NO20021457D0 - Fremgangsmåte for måling av tredimensjonal form - Google Patents
Fremgangsmåte for måling av tredimensjonal formInfo
- Publication number
- NO20021457D0 NO20021457D0 NO20021457A NO20021457A NO20021457D0 NO 20021457 D0 NO20021457 D0 NO 20021457D0 NO 20021457 A NO20021457 A NO 20021457A NO 20021457 A NO20021457 A NO 20021457A NO 20021457 D0 NO20021457 D0 NO 20021457D0
- Authority
- NO
- Norway
- Prior art keywords
- measuring
- dimensional shape
- dimensional
- shape
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2509—Color coding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2536—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Optics & Photonics (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001122723A JP3519698B2 (ja) | 2001-04-20 | 2001-04-20 | 3次元形状測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
NO20021457D0 true NO20021457D0 (no) | 2002-03-22 |
NO20021457L NO20021457L (no) | 2002-10-21 |
Family
ID=18972388
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO20021457A NO20021457L (no) | 2001-04-20 | 2002-03-22 | Fremgangsmåte for måling av tredimensjonal form |
Country Status (5)
Country | Link |
---|---|
US (1) | US6750975B2 (no) |
EP (1) | EP1251327A3 (no) |
JP (1) | JP3519698B2 (no) |
KR (1) | KR100613421B1 (no) |
NO (1) | NO20021457L (no) |
Families Citing this family (63)
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US6937348B2 (en) * | 2000-01-28 | 2005-08-30 | Genex Technologies, Inc. | Method and apparatus for generating structural pattern illumination |
KR100406843B1 (ko) * | 2001-04-06 | 2003-11-21 | (주) 인텍플러스 | 색정보를 이용한 실시간 3차원 표면형상 측정방법 및 장치 |
JP3884321B2 (ja) * | 2001-06-26 | 2007-02-21 | オリンパス株式会社 | 3次元情報取得装置、3次元情報取得における投影パターン、及び、3次元情報取得方法 |
JP3855756B2 (ja) * | 2001-12-07 | 2006-12-13 | ブラザー工業株式会社 | 3次元色形状検出装置及び3次元スキャナー |
DE10254139A1 (de) * | 2002-11-15 | 2004-05-27 | Carl Zeiss Jena Gmbh | Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe |
SI21521A (sl) * | 2003-06-12 | 2004-12-31 | Univerza V Ljubljani | Naprava za ugotavljanje oblike in dimenzij trodimenzionalnega merjenca |
WO2005031252A1 (ja) * | 2003-09-25 | 2005-04-07 | Brother Kogyo Kabushiki Kaisha | 3次元形状検出装置、3次元形状検出システム、及び、3次元形状検出プログラム |
JP4162095B2 (ja) * | 2003-12-11 | 2008-10-08 | ストライダー ラブス,インコーポレイテッド | 遮蔽された部分の表面を対称性の算出により見込み復元するための技術 |
JP2005293075A (ja) * | 2004-03-31 | 2005-10-20 | Brother Ind Ltd | 3次元形状検出装置、3次元形状検出方法、3次元形状検出プログラム |
US20050243330A1 (en) * | 2004-04-28 | 2005-11-03 | Simon Magarill | Methods and apparatus for determining three dimensional configurations |
US7433058B2 (en) * | 2004-07-12 | 2008-10-07 | Solvision Inc. | System and method for simultaneous 3D height measurements on multiple sides of an object |
JP4613626B2 (ja) * | 2005-02-04 | 2011-01-19 | 旭硝子株式会社 | 鏡面形状測定方法および装置並びに検査方法および装置 |
US7285767B2 (en) * | 2005-10-24 | 2007-10-23 | General Electric Company | Methods and apparatus for inspecting an object |
JP5091466B2 (ja) * | 2005-11-30 | 2012-12-05 | 国立大学法人浜松医科大学 | 観察装置 |
US20070273894A1 (en) * | 2006-05-23 | 2007-11-29 | Johnson James T | Method and apparatus for remote spatial calibration and imaging |
US7474415B2 (en) * | 2006-09-13 | 2009-01-06 | Chung Shan Institute Of Science And Technology, Armaments Bureau, M.N.D. | Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display |
KR100945314B1 (ko) | 2007-02-21 | 2010-03-05 | 캐논 가부시끼가이샤 | 형상 측정 장치, 노광 장치 및 컴퓨터 |
DE102007034689B4 (de) * | 2007-07-12 | 2009-06-10 | Carl Zeiss Ag | Verfahren und Vorrichtung zum optischen Inspizieren einer Oberfläche an einem Gegenstand |
US7768656B2 (en) * | 2007-08-28 | 2010-08-03 | Artec Group, Inc. | System and method for three-dimensional measurement of the shape of material objects |
WO2009038242A1 (en) * | 2007-09-18 | 2009-03-26 | Intekplus Co., Ltd. | Optical test method |
JP4633101B2 (ja) * | 2007-10-15 | 2011-02-16 | ビジュアツール株式会社 | 立体形状計測装置および立体形状計測方法 |
DE102007054907A1 (de) * | 2007-11-15 | 2009-05-28 | Sirona Dental Systems Gmbh | Verfahren zur optischen Vermessung von Objekten unter Verwendung eines Triangulationsverfahrens |
CN103134446B (zh) | 2008-02-26 | 2017-03-01 | 株式会社高永科技 | 三维形状测量装置及测量方法 |
KR100901537B1 (ko) | 2008-04-30 | 2009-06-08 | 지스캔(주) | 칼라격자를 적용한 3차원 측정방법 |
KR100910573B1 (ko) | 2008-05-29 | 2009-08-04 | 선문대학교 산학협력단 | 칼라 다파장 위상을 적용한 3차원 측정방법 |
WO2010006081A1 (en) * | 2008-07-08 | 2010-01-14 | Chiaro Technologies, Inc. | Multiple channel locating |
KR101001894B1 (ko) | 2008-10-13 | 2010-12-17 | 한국표준과학연구원 | 컬러 투사 모아레 기법을 이용한 3차원 형상 측정 장치 및 방법 |
KR101078876B1 (ko) | 2009-02-18 | 2011-11-01 | 연세대학교 산학협력단 | 3차원 형상 측정 장치 |
KR101078877B1 (ko) | 2009-02-18 | 2011-11-01 | 연세대학교 산학협력단 | 3차원 형상 측정 장치 |
DE102009017464B4 (de) * | 2009-04-03 | 2011-02-17 | Carl Zeiss Oim Gmbh | Vorrichtung zum optischen Inspizieren einer Oberfläche an einem Gegenstand |
KR101088497B1 (ko) | 2009-05-21 | 2011-11-30 | 주식회사 고영테크놀러지 | 3차원 형상 측정방법 |
JP5395507B2 (ja) * | 2009-05-21 | 2014-01-22 | キヤノン株式会社 | 三次元形状測定装置、三次元形状測定方法及びコンピュータプログラム |
CA2771727C (en) * | 2009-11-04 | 2013-01-08 | Technologies Numetrix Inc. | Device and method for obtaining three-dimensional object surface data |
WO2012050107A1 (ja) * | 2010-10-12 | 2012-04-19 | グローリー株式会社 | 硬貨処理装置及び硬貨処理方法 |
KR101289595B1 (ko) * | 2011-02-28 | 2013-07-24 | 이경자 | 격자패턴투영장치 |
KR101295760B1 (ko) * | 2011-03-10 | 2013-08-13 | 주식회사 미르기술 | 다중 격자 무늬를 이용한 비전검사장치 |
KR101466741B1 (ko) * | 2011-06-28 | 2014-12-01 | 주식회사 고영테크놀러지 | 3차원 형상 측정방법 |
US8964002B2 (en) | 2011-07-08 | 2015-02-24 | Carestream Health, Inc. | Method and apparatus for mapping in stereo imaging |
JP5581282B2 (ja) * | 2011-08-31 | 2014-08-27 | 株式会社日立ハイテクノロジーズ | 表面形状計測装置 |
US8990682B1 (en) * | 2011-10-05 | 2015-03-24 | Google Inc. | Methods and devices for rendering interactions between virtual and physical objects on a substantially transparent display |
US20150292875A1 (en) * | 2011-11-23 | 2015-10-15 | The Trustees of Columbia University in the Coty of New York | Systems, methods, and media for performing shape measurement |
JPWO2013118543A1 (ja) * | 2012-02-09 | 2015-05-11 | 株式会社日立ハイテクノロジーズ | 表面計測装置 |
JP5995484B2 (ja) * | 2012-03-30 | 2016-09-21 | キヤノン株式会社 | 三次元形状測定装置、三次元形状測定方法、及びプログラム |
JP6104662B2 (ja) * | 2013-03-25 | 2017-03-29 | 株式会社東芝 | 計測装置、方法及びプログラム |
US20140293011A1 (en) * | 2013-03-28 | 2014-10-02 | Phasica, LLC | Scanner System for Determining the Three Dimensional Shape of an Object and Method for Using |
KR101606720B1 (ko) * | 2013-08-12 | 2016-03-28 | 주식회사 수아랩 | 3차원 표면 측정 장치 및 방법 |
JP6232829B2 (ja) * | 2013-08-13 | 2017-11-22 | 横浜ゴム株式会社 | 形状解析装置及び形状解析方法 |
WO2015066458A1 (en) * | 2013-11-01 | 2015-05-07 | The Research Foundation For The State University Of New York | Method for measuring the interior three-dimensional movement, stress and strain of an object |
JP2015114309A (ja) | 2013-12-16 | 2015-06-22 | 株式会社オプトン | 計測装置 |
FR3018621B1 (fr) * | 2014-03-12 | 2017-07-21 | Vit | Procede de determination d'images tridimensionnelles d'un objet |
CH709747A1 (de) * | 2014-06-11 | 2015-12-15 | Quarz Partners Ag | Verfahren und Vorrichtung zum dreidimensionalen Ausmessen von Zahnreihen. |
KR101447645B1 (ko) | 2014-07-08 | 2014-10-08 | 주식회사 고영테크놀러지 | 3차원 형상 측정방법 |
JP6478725B2 (ja) * | 2015-03-09 | 2019-03-06 | キヤノン株式会社 | 計測装置及びロボット |
US20160354881A1 (en) * | 2015-06-02 | 2016-12-08 | Canon Kabushiki Kaisha | Measurement apparatus, system, and method of manufacturing article |
KR102482062B1 (ko) * | 2016-02-05 | 2022-12-28 | 주식회사바텍 | 컬러 패턴을 이용한 치과용 3차원 스캐너 |
EP3441715A4 (en) * | 2016-04-06 | 2019-11-13 | 4d Sensor Inc. | MEASURING METHOD, MEASURING DEVICE, MEASURING PROGRAM, AND COMPUTER-READABLE RECORDING MEDIUM HAVING THE MEASUREMENT PROGRAM RECORDED THEREON |
JP6673266B2 (ja) * | 2017-03-08 | 2020-03-25 | オムロン株式会社 | 相互反射検出装置、相互反射検出方法、およびプログラム |
KR102015219B1 (ko) * | 2018-04-24 | 2019-10-22 | 한국표준과학연구원 | 복합 패턴을 이용한 초고속 편향 측정법을 이용한 자유곡면의 3차원 형상측정시스템 및 측정방법 |
US11486700B2 (en) * | 2019-07-29 | 2022-11-01 | Korea Research Institute Of Standards And Science | System and method for 3D shape measurement of freeform surface based on high-speed deflectometry using composite patterns |
KR102218015B1 (ko) * | 2019-08-06 | 2021-02-19 | 한국표준과학연구원 | Fpm에서 켈리브레이션 그레이팅을 이용한 회절격자 위상 측정시스템 및 측정방법 |
TWI720602B (zh) * | 2019-08-27 | 2021-03-01 | 國立中央大學 | 重建物體表面的方法與光學系統 |
JP2022049269A (ja) * | 2020-09-16 | 2022-03-29 | セイコーエプソン株式会社 | 三次元形状計測方法および三次元形状計測装置 |
KR102485679B1 (ko) * | 2021-03-05 | 2023-01-10 | 한국표준과학연구원 | 측정정확도 향상을 위한 편향측정법의 보정방법 |
Family Cites Families (22)
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---|---|---|---|---|
US3944358A (en) * | 1974-09-20 | 1976-03-16 | Xerox Corporation | Color image reproduction system |
JPH061164B2 (ja) * | 1985-01-31 | 1994-01-05 | 伍良 松本 | 立体形状測定装置 |
JPH0615968B2 (ja) * | 1986-08-11 | 1994-03-02 | 伍良 松本 | 立体形状測定装置 |
US5016040A (en) * | 1987-05-26 | 1991-05-14 | Silhouette Technology, Inc. | Method and apparatus for forming a recording on a recording medium |
DE3907430C1 (no) * | 1988-12-23 | 1991-03-21 | Klaus 8206 Bruckmuehl De Pfister | |
US5489986A (en) * | 1989-02-28 | 1996-02-06 | Nikon Corporation | Position detecting apparatus |
US5343294A (en) * | 1990-03-09 | 1994-08-30 | Carl-Zeiss-Stiftung | Method for analyzing periodic brightness patterns |
DE4007500A1 (de) * | 1990-03-09 | 1991-09-12 | Zeiss Carl Fa | Verfahren und vorrichtung zur beruehrungslosen vermessung von objektoberflaechen |
DE4130237A1 (de) * | 1991-09-11 | 1993-03-18 | Zeiss Carl Fa | Verfahren und vorrichtung zur dreidimensionalen optischen vermessung von objektoberflaechen |
NL9200071A (nl) * | 1992-01-15 | 1993-08-02 | Stichting Science Park Maastri | Inrichting voor het bepalen van de topografie van een gekromd oppervlak. |
US6153886A (en) * | 1993-02-19 | 2000-11-28 | Nikon Corporation | Alignment apparatus in projection exposure apparatus |
US5583609A (en) * | 1993-04-23 | 1996-12-10 | Nikon Corporation | Projection exposure apparatus |
US6028672A (en) * | 1996-09-30 | 2000-02-22 | Zheng J. Geng | High speed three dimensional imaging method |
EP1009969B1 (en) * | 1996-06-13 | 2003-11-05 | K.U. Leuven Research & Development | Method and system for acquiring a three-dimensional shape description |
JP3388684B2 (ja) | 1997-03-05 | 2003-03-24 | 株式会社オプトン | 3次元形状測定方法 |
GB9713658D0 (en) * | 1997-06-28 | 1997-09-03 | Travis Adrian R L | View-sequential holographic display |
US6438272B1 (en) * | 1997-12-31 | 2002-08-20 | The Research Foundation Of State University Of Ny | Method and apparatus for three dimensional surface contouring using a digital video projection system |
US6252623B1 (en) * | 1998-05-15 | 2001-06-26 | 3Dmetrics, Incorporated | Three dimensional imaging system |
JP2000292135A (ja) * | 1999-04-07 | 2000-10-20 | Minolta Co Ltd | 3次元情報入力カメラ |
JP2000292131A (ja) | 1999-04-07 | 2000-10-20 | Minolta Co Ltd | 3次元情報入力カメラ |
US6341016B1 (en) * | 1999-08-06 | 2002-01-22 | Michael Malione | Method and apparatus for measuring three-dimensional shape of object |
JP2001159510A (ja) * | 1999-12-01 | 2001-06-12 | Matsushita Electric Ind Co Ltd | 三次元形状計測方法及びその装置 |
-
2001
- 2001-04-20 JP JP2001122723A patent/JP3519698B2/ja not_active Expired - Fee Related
- 2001-11-27 EP EP01128130A patent/EP1251327A3/en not_active Withdrawn
- 2001-11-27 US US09/995,128 patent/US6750975B2/en not_active Expired - Fee Related
- 2001-11-30 KR KR1020010075435A patent/KR100613421B1/ko not_active IP Right Cessation
-
2002
- 2002-03-22 NO NO20021457A patent/NO20021457L/no not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR100613421B1 (ko) | 2006-08-17 |
KR20020082738A (ko) | 2002-10-31 |
EP1251327A3 (en) | 2008-01-09 |
JP3519698B2 (ja) | 2004-04-19 |
EP1251327A2 (en) | 2002-10-23 |
NO20021457L (no) | 2002-10-21 |
US20030016366A1 (en) | 2003-01-23 |
US6750975B2 (en) | 2004-06-15 |
JP2002318109A (ja) | 2002-10-31 |
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Legal Events
Date | Code | Title | Description |
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FC2A | Withdrawal, rejection or dismissal of laid open patent application |