NL8701847A - Detectiestelsel voor een stralingsprofiellijn. - Google Patents
Detectiestelsel voor een stralingsprofiellijn. Download PDFInfo
- Publication number
- NL8701847A NL8701847A NL8701847A NL8701847A NL8701847A NL 8701847 A NL8701847 A NL 8701847A NL 8701847 A NL8701847 A NL 8701847A NL 8701847 A NL8701847 A NL 8701847A NL 8701847 A NL8701847 A NL 8701847A
- Authority
- NL
- Netherlands
- Prior art keywords
- detection system
- output
- row
- output signal
- diode matrix
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title claims description 49
- 230000005855 radiation Effects 0.000 title claims description 12
- 239000011159 matrix material Substances 0.000 claims description 27
- 230000000295 complement effect Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 description 9
- 238000001444 catalytic combustion detection Methods 0.000 description 4
- 238000010276 construction Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000003491 array Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000011896 sensitive detection Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/1575—Picture signal readout register, e.g. shift registers, interline shift registers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Measurement Of Radiation (AREA)
- Facsimile Scanning Arrangements (AREA)
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8701847A NL8701847A (nl) | 1987-08-05 | 1987-08-05 | Detectiestelsel voor een stralingsprofiellijn. |
US07/458,703 US5210402A (en) | 1987-08-05 | 1988-07-07 | Detection system for a radiation profile line |
EP88905820A EP0379486B1 (en) | 1987-08-05 | 1988-07-07 | Detection system for a radiation profile line |
JP63505864A JP2557097B2 (ja) | 1987-08-05 | 1988-07-07 | 放射輪郭線の検出システム |
DE8888905820T DE3865020D1 (de) | 1987-08-05 | 1988-07-07 | Detektionssystem fuer radiationsprofillinie. |
KR1019890700584A KR960013679B1 (ko) | 1987-08-05 | 1988-07-07 | 방사 프로파일 라인 탐지장치 |
PCT/EP1988/000620 WO1989001129A1 (en) | 1987-08-05 | 1988-07-07 | Detection system for a radiation profile line |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8701847A NL8701847A (nl) | 1987-08-05 | 1987-08-05 | Detectiestelsel voor een stralingsprofiellijn. |
NL8701847 | 1987-08-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL8701847A true NL8701847A (nl) | 1989-03-01 |
Family
ID=19850418
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL8701847A NL8701847A (nl) | 1987-08-05 | 1987-08-05 | Detectiestelsel voor een stralingsprofiellijn. |
Country Status (7)
Country | Link |
---|---|
US (1) | US5210402A (ko) |
EP (1) | EP0379486B1 (ko) |
JP (1) | JP2557097B2 (ko) |
KR (1) | KR960013679B1 (ko) |
DE (1) | DE3865020D1 (ko) |
NL (1) | NL8701847A (ko) |
WO (1) | WO1989001129A1 (ko) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3805548A1 (de) * | 1988-02-23 | 1989-08-31 | Thiedig Ullrich | Optische fernmesseinrichtung |
NL8801342A (nl) * | 1988-05-25 | 1989-12-18 | Imec Inter Uni Micro Electr | Stralingsopnemer. |
DE4027732A1 (de) * | 1990-09-01 | 1992-03-05 | Thiedig Ullrich | Kamerachip fuer eine punktfoermige ereignisse erfassende und auswertende kamera |
US5294803A (en) * | 1991-12-30 | 1994-03-15 | Tandberg Data A/S | System and a method for optically detecting an edge of a tape |
US5554858A (en) * | 1994-09-22 | 1996-09-10 | Robotic Vision Systems, Inc | Segmented position sensing detector for reducing non-uniformly distributed stray light from a spot image |
WO2000059211A1 (en) | 1999-03-31 | 2000-10-05 | The Regents Of The University Of California | Multi-channel detector readout method and integrated circuit |
US8066700B2 (en) * | 2003-01-31 | 2011-11-29 | Smith & Nephew, Inc. | Cartilage treatment probe |
FR2986352B1 (fr) * | 2012-01-30 | 2014-02-14 | Soc Fr Detecteurs Infrarouges Sofradir | Procede de recherche de pixels dans une matrice et circuit mettant en oeuvre le procede |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3894230A (en) * | 1973-10-25 | 1975-07-08 | Coherent Radiation | Apparatus for detecting the position of a moving or modulated light beam |
CA1082811A (en) * | 1976-04-05 | 1980-07-29 | Greenwood Mills, Inc. | Diffraction pattern amplitude analysis for use in fabric inspection |
US4322752A (en) * | 1980-01-16 | 1982-03-30 | Eastman Technology, Inc. | Fast frame rate sensor readout |
JPS58127132A (ja) * | 1982-01-25 | 1983-07-28 | Asahi Optical Co Ltd | 光検出装置 |
FR2560472B1 (fr) * | 1984-02-23 | 1987-08-21 | Proge | Dispositif de releve de profil rapide |
-
1987
- 1987-08-05 NL NL8701847A patent/NL8701847A/nl not_active Application Discontinuation
-
1988
- 1988-07-07 WO PCT/EP1988/000620 patent/WO1989001129A1/en active IP Right Grant
- 1988-07-07 EP EP88905820A patent/EP0379486B1/en not_active Expired - Lifetime
- 1988-07-07 JP JP63505864A patent/JP2557097B2/ja not_active Expired - Lifetime
- 1988-07-07 US US07/458,703 patent/US5210402A/en not_active Expired - Fee Related
- 1988-07-07 KR KR1019890700584A patent/KR960013679B1/ko not_active IP Right Cessation
- 1988-07-07 DE DE8888905820T patent/DE3865020D1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2557097B2 (ja) | 1996-11-27 |
KR960013679B1 (ko) | 1996-10-10 |
US5210402A (en) | 1993-05-11 |
WO1989001129A1 (en) | 1989-02-09 |
DE3865020D1 (de) | 1991-10-24 |
EP0379486B1 (en) | 1991-09-18 |
KR890701988A (ko) | 1989-12-22 |
EP0379486A1 (en) | 1990-08-01 |
JPH03501880A (ja) | 1991-04-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6084658A (en) | Distance measuring apparatus | |
CN110596727B (zh) | 输出精度信息的测距装置 | |
JP5486150B2 (ja) | 測距装置、測距方法及び測距システム | |
EP0417736B1 (en) | System for optically inspecting conditions of parts packaged on substrate | |
JP3072779B2 (ja) | 傾斜角検出装置 | |
NL8701847A (nl) | Detectiestelsel voor een stralingsprofiellijn. | |
EP4160140A1 (en) | Three dimensional imaging system | |
JPWO2019050024A1 (ja) | 距離測定方法および距離測定装置 | |
JPS6357721B2 (ko) | ||
US4432013A (en) | Method and apparatus for comparing data signals in a container inspection device | |
US4437116A (en) | Method and apparatus for comparing data signals in a container inspection device | |
JPH05322562A (ja) | 電子レベルと電子レベル用標尺 | |
JP2001004367A (ja) | 測距演算装置 | |
JPS592842B2 (ja) | 寸法測定装置 | |
EP3977157B1 (en) | High spatial resolution solid-state image sensor with distributed photomultiplier | |
JP3817460B2 (ja) | 光検出装置 | |
JPH0473762B2 (ko) | ||
EP0642034A1 (en) | Distance measuring method and apparatus | |
JP4425112B2 (ja) | エンコーダ | |
JP2002366930A (ja) | 画像計測カメラ | |
JP2765285B2 (ja) | 変位計 | |
JPH0511173A (ja) | 測距装置 | |
JPH0754251B2 (ja) | 位置検出装置 | |
JPH01123110A (ja) | 測距装置 | |
JPH0122884B2 (ko) |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A1B | A search report has been drawn up | ||
BV | The patent application has lapsed |