NL8700216A - Werkwijze voor het testen van een gemodificeerde boothmultiplicator, gemodificeerde boothmultiplicator, geschikt om volgens deze werkwijze te worden getest, en geintegreerde schakeling, voorzien van een dergelijke gemodificeerde boothmultiplicator. - Google Patents
Werkwijze voor het testen van een gemodificeerde boothmultiplicator, gemodificeerde boothmultiplicator, geschikt om volgens deze werkwijze te worden getest, en geintegreerde schakeling, voorzien van een dergelijke gemodificeerde boothmultiplicator. Download PDFInfo
- Publication number
- NL8700216A NL8700216A NL8700216A NL8700216A NL8700216A NL 8700216 A NL8700216 A NL 8700216A NL 8700216 A NL8700216 A NL 8700216A NL 8700216 A NL8700216 A NL 8700216A NL 8700216 A NL8700216 A NL 8700216A
- Authority
- NL
- Netherlands
- Prior art keywords
- full
- significant
- testing
- input signal
- test patterns
- Prior art date
Links
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
- G06F7/38—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation
- G06F7/48—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
- G06F7/52—Multiplying; Dividing
- G06F7/523—Multiplying only
- G06F7/533—Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even
- G06F7/5334—Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even by using multiple bit scanning, i.e. by decoding groups of successive multiplier bits in order to select an appropriate precalculated multiple of the multiplicand as a partial product
- G06F7/5336—Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even by using multiple bit scanning, i.e. by decoding groups of successive multiplier bits in order to select an appropriate precalculated multiple of the multiplicand as a partial product overlapped, i.e. with successive bitgroups sharing one or more bits being recoded into signed digit representation, e.g. using the Modified Booth Algorithm
- G06F7/5338—Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even by using multiple bit scanning, i.e. by decoding groups of successive multiplier bits in order to select an appropriate precalculated multiple of the multiplicand as a partial product overlapped, i.e. with successive bitgroups sharing one or more bits being recoded into signed digit representation, e.g. using the Modified Booth Algorithm each bitgroup having two new bits, e.g. 2nd order MBA
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2226—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test ALU
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/851—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector the connector being supplied to the parts to be connected in the bonding apparatus
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01019—Potassium [K]
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Optimization (AREA)
- Computational Mathematics (AREA)
- Mathematical Analysis (AREA)
- Pure & Applied Mathematics (AREA)
- Quality & Reliability (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- Tests Of Electronic Circuits (AREA)
- Complex Calculations (AREA)
- Compression, Expansion, Code Conversion, And Decoders (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8700216A NL8700216A (nl) | 1987-01-29 | 1987-01-29 | Werkwijze voor het testen van een gemodificeerde boothmultiplicator, gemodificeerde boothmultiplicator, geschikt om volgens deze werkwijze te worden getest, en geintegreerde schakeling, voorzien van een dergelijke gemodificeerde boothmultiplicator. |
EP87202655A EP0276520B1 (en) | 1987-01-29 | 1987-12-30 | Method of testing a modified booth multiplier, modified booth multiplier suitable for testing by means of this method, and integrated circuit comprising such a modified booth multiplier |
DE8787202655T DE3779612D1 (de) | 1987-01-29 | 1987-12-30 | Verfahren zum testen eines modifizierten booth-multiplizierers, modifizierter booth-multiplizierer, geeignet zum testen mittels dieses verfahrens, und denselben enthaltende integrierte schaltung. |
US07/144,294 US4866715A (en) | 1987-01-29 | 1988-01-15 | Method of testing a modified booth multiplier, modified booth multiplier suitable for testing by means of this method, and integrated circuit comprising such a modified booth multiplier |
JP63013727A JPS63195730A (ja) | 1987-01-29 | 1988-01-26 | 変形ブースマルチプライヤ及びその試験方法 |
KR1019880000681A KR880009301A (ko) | 1987-01-29 | 1988-01-28 | 변형 부우드 증배기 및 그 테스트 방법 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8700216A NL8700216A (nl) | 1987-01-29 | 1987-01-29 | Werkwijze voor het testen van een gemodificeerde boothmultiplicator, gemodificeerde boothmultiplicator, geschikt om volgens deze werkwijze te worden getest, en geintegreerde schakeling, voorzien van een dergelijke gemodificeerde boothmultiplicator. |
NL8700216 | 1987-01-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL8700216A true NL8700216A (nl) | 1988-08-16 |
Family
ID=19849490
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL8700216A NL8700216A (nl) | 1987-01-29 | 1987-01-29 | Werkwijze voor het testen van een gemodificeerde boothmultiplicator, gemodificeerde boothmultiplicator, geschikt om volgens deze werkwijze te worden getest, en geintegreerde schakeling, voorzien van een dergelijke gemodificeerde boothmultiplicator. |
Country Status (6)
Country | Link |
---|---|
US (1) | US4866715A (ko) |
EP (1) | EP0276520B1 (ko) |
JP (1) | JPS63195730A (ko) |
KR (1) | KR880009301A (ko) |
DE (1) | DE3779612D1 (ko) |
NL (1) | NL8700216A (ko) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04147334A (ja) * | 1990-10-09 | 1992-05-20 | Matsushita Electric Ind Co Ltd | 乗算器と乗算器のテスト方式 |
US5218564A (en) * | 1991-06-07 | 1993-06-08 | National Semiconductor Corporation | Layout efficient 32-bit shifter/register with 16-bit interface |
FR2722590B1 (fr) * | 1994-07-15 | 1996-09-06 | Sgs Thomson Microelectronics | Circuit logique de multiplication parallele |
JPH08152994A (ja) * | 1994-11-29 | 1996-06-11 | Mitsubishi Electric Corp | 乗算器及びディジタルフィルタ |
US5600658A (en) * | 1995-10-19 | 1997-02-04 | National Semiconductor Corporation | Built-in self tests for large multiplier, adder, or subtractor |
KR100362186B1 (ko) * | 1995-12-29 | 2003-03-28 | 주식회사 하이닉스반도체 | 멀티플렉서를이용한직렬부스승산기 |
US5960009A (en) * | 1996-08-09 | 1999-09-28 | Lucent Technologies Inc. | Built in shelf test method and apparatus for booth multipliers |
US6571268B1 (en) | 1998-10-06 | 2003-05-27 | Texas Instruments Incorporated | Multiplier accumulator circuits |
US6978426B2 (en) * | 2002-04-10 | 2005-12-20 | Broadcom Corporation | Low-error fixed-width modified booth multiplier |
US11467830B2 (en) * | 2021-01-29 | 2022-10-11 | Arm Limited | Method of testing one or more compute units |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4153938A (en) * | 1977-08-18 | 1979-05-08 | Monolithic Memories Inc. | High speed combinatorial digital multiplier |
US4539635A (en) * | 1980-02-11 | 1985-09-03 | At&T Bell Laboratories | Pipelined digital processor arranged for conditional operation |
US4507727A (en) * | 1982-02-11 | 1985-03-26 | Texas Instruments Incorporated | Microcomputer with ROM test mode of operation |
US4677586A (en) * | 1985-06-04 | 1987-06-30 | Texas Instruments Incorporated | Microcomputer device having test mode substituting external RAM for internal RAM |
-
1987
- 1987-01-29 NL NL8700216A patent/NL8700216A/nl not_active Application Discontinuation
- 1987-12-30 DE DE8787202655T patent/DE3779612D1/de not_active Expired - Lifetime
- 1987-12-30 EP EP87202655A patent/EP0276520B1/en not_active Expired - Lifetime
-
1988
- 1988-01-15 US US07/144,294 patent/US4866715A/en not_active Expired - Fee Related
- 1988-01-26 JP JP63013727A patent/JPS63195730A/ja active Pending
- 1988-01-28 KR KR1019880000681A patent/KR880009301A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
US4866715A (en) | 1989-09-12 |
KR880009301A (ko) | 1988-09-14 |
EP0276520A1 (en) | 1988-08-03 |
JPS63195730A (ja) | 1988-08-12 |
DE3779612D1 (de) | 1992-07-09 |
EP0276520B1 (en) | 1992-06-03 |
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Legal Events
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A1B | A search report has been drawn up | ||
BV | The patent application has lapsed |