PT878091E - Sensor de imagens a cores para uma exposicao de curta duracao - Google Patents

Sensor de imagens a cores para uma exposicao de curta duracao

Info

Publication number
PT878091E
PT878091E PT97948835T PT97948835T PT878091E PT 878091 E PT878091 E PT 878091E PT 97948835 T PT97948835 T PT 97948835T PT 97948835 T PT97948835 T PT 97948835T PT 878091 E PT878091 E PT 878091E
Authority
PT
Portugal
Prior art keywords
measured values
pixel
integrator
median
storage device
Prior art date
Application number
PT97948835T
Other languages
English (en)
Inventor
Markus Bohm
Tarek Lule
Peter Rieve
Original Assignee
Markus Bohm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Markus Bohm filed Critical Markus Bohm
Publication of PT878091E publication Critical patent/PT878091E/pt

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14645—Colour imagers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/447—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by preserving the colour pattern with or without loss of information
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
    • H01L27/14614—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor having a special gate structure
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N2209/00—Details of colour television systems
    • H04N2209/04—Picture signal generators
    • H04N2209/041—Picture signal generators using solid-state devices
    • H04N2209/042—Picture signal generators using solid-state devices having a single pick-up sensor
    • H04N2209/043—Picture signal generators using solid-state devices having a single pick-up sensor using an alternating colour separation filter, e.g. colour wheel or colour LCD
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11—Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
PT97948835T 1996-10-31 1997-10-30 Sensor de imagens a cores para uma exposicao de curta duracao PT878091E (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19643972 1996-10-31

Publications (1)

Publication Number Publication Date
PT878091E true PT878091E (pt) 2003-01-31

Family

ID=7809709

Family Applications (1)

Application Number Title Priority Date Filing Date
PT97948835T PT878091E (pt) 1996-10-31 1997-10-30 Sensor de imagens a cores para uma exposicao de curta duracao

Country Status (10)

Country Link
US (1) US6518558B1 (pt)
EP (1) EP0878091B1 (pt)
JP (1) JP2000501919A (pt)
CN (1) CN1209930A (pt)
AT (1) ATE224122T1 (pt)
DE (1) DE59708194D1 (pt)
DK (1) DK0878091T3 (pt)
ES (1) ES2184140T3 (pt)
PT (1) PT878091E (pt)
WO (1) WO1998019455A1 (pt)

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US6606120B1 (en) * 1998-04-24 2003-08-12 Foveon, Inc. Multiple storage node full color active pixel sensors
US6410899B1 (en) 1998-06-17 2002-06-25 Foveon, Inc. Active pixel sensor with bootstrap amplification and reduced leakage during readout
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US6563540B2 (en) * 1999-02-26 2003-05-13 Intel Corporation Light sensor with increased dynamic range
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US6727521B2 (en) 2000-09-25 2004-04-27 Foveon, Inc. Vertical color filter detector group and array
US6697114B1 (en) 1999-08-13 2004-02-24 Foveon, Inc. Triple slope pixel sensor and arry
US6809768B1 (en) 2000-02-14 2004-10-26 Foveon, Inc. Double slope pixel sensor and array
US6882367B1 (en) 2000-02-29 2005-04-19 Foveon, Inc. High-sensitivity storage pixel sensor having auto-exposure detection
FR2815806B1 (fr) * 2000-10-23 2002-11-29 Commissariat Energie Atomique Lecteur pour element de detection de rayonnements electromagnetiques, capteur, et procede de lecture correspondant
DE10052863A1 (de) * 2000-10-24 2002-04-25 Christian Pilgrim Endoskopisches Instrument zur Anwendung in Hohlräumen
JP3939092B2 (ja) * 2000-12-28 2007-06-27 セイコーインスツル株式会社 光電変換装置
US6930336B1 (en) 2001-06-18 2005-08-16 Foveon, Inc. Vertical-color-filter detector group with trench isolation
US6960757B2 (en) 2001-06-18 2005-11-01 Foveon, Inc. Simplified wiring schemes for vertical color filter pixel sensors
US6864557B2 (en) 2001-06-18 2005-03-08 Foveon, Inc. Vertical color filter detector group and array
US6998660B2 (en) 2002-03-20 2006-02-14 Foveon, Inc. Vertical color filter sensor group array that emulates a pattern of single-layer sensors with efficient use of each sensor group's sensors
US6704046B2 (en) * 2002-04-17 2004-03-09 Motorola, Inc. Digital pixel image sensor with independent color channel reference signals
US7164444B1 (en) 2002-05-17 2007-01-16 Foveon, Inc. Vertical color filter detector group with highlight detector
US20060006482A1 (en) * 2002-07-16 2006-01-12 Stmicroelectronics N.V. Tfa image sensor with stability-optimized photodiode
US7170041B2 (en) * 2002-07-17 2007-01-30 Xerox Corporation Pixel circuitry for imaging system
US6903394B2 (en) 2002-11-27 2005-06-07 Micron Technology, Inc. CMOS imager with improved color response
US7339216B1 (en) 2003-01-31 2008-03-04 Foveon, Inc. Vertical color filter sensor group array with full-resolution top layer and lower-resolution lower layer
US7586074B2 (en) * 2003-02-17 2009-09-08 Raytheon Company Multi-mode high capacity dual integration direct injection detector input circuit
US7821555B2 (en) * 2003-04-21 2010-10-26 Micron Technology, Inc. Multi path power for CMOS imagers
US20050212936A1 (en) * 2004-03-25 2005-09-29 Eastman Kodak Company Extended dynamic range image sensor with fixed pattern noise reduction
US7491927B2 (en) * 2004-06-24 2009-02-17 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Color sensing circuit employing charge storage device
DE102005040901B8 (de) * 2004-08-31 2014-08-14 Omron Corporation Sensorsystem
US7911518B2 (en) * 2005-02-01 2011-03-22 Samsung Electronics Co., Ltd. Variable exposure for color image sensor
US7652699B2 (en) * 2005-08-30 2010-01-26 Motorola, Inc. Color image sensor with tunable color filter
JP2007135106A (ja) * 2005-11-11 2007-05-31 Matsushita Electric Ind Co Ltd 光電流増幅回路、及び光ピックアップ装置
US7602430B1 (en) 2007-04-18 2009-10-13 Foveon, Inc. High-gain multicolor pixel sensor with reset noise cancellation
TWI380260B (en) * 2007-12-06 2012-12-21 Au Optronics Corp Ambient light detection system and related method
US7745773B1 (en) 2008-04-11 2010-06-29 Foveon, Inc. Multi-color CMOS pixel sensor with shared row wiring and dual output lines
FR2937150B1 (fr) * 2008-10-15 2010-12-24 Soc Fr Detecteurs Infrarouges Sofradir Dispositif et procede pour realiser la lecture de courants electriques resultant d'un detecteur de signaux electromagnetiques
US8405750B2 (en) * 2009-06-08 2013-03-26 Aptina Imaging Corporation Image sensors and image reconstruction methods for capturing high dynamic range images
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US9172889B2 (en) 2012-02-09 2015-10-27 Semiconductor Components Industries, Llc Imaging systems and methods for generating auto-exposed high-dynamic-range images
US9007488B2 (en) 2012-03-08 2015-04-14 Semiconductor Components Industries, Llc Systems and methods for generating interpolated high-dynamic-range images
US9766126B2 (en) 2013-07-12 2017-09-19 Zyomed Corp. Dynamic radially controlled light input to a noninvasive analyzer apparatus and method of use thereof
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DE102016212765A1 (de) * 2016-07-13 2018-01-18 Robert Bosch Gmbh Pixeleinheit für einen Bildsensor, Bildsensor, Verfahren zum Sensieren eines Lichtsignals, Verfahren zum Ansteuern einer Pixeleinheit und Verfahren zum Generieren eines Bildes unter Verwendung einer Pixeleinheit
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IT202000018760A1 (it) * 2020-07-31 2022-01-31 Milano Politecnico Dispositivo sensore di radiazione elettromagnetica a doppio fotodiodo
IT202000018709A1 (it) * 2020-07-31 2022-01-31 Milano Politecnico Sistema di rivelazione dello spettro di una radiazione elettromagnetica
WO2023092503A1 (zh) * 2021-11-26 2023-06-01 京东方科技集团股份有限公司 光检测模组、光检测方法和显示装置

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Also Published As

Publication number Publication date
EP0878091B1 (de) 2002-09-11
DK0878091T3 (da) 2003-01-20
JP2000501919A (ja) 2000-02-15
WO1998019455A1 (de) 1998-05-07
US6518558B1 (en) 2003-02-11
EP0878091A1 (de) 1998-11-18
DE59708194D1 (de) 2002-10-17
CN1209930A (zh) 1999-03-03
ATE224122T1 (de) 2002-09-15
ES2184140T3 (es) 2003-04-01

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