、γ辐射成象正比计数器阵列探测装置 |
| US6037595A (en) | 1995-10-13 | 2000-03-14 | Digirad Corporation | Radiation detector with shielding electrode |
| US6034373A (en) | 1997-12-11 | 2000-03-07 | Imrad Imaging Systems Ltd. | Semiconductor radiation detector with reduced surface effects |
| GB0201260D0 (en) * | 2002-01-21 | 2002-03-06 | Europ Org For Nuclear Research | A sensing and imaging device |
| US7170049B2 (en) | 2003-12-30 | 2007-01-30 | Dxray, Inc. | Pixelated cadmium zinc telluride based photon counting mode detector |
| US9000385B2 (en) * | 2009-12-30 | 2015-04-07 | General Electric Company | Method and apparatus for acquiring radiation data |
-
2012
- 2012-01-10 US US13/979,707 patent/US9318518B2/en active Active
- 2012-01-10 WO PCT/IB2012/050105 patent/WO2012098477A2/en not_active Ceased
- 2012-01-10 EP EP12701380.3A patent/EP2666035B1/en active Active
- 2012-01-10 JP JP2013548914A patent/JP2014508567A/ja not_active Ceased
- 2012-01-10 RU RU2013138461/28A patent/RU2578252C2/ru not_active IP Right Cessation
- 2012-01-10 CN CN201280005817.7A patent/CN103329007B/zh active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10512372A (ja) * | 1995-10-13 | 1998-11-24 | ディジラッド,インコーポレーテッド | 電荷収集能を高めた半導体放射線検出器 |
| JP2003294845A (ja) * | 2002-04-02 | 2003-10-15 | Hitachi Ltd | 放射線検出器及び放射線検査装置 |
| JP2009078143A (ja) * | 2007-09-26 | 2009-04-16 | General Electric Co <Ge> | エネルギ識別データを自在にまとめる方法及び装置 |
| WO2010073189A1 (en) * | 2008-12-22 | 2010-07-01 | Koninklijke Philips Electronics N.V. | Radiation detector with improved charge collection and minimized leakage currents |
| US20100252744A1 (en) * | 2009-04-06 | 2010-10-07 | Koninklijke Philips Electronics N.V. | Radiation detector with a plurality of electrode systems |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2666035B1 (en) | 2015-10-21 |
| RU2013138461A (ru) | 2015-02-27 |
| US9318518B2 (en) | 2016-04-19 |
| WO2012098477A3 (en) | 2012-11-15 |
| CN103329007B (zh) | 2015-11-25 |
| RU2578252C2 (ru) | 2016-03-27 |
| US20130287172A1 (en) | 2013-10-31 |
| CN103329007A (zh) | 2013-09-25 |
| WO2012098477A2 (en) | 2012-07-26 |
| EP2666035A2 (en) | 2013-11-27 |
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