NL8701847A - Detectiestelsel voor een stralingsprofiellijn. - Google Patents

Detectiestelsel voor een stralingsprofiellijn. Download PDF

Info

Publication number
NL8701847A
NL8701847A NL8701847A NL8701847A NL8701847A NL 8701847 A NL8701847 A NL 8701847A NL 8701847 A NL8701847 A NL 8701847A NL 8701847 A NL8701847 A NL 8701847A NL 8701847 A NL8701847 A NL 8701847A
Authority
NL
Netherlands
Prior art keywords
detection system
output
row
output signal
diode matrix
Prior art date
Application number
NL8701847A
Other languages
English (en)
Dutch (nl)
Original Assignee
Optische Ind De Oude Delft Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optische Ind De Oude Delft Nv filed Critical Optische Ind De Oude Delft Nv
Priority to NL8701847A priority Critical patent/NL8701847A/nl
Priority to US07/458,703 priority patent/US5210402A/en
Priority to DE8888905820T priority patent/DE3865020D1/de
Priority to PCT/EP1988/000620 priority patent/WO1989001129A1/fr
Priority to JP63505864A priority patent/JP2557097B2/ja
Priority to KR1019890700584A priority patent/KR960013679B1/ko
Priority to EP88905820A priority patent/EP0379486B1/fr
Publication of NL8701847A publication Critical patent/NL8701847A/nl

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/1575—Picture signal readout register, e.g. shift registers, interline shift registers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
  • Facsimile Scanning Arrangements (AREA)
NL8701847A 1987-08-05 1987-08-05 Detectiestelsel voor een stralingsprofiellijn. NL8701847A (nl)

Priority Applications (7)

Application Number Priority Date Filing Date Title
NL8701847A NL8701847A (nl) 1987-08-05 1987-08-05 Detectiestelsel voor een stralingsprofiellijn.
US07/458,703 US5210402A (en) 1987-08-05 1988-07-07 Detection system for a radiation profile line
DE8888905820T DE3865020D1 (de) 1987-08-05 1988-07-07 Detektionssystem fuer radiationsprofillinie.
PCT/EP1988/000620 WO1989001129A1 (fr) 1987-08-05 1988-07-07 Systeme de detection pour une ligne de projection de rayonnement
JP63505864A JP2557097B2 (ja) 1987-08-05 1988-07-07 放射輪郭線の検出システム
KR1019890700584A KR960013679B1 (ko) 1987-08-05 1988-07-07 방사 프로파일 라인 탐지장치
EP88905820A EP0379486B1 (fr) 1987-08-05 1988-07-07 Systeme de detection pour une ligne de projection de rayonnement

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8701847A NL8701847A (nl) 1987-08-05 1987-08-05 Detectiestelsel voor een stralingsprofiellijn.
NL8701847 1987-08-05

Publications (1)

Publication Number Publication Date
NL8701847A true NL8701847A (nl) 1989-03-01

Family

ID=19850418

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8701847A NL8701847A (nl) 1987-08-05 1987-08-05 Detectiestelsel voor een stralingsprofiellijn.

Country Status (7)

Country Link
US (1) US5210402A (fr)
EP (1) EP0379486B1 (fr)
JP (1) JP2557097B2 (fr)
KR (1) KR960013679B1 (fr)
DE (1) DE3865020D1 (fr)
NL (1) NL8701847A (fr)
WO (1) WO1989001129A1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3805548A1 (de) * 1988-02-23 1989-08-31 Thiedig Ullrich Optische fernmesseinrichtung
NL8801342A (nl) * 1988-05-25 1989-12-18 Imec Inter Uni Micro Electr Stralingsopnemer.
DE4027732A1 (de) * 1990-09-01 1992-03-05 Thiedig Ullrich Kamerachip fuer eine punktfoermige ereignisse erfassende und auswertende kamera
US5294803A (en) * 1991-12-30 1994-03-15 Tandberg Data A/S System and a method for optically detecting an edge of a tape
US5554858A (en) * 1994-09-22 1996-09-10 Robotic Vision Systems, Inc Segmented position sensing detector for reducing non-uniformly distributed stray light from a spot image
WO2000059211A1 (fr) 1999-03-31 2000-10-05 The Regents Of The University Of California Procede de lecture pour detecteurs multicanal et circuit integre
US8066700B2 (en) * 2003-01-31 2011-11-29 Smith & Nephew, Inc. Cartilage treatment probe
FR2986352B1 (fr) * 2012-01-30 2014-02-14 Soc Fr Detecteurs Infrarouges Sofradir Procede de recherche de pixels dans une matrice et circuit mettant en oeuvre le procede

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3894230A (en) * 1973-10-25 1975-07-08 Coherent Radiation Apparatus for detecting the position of a moving or modulated light beam
CA1082811A (fr) * 1976-04-05 1980-07-29 Greenwood Mills, Inc. Analyse d'amplitude dans un diagramme de diffraction pour l'inspection des tissus
US4322752A (en) * 1980-01-16 1982-03-30 Eastman Technology, Inc. Fast frame rate sensor readout
JPS58127132A (ja) * 1982-01-25 1983-07-28 Asahi Optical Co Ltd 光検出装置
FR2560472B1 (fr) * 1984-02-23 1987-08-21 Proge Dispositif de releve de profil rapide

Also Published As

Publication number Publication date
JP2557097B2 (ja) 1996-11-27
KR960013679B1 (ko) 1996-10-10
KR890701988A (ko) 1989-12-22
DE3865020D1 (de) 1991-10-24
EP0379486A1 (fr) 1990-08-01
EP0379486B1 (fr) 1991-09-18
JPH03501880A (ja) 1991-04-25
WO1989001129A1 (fr) 1989-02-09
US5210402A (en) 1993-05-11

Similar Documents

Publication Publication Date Title
US6084658A (en) Distance measuring apparatus
US5319442A (en) Optical inspection probe
JP5486150B2 (ja) 測距装置、測距方法及び測距システム
JP3072779B2 (ja) 傾斜角検出装置
CN110596727A (zh) 输出精度信息的测距装置
NL8701847A (nl) Detectiestelsel voor een stralingsprofiellijn.
JPWO2019050024A1 (ja) 距離測定方法および距離測定装置
US4385318A (en) Method and apparatus for comparing data signals in a container inspection device
JPS6357721B2 (fr)
US4432013A (en) Method and apparatus for comparing data signals in a container inspection device
EP4160140A1 (fr) Système d'imagerie tridimensionnelle
JPH05322562A (ja) 電子レベルと電子レベル用標尺
JPS592842B2 (ja) 寸法測定装置
GB2089977A (en) Comparing data signals in defect inspection device
EP3977157B1 (fr) Capteur d'image à semi-conducteurs à haute résolution spatiale avec photomultiplicateur distribué
JP3817460B2 (ja) 光検出装置
JPH0473762B2 (fr)
EP0642034A1 (fr) Méthode et appareil de mesure de distance
JP4425112B2 (ja) エンコーダ
JP2002366930A (ja) 画像計測カメラ
JP2765285B2 (ja) 変位計
JP2583363Y2 (ja) スペックル測長計
JPH0511173A (ja) 測距装置
JPH0754251B2 (ja) 位置検出装置
JPH01123110A (ja) 測距装置

Legal Events

Date Code Title Description
A1B A search report has been drawn up
BV The patent application has lapsed