NO317966B1 - Konfigureringsstyring i en programmerbar logisk innretning - Google Patents

Konfigureringsstyring i en programmerbar logisk innretning Download PDF

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Publication number
NO317966B1
NO317966B1 NO19996328A NO996328A NO317966B1 NO 317966 B1 NO317966 B1 NO 317966B1 NO 19996328 A NO19996328 A NO 19996328A NO 996328 A NO996328 A NO 996328A NO 317966 B1 NO317966 B1 NO 317966B1
Authority
NO
Norway
Prior art keywords
configuration
volatile elements
register
test
bits
Prior art date
Application number
NO19996328A
Other languages
English (en)
Norwegian (no)
Other versions
NO996328D0 (no
NO996328L (no
Inventor
Srinivas Ramamurthy
Jr James Fahey
William J Saiki
Neal Berger
Geoffrey S Gongwer
Eugene Jinglun Tam
Original Assignee
Atmel Corp A Delaware Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Corp A Delaware Corp filed Critical Atmel Corp A Delaware Corp
Publication of NO996328D0 publication Critical patent/NO996328D0/no
Publication of NO996328L publication Critical patent/NO996328L/no
Publication of NO317966B1 publication Critical patent/NO317966B1/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
NO19996328A 1998-04-21 1999-12-20 Konfigureringsstyring i en programmerbar logisk innretning NO317966B1 (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/063,872 US5968196A (en) 1998-04-21 1998-04-21 Configuration control in a programmable logic device using non-volatile elements
PCT/US1999/006355 WO1999054839A1 (en) 1998-04-21 1999-03-23 Configuration control in a programmable logic device using non-volatile elements

Publications (3)

Publication Number Publication Date
NO996328D0 NO996328D0 (no) 1999-12-20
NO996328L NO996328L (no) 2000-02-21
NO317966B1 true NO317966B1 (no) 2005-01-17

Family

ID=22052065

Family Applications (1)

Application Number Title Priority Date Filing Date
NO19996328A NO317966B1 (no) 1998-04-21 1999-12-20 Konfigureringsstyring i en programmerbar logisk innretning

Country Status (12)

Country Link
US (1) US5968196A (xx)
EP (1) EP1008025B1 (xx)
JP (1) JP2002505756A (xx)
KR (1) KR20010013935A (xx)
CN (1) CN1154940C (xx)
CA (1) CA2295445A1 (xx)
DE (1) DE69914864T2 (xx)
HK (1) HK1027412A1 (xx)
MY (1) MY114634A (xx)
NO (1) NO317966B1 (xx)
TW (1) TW440700B (xx)
WO (1) WO1999054839A1 (xx)

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US8886696B1 (en) 2009-03-03 2014-11-11 Altera Corporation Digital signal processing circuitry with redundancy and ability to support larger multipliers
US8549055B2 (en) 2009-03-03 2013-10-01 Altera Corporation Modular digital signal processing circuitry with optionally usable, dedicated connections between modules of the circuitry
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Also Published As

Publication number Publication date
TW440700B (en) 2001-06-16
CN1263618A (zh) 2000-08-16
KR20010013935A (ko) 2001-02-26
MY114634A (en) 2002-11-30
DE69914864D1 (de) 2004-03-25
EP1008025A4 (en) 2001-03-21
US5968196A (en) 1999-10-19
CN1154940C (zh) 2004-06-23
NO996328D0 (no) 1999-12-20
JP2002505756A (ja) 2002-02-19
EP1008025B1 (en) 2004-02-18
EP1008025A1 (en) 2000-06-14
NO996328L (no) 2000-02-21
CA2295445A1 (en) 1999-10-28
DE69914864T2 (de) 2005-01-05
HK1027412A1 (en) 2001-01-12
WO1999054839A1 (en) 1999-10-28

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