NL8700663A - Npn equivalente structuur met een doorslagspanning groter dan de intrinsieke doorslagspanning van npntransistors. - Google Patents
Npn equivalente structuur met een doorslagspanning groter dan de intrinsieke doorslagspanning van npntransistors. Download PDFInfo
- Publication number
- NL8700663A NL8700663A NL8700663A NL8700663A NL8700663A NL 8700663 A NL8700663 A NL 8700663A NL 8700663 A NL8700663 A NL 8700663A NL 8700663 A NL8700663 A NL 8700663A NL 8700663 A NL8700663 A NL 8700663A
- Authority
- NL
- Netherlands
- Prior art keywords
- transistor
- npn
- collector
- pnp
- equivalent
- Prior art date
Links
- 230000007306 turnover Effects 0.000 title 2
- 238000009792 diffusion process Methods 0.000 claims description 18
- 230000005669 field effect Effects 0.000 claims description 10
- 239000000758 substrate Substances 0.000 claims description 10
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 9
- 229910052710 silicon Inorganic materials 0.000 claims description 9
- 239000010703 silicon Substances 0.000 claims description 9
- 239000004065 semiconductor Substances 0.000 claims description 5
- 230000015556 catabolic process Effects 0.000 description 16
- 238000000034 method Methods 0.000 description 6
- 230000010354 integration Effects 0.000 description 4
- 230000003503 early effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000002019 doping agent Substances 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0611—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
- H01L27/0617—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type
- H01L27/0623—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type in combination with bipolar transistors
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Bipolar Integrated Circuits (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT83611/86A IT1204244B (it) | 1986-03-21 | 1986-03-21 | Struttura npn equivalente con tensione di rottura maggiorata rispetto alla tensione di rottura intrinseca dell'npn |
| IT8361186 | 1986-03-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL8700663A true NL8700663A (nl) | 1987-10-16 |
Family
ID=11323110
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL8700663A NL8700663A (nl) | 1986-03-21 | 1987-03-20 | Npn equivalente structuur met een doorslagspanning groter dan de intrinsieke doorslagspanning van npntransistors. |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4740821A (it) |
| JP (1) | JPH0797553B2 (it) |
| DE (1) | DE3709124C2 (it) |
| FR (1) | FR2596202B1 (it) |
| IT (1) | IT1204244B (it) |
| NL (1) | NL8700663A (it) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1232930B (it) * | 1987-10-30 | 1992-03-10 | Sgs Microelettronica Spa | Struttura integrata a componenti attivi e passivi inclusi in sacche di isolamento operante a tensione maggiore della tensione di rottura tra ciascun componente e la sacca che lo contiene |
| US4939099A (en) * | 1988-06-21 | 1990-07-03 | Texas Instruments Incorporated | Process for fabricating isolated vertical bipolar and JFET transistors |
| US4951115A (en) * | 1989-03-06 | 1990-08-21 | International Business Machines Corp. | Complementary transistor structure and method for manufacture |
| EP0580254A3 (en) * | 1992-07-20 | 1996-01-03 | Philips Electronics Nv | Integrated semiconductor circuit |
| US5610079A (en) * | 1995-06-19 | 1997-03-11 | Reliance Electric Industrial Company | Self-biased moat for parasitic current suppression in integrated circuits |
| US6551869B1 (en) * | 2000-06-09 | 2003-04-22 | Motorola, Inc. | Lateral PNP and method of manufacture |
| US7888768B2 (en) * | 2006-01-09 | 2011-02-15 | Fairchild Korea Semiconductor, Ltd. | Power integrated circuit device having embedded high-side power switch |
| CN113823678A (zh) * | 2021-09-03 | 2021-12-21 | 无锡市晶源微电子有限公司 | 一种高压npn器件 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1406391A (en) * | 1973-02-17 | 1975-09-17 | Ferranti Ltd | Inverter circuit arrangements |
| US4095252A (en) * | 1976-12-27 | 1978-06-13 | National Semiconductor Corporation | Composite jfet-bipolar transistor structure |
| JPS5585135A (en) * | 1978-12-21 | 1980-06-26 | Sony Corp | Mos-fet switching circuit |
| US4395812A (en) * | 1980-02-04 | 1983-08-02 | Ibm Corporation | Forming an integrated circuit |
| DE3029553A1 (de) * | 1980-08-04 | 1982-03-11 | Siemens AG, 1000 Berlin und 8000 München | Transistoranordnung mit hoher kollektor-emitter-durchbruchsspannung |
| FR2523370B1 (fr) * | 1982-03-12 | 1985-12-13 | Thomson Csf | Transistor pnp fort courant faisant partie d'un circuit integre monolithique |
| JPH0693626B2 (ja) * | 1983-07-25 | 1994-11-16 | 株式会社日立製作所 | 半導体集積回路装置 |
-
1986
- 1986-03-21 IT IT83611/86A patent/IT1204244B/it active
-
1987
- 1987-03-05 US US07/022,273 patent/US4740821A/en not_active Expired - Lifetime
- 1987-03-20 FR FR878703928A patent/FR2596202B1/fr not_active Expired - Lifetime
- 1987-03-20 DE DE3709124A patent/DE3709124C2/de not_active Expired - Fee Related
- 1987-03-20 JP JP62067742A patent/JPH0797553B2/ja not_active Expired - Fee Related
- 1987-03-20 NL NL8700663A patent/NL8700663A/nl not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62229967A (ja) | 1987-10-08 |
| DE3709124C2 (de) | 1995-10-26 |
| US4740821A (en) | 1988-04-26 |
| IT8683611A0 (it) | 1986-03-21 |
| FR2596202A1 (fr) | 1987-09-25 |
| FR2596202B1 (fr) | 1990-03-16 |
| IT1204244B (it) | 1989-03-01 |
| DE3709124A1 (de) | 1987-09-24 |
| JPH0797553B2 (ja) | 1995-10-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3293087A (en) | Method of making isolated epitaxial field-effect device | |
| EP0083815A2 (en) | Lateral junction field effect transistor device | |
| KR850005154A (ko) | 화합물 반도체 집적회로 장치 | |
| EP0036887A4 (en) | SEMICONDUCTOR DEVICES CONTROLLABLE BY DEPARATION ZONES. | |
| US3440502A (en) | Insulated gate field effect transistor structure with reduced current leakage | |
| KR970008665A (ko) | 게이트 보호용 제너 다이오드를 갖는 반도체 소자 및 그 제조방법 | |
| NL8700663A (nl) | Npn equivalente structuur met een doorslagspanning groter dan de intrinsieke doorslagspanning van npntransistors. | |
| US6791810B2 (en) | Protection circuit of field effect transistor and semiconductor device | |
| US4712122A (en) | Heterojunction gate ballistic JFET with channel thinner than Debye length | |
| EP0142253A2 (en) | Integrated circuit comprising bipolar and field effect devices | |
| US6355513B1 (en) | Asymmetric depletion region for normally off JFET | |
| US5381031A (en) | Semiconductor device with reduced high voltage termination area and high breakdown voltage | |
| US4622573A (en) | CMOS contacting structure having degeneratively doped regions for the prevention of latch-up | |
| US4933733A (en) | Slot collector transistor | |
| KR910009041B1 (ko) | 절연게이트 반도체장치 | |
| US4530000A (en) | Bipolar transistor with protective diode in collector | |
| KR20010020486A (ko) | 폭이 넓은 밴드갭 반도체 내의 전력 소자 | |
| US5929503A (en) | Punch-through diodes and applications | |
| US4870469A (en) | Tunnel injection type static transistor and its integrated circuit | |
| KR940016782A (ko) | 반도체 장치 | |
| CN1218296A (zh) | 介质分隔式半导体器件 | |
| US5440164A (en) | MOS/bipolar device | |
| EP0084000A2 (en) | CMOS device | |
| US6927460B1 (en) | Method and structure for BiCMOS isolated NMOS transistor | |
| KR0138917B1 (ko) | 반도체 소자 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| BV | The patent application has lapsed |