NO118985B - - Google Patents

Download PDF

Info

Publication number
NO118985B
NO118985B NO168092A NO16809267A NO118985B NO 118985 B NO118985 B NO 118985B NO 168092 A NO168092 A NO 168092A NO 16809267 A NO16809267 A NO 16809267A NO 118985 B NO118985 B NO 118985B
Authority
NO
Norway
Prior art keywords
film
mask
silicon
semiconductor body
anodic treatment
Prior art date
Application number
NO168092A
Other languages
English (en)
Norwegian (no)
Inventor
P Schmidt
Original Assignee
Western Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co filed Critical Western Electric Co
Publication of NO118985B publication Critical patent/NO118985B/no

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/18, H10D48/04 and H10D48/07, with or without impurities, e.g. doping materials
    • H01L21/46—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428
    • H01L21/461—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/469—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After-treatment of these layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/022—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being a laminate, i.e. composed of sublayers, e.g. stacks of alternating high-k metal oxides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
    • H01L21/02258—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by anodic treatment, e.g. anodic oxidation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/043—Dual dielectric
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/114—Nitrides of silicon
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/942—Masking

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Formation Of Insulating Films (AREA)
  • Weting (AREA)
NO168092A 1966-05-11 1967-05-10 NO118985B (OSRAM)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US54933866A 1966-05-11 1966-05-11

Publications (1)

Publication Number Publication Date
NO118985B true NO118985B (OSRAM) 1970-03-09

Family

ID=24192584

Family Applications (1)

Application Number Title Priority Date Filing Date
NO168092A NO118985B (OSRAM) 1966-05-11 1967-05-10

Country Status (7)

Country Link
US (1) US3438873A (OSRAM)
BE (1) BE696330A (OSRAM)
ES (1) ES341094A1 (OSRAM)
GB (1) GB1188507A (OSRAM)
IL (1) IL27728A (OSRAM)
NL (1) NL6706537A (OSRAM)
NO (1) NO118985B (OSRAM)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3979768A (en) * 1966-03-23 1976-09-07 Hitachi, Ltd. Semiconductor element having surface coating comprising silicon nitride and silicon oxide films
US3645807A (en) * 1966-12-26 1972-02-29 Hitachi Ltd Method for manufacturing a semiconductor device
USRE28402E (en) * 1967-01-13 1975-04-29 Method for controlling semiconductor surface potential
US3767463A (en) * 1967-01-13 1973-10-23 Ibm Method for controlling semiconductor surface potential
US3887407A (en) * 1967-02-03 1975-06-03 Hitachi Ltd Method of manufacturing semiconductor device with nitride oxide double layer film
DE1614435B2 (de) * 1967-02-23 1979-05-23 Siemens Ag, 1000 Berlin Und 8000 Muenchen Verfahren zum Herstellen von aus Germanium bestehenden, doppeldiffundierten Halbleiteranordnungen
US3537921A (en) * 1967-02-28 1970-11-03 Motorola Inc Selective hydrofluoric acid etching and subsequent processing
US3541676A (en) * 1967-12-18 1970-11-24 Gen Electric Method of forming field-effect transistors utilizing doped insulators as activator source
US3807038A (en) * 1969-05-22 1974-04-30 Mitsubishi Electric Corp Process of producing semiconductor devices
US3663279A (en) * 1969-11-19 1972-05-16 Bell Telephone Labor Inc Passivated semiconductor devices
DE2047998A1 (de) * 1970-09-30 1972-04-06 Licentia Gmbh Verfahren zum Herstellen einer Planaranordnung
US3924321A (en) * 1970-11-23 1975-12-09 Harris Corp Radiation hardened mis devices
US3707656A (en) * 1971-02-19 1972-12-26 Ibm Transistor comprising layers of silicon dioxide and silicon nitride
US4058887A (en) * 1971-02-19 1977-11-22 Ibm Corporation Method for forming a transistor comprising layers of silicon dioxide and silicon nitride
US3760242A (en) * 1972-03-06 1973-09-18 Ibm Coated semiconductor structures and methods of forming protective coverings on such structures
FR2466101A1 (fr) * 1979-09-18 1981-03-27 Thomson Csf Procede de formation de couches de silicium polycristallin localisees sur des zones recouvertes de silice d'une plaquette de silicium et application a la fabrication d'un transistor mos non plan autoaligne
US4596627A (en) * 1983-02-28 1986-06-24 Hewlett-Packard Company Etching a layer over a semiconductor
US6006763A (en) * 1995-01-11 1999-12-28 Seiko Epson Corporation Surface treatment method
JPH11510666A (ja) 1996-05-24 1999-09-14 シーメンス マツシタ コンポーネンツ ゲゼルシヤフト ミツト ベシユレンクテル ハフツング ウント コンパニコマンデイート ゲゼルシヤフト 電子デバイス、特に表面音波で作動するデバイス―ｓａｗデバイス

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2974075A (en) * 1957-10-28 1961-03-07 Bell Telephone Labor Inc Treatment of semiconductive devices
US3160539A (en) * 1958-09-08 1964-12-08 Trw Semiconductors Inc Surface treatment of silicon
US3088888A (en) * 1959-03-31 1963-05-07 Ibm Methods of etching a semiconductor device

Also Published As

Publication number Publication date
ES341094A1 (es) 1968-06-16
US3438873A (en) 1969-04-15
BE696330A (OSRAM) 1967-09-01
NL6706537A (OSRAM) 1967-11-13
IL27728A (en) 1970-09-17
GB1188507A (en) 1970-04-15

Similar Documents

Publication Publication Date Title
NO118985B (OSRAM)
DE69332231T2 (de) Halbleitersubstrat und Verfahren zu seiner Herstellung
DE2754396C2 (OSRAM)
US3640806A (en) Semiconductor device and method of producing the same
DE3872859T2 (de) Verfahren zur metallisierung eines kieselsaeure-, quartz-, glas- oder saphirsubstrates und so erhaltenes substrat.
JP2000174025A (ja) エレクトロマイグレ―ション抵抗力を有する微細構造及びその製造方法
DE2901697C3 (de) Verfahren zur Ausbildung von Leitungsverbindungen auf einem Substrat
US3827949A (en) Anodic oxide passivated planar aluminum metallurgy system and method of producing
KR930004110B1 (ko) 표면적이 극대화된 도전층 제조방법
NO168092B (no) Fortoeyningsanordning
US3798135A (en) Anodic passivating processes for integrated circuits
DE1961634B2 (de) Verfahren zum herstellen eines metall isolator halbleiter feldeffekttransistors
US3314869A (en) Method of manufacturing multilayer microcircuitry including electropolishing to smooth film conductors
US3723258A (en) Use of anodized aluminum as electrical insulation and scratch protection for semiconductor devices
GB2057513A (en) Forming hydrous oxide layers on aluminium capacitor foils
EP1328012A1 (fr) Procédé de fabrication d'un composant électronique incorporant un microcomposantinductif
JPH06204403A (ja) 表面積が極大化されたキャパシタ製造方法
US3728236A (en) Method of making semiconductor devices mounted on a heat sink
JPS591667A (ja) シリコンに対する白金の無電解めつき法
US3619387A (en) Technique for the fabrication of thin film capacitor including lead dioxide conductive films
US3436285A (en) Coatings on germanium bodies
DE2224468A1 (de) Verfahren zum aetzen von vorzugsweise glas- bzw. siliciumdioxydschichten
DE2321798A1 (de) Verfahren zum selektiven entfernen von teilen einer elektrisch leitenden wolframschicht
US3205155A (en) Method of fabricating thin film resistive elements
DE2221072A1 (de) Duennfilm-Metallisierungsverfahren fuer Mikroschaltungen