PL1838893T3 - Cienkie warstwy wytwarzane techniką osadzania z fazy gazowej - Google Patents
Cienkie warstwy wytwarzane techniką osadzania z fazy gazowejInfo
- Publication number
- PL1838893T3 PL1838893T3 PL05822680T PL05822680T PL1838893T3 PL 1838893 T3 PL1838893 T3 PL 1838893T3 PL 05822680 T PL05822680 T PL 05822680T PL 05822680 T PL05822680 T PL 05822680T PL 1838893 T3 PL1838893 T3 PL 1838893T3
- Authority
- PL
- Poland
- Prior art keywords
- gas phase
- thin films
- deposition technique
- phase deposition
- films prepared
- Prior art date
Links
- 238000000151 deposition Methods 0.000 title 1
- 239000010409 thin film Substances 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/54—Organic compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/36—Successively applying liquids or other fluent materials, e.g. without intermediate treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/60—Deposition of organic layers from vapour phase
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D5/00—Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45553—Atomic layer deposition [ALD] characterized by the use of precursors specially adapted for ALD
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45555—Atomic layer deposition [ALD] applied in non-semiconductor technology
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/18—Processes for applying liquids or other fluent materials performed by dipping
- B05D1/185—Processes for applying liquids or other fluent materials performed by dipping applying monomolecular layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/50—Multilayers
- B05D7/52—Two layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/50—Multilayers
- B05D7/56—Three layers or more
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20045674A NO20045674D0 (no) | 2004-12-28 | 2004-12-28 | Thin films prepared with gas phase deposition technique |
PCT/NO2005/000488 WO2006071126A1 (en) | 2004-12-28 | 2005-12-28 | Thin films prepared with gas phase deposition technique |
EP05822680.4A EP1838893B1 (en) | 2004-12-28 | 2005-12-28 | Thin films prepared with gas phase deposition technique |
Publications (1)
Publication Number | Publication Date |
---|---|
PL1838893T3 true PL1838893T3 (pl) | 2019-07-31 |
Family
ID=35209724
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL05822680T PL1838893T3 (pl) | 2004-12-28 | 2005-12-28 | Cienkie warstwy wytwarzane techniką osadzania z fazy gazowej |
Country Status (8)
Country | Link |
---|---|
US (1) | US8124179B2 (pl) |
EP (1) | EP1838893B1 (pl) |
KR (1) | KR101322095B1 (pl) |
DK (1) | DK1838893T3 (pl) |
ES (1) | ES2730832T3 (pl) |
NO (1) | NO20045674D0 (pl) |
PL (1) | PL1838893T3 (pl) |
WO (1) | WO2006071126A1 (pl) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ME01881B (me) | 2004-01-22 | 2014-12-20 | Univ Miami | Topijske formulacije koenzima q10 i postupci upotrebe |
EP2038072A1 (en) * | 2006-06-19 | 2009-03-25 | Universitetet I Oslo | Activation of surfaces through gas phase reactions |
JP5717967B2 (ja) | 2006-11-13 | 2015-05-13 | ザ・リージエンツ・オブ・ザ・ユニバーシティ・オブ・コロラド | 有機又は有機−無機ポリマーを製造するための分子層堆積法 |
WO2008111850A2 (en) * | 2007-03-15 | 2008-09-18 | Universitetet I Oslo | Synthesis of molecular metalorganic compounds |
EP2136787B1 (en) | 2007-03-22 | 2019-08-21 | Berg LLC | Topical formulations having enhanced bioavailability |
JP5220106B2 (ja) | 2007-06-22 | 2013-06-26 | ザ・リージエンツ・オブ・ザ・ユニバーシティ・オブ・コロラド | 原子層堆積法及び分子層堆積法を用いて製造された有機電子デバイス用の保護被膜 |
WO2009001220A2 (en) * | 2007-06-26 | 2008-12-31 | Universitetet I Oslo | Functionalization of microscopy probe tips |
US7858144B2 (en) * | 2007-09-26 | 2010-12-28 | Eastman Kodak Company | Process for depositing organic materials |
USRE48853E1 (en) | 2007-12-28 | 2021-12-14 | Universitetet I Oslo | Formation of a lithium comprising structure on a substrate by ALD |
EP3015104A1 (en) | 2008-04-11 | 2016-05-04 | Berg LLC | Methods and use of inducing apoptosis in cancer cells |
DE102008054052A1 (de) * | 2008-10-30 | 2010-05-06 | Osram Opto Semiconductors Gmbh | Organisches, strahlungsemittierendes Bauelement und Verfahren zur Herstellung eines solchen |
EA034552B1 (ru) | 2009-05-11 | 2020-02-19 | БЕРГ ЭлЭлСи | Способ лечения или предотвращения прогрессирования онкологических заболеваний |
PE20130045A1 (es) | 2010-03-12 | 2013-01-28 | Berg Pharma Llc | FORMULACIONES INTRAVENOSAS DE COENZIMA Q10 (CoQ10) Y METODOS DE USO DE LAS MISMAS |
KR101489161B1 (ko) * | 2010-07-30 | 2015-02-06 | 주식회사 잉크테크 | 투명 도전막의 제조방법 및 이에 의해 제조된 투명 도전막 |
SG10201601916TA (en) * | 2011-03-28 | 2016-04-28 | Applied Materials Inc | Method and apparatus for the selective deposition of epitaxial germanium stressor alloys |
ES2762451T3 (es) | 2011-04-04 | 2020-05-25 | Berg Llc | Tratamiento de tumores del sistema nervioso central con coenzima Q10 |
KR102058256B1 (ko) | 2011-06-17 | 2020-01-22 | 버그 엘엘씨 | 흡입성 약제학적 조성물들 |
WO2013148211A1 (en) | 2012-03-30 | 2013-10-03 | The Trustees Of Columbia University In The City Of New York | Solid-state materials formed of molecular clusters and method of forming same |
EP2770373A1 (en) * | 2013-02-20 | 2014-08-27 | Imec | Conformal anti-reflective coating |
KR102123996B1 (ko) | 2013-02-25 | 2020-06-17 | 삼성전자주식회사 | 알루미늄 전구체, 이를 이용한 박막 형성 방법 및 커패시터 형성 방법 |
JP6731336B2 (ja) | 2013-04-08 | 2020-07-29 | バーグ エルエルシー | コエンザイムq10併用療法を用いた癌の処置方法 |
MX2016002432A (es) * | 2013-08-30 | 2016-12-07 | Basf Coatings Gmbh | Pelicula delgada hibrida organica-inorganica y metodo para su preparacion. |
WO2015035094A1 (en) | 2013-09-04 | 2015-03-12 | Berg Llc | Methods of treatment of cancer by continuous infusion of coenzyme q10 |
US9755235B2 (en) | 2014-07-17 | 2017-09-05 | Ada Technologies, Inc. | Extreme long life, high energy density batteries and method of making and using the same |
JP6657588B2 (ja) * | 2015-04-17 | 2020-03-04 | 凸版印刷株式会社 | 積層体及びその製造方法 |
WO2016209460A2 (en) | 2015-05-21 | 2016-12-29 | Ada Technologies, Inc. | High energy density hybrid pseudocapacitors and method of making and using the same |
US11996564B2 (en) | 2015-06-01 | 2024-05-28 | Forge Nano Inc. | Nano-engineered coatings for anode active materials, cathode active materials, and solid-state electrolytes and methods of making batteries containing nano-engineered coatings |
US12027661B2 (en) | 2015-06-01 | 2024-07-02 | Forge Nano Inc. | Nano-engineered coatings for anode active materials, cathode active materials, and solid-state electrolytes and methods of making batteries containing nano-engineered coatings |
WO2017023797A1 (en) | 2015-07-31 | 2017-02-09 | Ada Technologies, Inc. | High energy and power electrochemical device and method of making and using same |
US11024846B2 (en) | 2017-03-23 | 2021-06-01 | Ada Technologies, Inc. | High energy/power density, long cycle life, safe lithium-ion battery capable of long-term deep discharge/storage near zero volt and method of making and using the same |
TWI762194B (zh) * | 2017-07-18 | 2022-04-21 | 美商應用材料股份有限公司 | 在金屬材料表面上沉積阻擋層的方法 |
CN111279015B (zh) | 2017-08-24 | 2022-05-24 | 福吉纳米有限公司 | 合成、功能化、表面处理和/或封装粉末的制造工艺及其应用 |
EP3728688B1 (en) * | 2017-12-20 | 2021-11-10 | Basf Se | Process for the generation of metal-containing films |
KR102649437B1 (ko) * | 2018-05-30 | 2024-03-19 | 한양대학교 산학협력단 | 안티-그로스 박막 및 그 제조 방법 |
WO2020141731A1 (ko) * | 2018-12-31 | 2020-07-09 | 한양대학교 산학협력단 | 메탈리스 박막의 제조 방법, 그리고 미세패턴 제조 방법, 그리고 전자 소자의 제조 방법 |
KR102265169B1 (ko) * | 2019-07-11 | 2021-06-15 | 한양대학교 산학협력단 | 하이브리드 박막 및 그 제조 방법 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5693139A (en) | 1984-07-26 | 1997-12-02 | Research Development Corporation Of Japan | Growth of doped semiconductor monolayers |
KR100297719B1 (ko) * | 1998-10-16 | 2001-08-07 | 윤종용 | 박막제조방법 |
JP2001021850A (ja) | 1999-07-06 | 2001-01-26 | Sony Corp | 固体変位素子、光学素子及び干渉フィルター |
KR100421219B1 (ko) | 2001-06-14 | 2004-03-02 | 삼성전자주식회사 | β-디케톤 리간드를 갖는 유기 금속 착물을 이용한 원자층증착방법 |
US6645882B1 (en) | 2002-01-17 | 2003-11-11 | Advanced Micro Devices, Inc. | Preparation of composite high-K/standard-K dielectrics for semiconductor devices |
US6830971B2 (en) | 2002-11-02 | 2004-12-14 | Chartered Semiconductor Manufacturing Ltd | High K artificial lattices for capacitor applications to use in CU or AL BEOL |
US7045073B2 (en) | 2002-12-18 | 2006-05-16 | Intel Corporation | Pre-etch implantation damage for the removal of thin film layers |
US7407895B2 (en) * | 2003-03-26 | 2008-08-05 | Riken | Process for producing dielectric insulating thin film, and dielectric insulating material |
-
2004
- 2004-12-28 NO NO20045674A patent/NO20045674D0/no unknown
-
2005
- 2005-12-28 WO PCT/NO2005/000488 patent/WO2006071126A1/en active Application Filing
- 2005-12-28 ES ES05822680T patent/ES2730832T3/es active Active
- 2005-12-28 EP EP05822680.4A patent/EP1838893B1/en active Active
- 2005-12-28 DK DK05822680.4T patent/DK1838893T3/en active
- 2005-12-28 US US11/722,937 patent/US8124179B2/en active Active
- 2005-12-28 PL PL05822680T patent/PL1838893T3/pl unknown
- 2005-12-28 KR KR1020077014802A patent/KR101322095B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
WO2006071126A1 (en) | 2006-07-06 |
KR20070095919A (ko) | 2007-10-01 |
ES2730832T3 (es) | 2019-11-12 |
US8124179B2 (en) | 2012-02-28 |
KR101322095B1 (ko) | 2013-10-25 |
EP1838893B1 (en) | 2019-01-23 |
DK1838893T3 (en) | 2019-04-29 |
NO20045674D0 (no) | 2004-12-28 |
EP1838893A1 (en) | 2007-10-03 |
US20080102313A1 (en) | 2008-05-01 |
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