PT3111191T - Método e dispositivo para determinação de um efeito de barreira de um revestimento em um substrato - Google Patents

Método e dispositivo para determinação de um efeito de barreira de um revestimento em um substrato

Info

Publication number
PT3111191T
PT3111191T PT157778861T PT15777886T PT3111191T PT 3111191 T PT3111191 T PT 3111191T PT 157778861 T PT157778861 T PT 157778861T PT 15777886 T PT15777886 T PT 15777886T PT 3111191 T PT3111191 T PT 3111191T
Authority
PT
Portugal
Prior art keywords
coating
substrate
determining
barrier effect
barrier
Prior art date
Application number
PT157778861T
Other languages
English (en)
Inventor
Neuffer Andreas
Original Assignee
Zeiss Carl Vision Int Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeiss Carl Vision Int Gmbh filed Critical Zeiss Carl Vision Int Gmbh
Publication of PT3111191T publication Critical patent/PT3111191T/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00Investigating materials by mechanical methods
    • G01N19/06Investigating by removing material, e.g. spark-testing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process
    • H01L22/12Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N13/00Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface, boundary, or diffusion effects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Coating Apparatus (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Surface Treatment Of Glass (AREA)
PT157778861T 2014-09-26 2015-09-18 Método e dispositivo para determinação de um efeito de barreira de um revestimento em um substrato PT3111191T (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102014219496.2A DE102014219496B3 (de) 2014-09-26 2014-09-26 Verfahren und Vorrichtung zur Bestimmung einer Barrierewirkung einer Beschichtung auf einem Substrat

Publications (1)

Publication Number Publication Date
PT3111191T true PT3111191T (pt) 2017-09-04

Family

ID=54288753

Family Applications (1)

Application Number Title Priority Date Filing Date
PT157778861T PT3111191T (pt) 2014-09-26 2015-09-18 Método e dispositivo para determinação de um efeito de barreira de um revestimento em um substrato

Country Status (8)

Country Link
US (1) US9778170B2 (pt)
EP (1) EP3111191B1 (pt)
CN (1) CN106415805B (pt)
DE (1) DE102014219496B3 (pt)
ES (1) ES2643737T3 (pt)
MX (1) MX356165B (pt)
PT (1) PT3111191T (pt)
WO (1) WO2016046085A1 (pt)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108845427A (zh) * 2018-07-03 2018-11-20 张家港康得新光电材料有限公司 一种裸眼3d器件的制备方法及系统
US20210088867A1 (en) * 2019-09-20 2021-03-25 Kinestral Technologies, Inc. Quality control of an electrochromic device
CN115452712B (zh) * 2022-09-30 2024-05-31 西安交通大学 一种涂层刮削力旋转刮削测试信号分析方法、系统、介质及设备

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5729323A (en) * 1994-07-29 1998-03-17 Baush & Lomb Incorporated Light-absorbing and anti-reflective coating for sunglasses
DE19519975C1 (de) * 1995-05-24 1996-10-31 Fraunhofer Ges Forschung Verfahren zur Prüfung der Feuchtedurchlässigkeit einer dünnen Schicht
DE10012446B4 (de) 2000-03-15 2007-06-14 Tetra Laval Holdings & Finance S.A. Verfahren zum Messen der Gasdurchlässigkeit einer Beschichtung auf einer Kunststoffwandung und Vorrichtung zur Durchführung des Verfahrens
KR20080061889A (ko) * 2006-12-28 2008-07-03 제일모직주식회사 플라스틱 수지의 내스크래치성 평가 방법
JP2008266578A (ja) * 2007-03-23 2008-11-06 Sanyo Electric Co Ltd 光学ポリマー材料及び光学部品
DE102010048088A1 (de) * 2010-10-01 2012-04-05 Carl Zeiss Vision Gmbh Optische Linse mit kratzfester Entspiegelungsschicht
DE102013104846B3 (de) * 2013-05-10 2014-06-05 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Bestimmung der Feuchtedurchlässigkeit einer Beschichtung

Also Published As

Publication number Publication date
CN106415805A (zh) 2017-02-15
ES2643737T3 (es) 2017-11-24
US9778170B2 (en) 2017-10-03
WO2016046085A1 (de) 2016-03-31
MX2016013755A (es) 2017-05-04
CN106415805B (zh) 2019-07-16
US20170199112A1 (en) 2017-07-13
EP3111191A1 (de) 2017-01-04
DE102014219496B3 (de) 2016-01-21
EP3111191B1 (de) 2017-07-19
MX356165B (es) 2018-05-17

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