DE3779612D1 - Verfahren zum testen eines modifizierten booth-multiplizierers, modifizierter booth-multiplizierer, geeignet zum testen mittels dieses verfahrens, und denselben enthaltende integrierte schaltung. - Google Patents

Verfahren zum testen eines modifizierten booth-multiplizierers, modifizierter booth-multiplizierer, geeignet zum testen mittels dieses verfahrens, und denselben enthaltende integrierte schaltung.

Info

Publication number
DE3779612D1
DE3779612D1 DE8787202655T DE3779612T DE3779612D1 DE 3779612 D1 DE3779612 D1 DE 3779612D1 DE 8787202655 T DE8787202655 T DE 8787202655T DE 3779612 T DE3779612 T DE 3779612T DE 3779612 D1 DE3779612 D1 DE 3779612D1
Authority
DE
Germany
Prior art keywords
testing
modified booth
booth multiplier
integrated circuit
same
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787202655T
Other languages
English (en)
Inventor
Meerbergen Jozef Louis Van
Franciscus Petrus Mari Beenker
Luc Leo Ghislain Matterne
Josephus Antonius Huisken
Rudi Josephine Jaak Stans
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of DE3779612D1 publication Critical patent/DE3779612D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00Methods or arrangements for processing data by operating upon the order or content of the data handled
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/38Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation
    • G06F7/48Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
    • G06F7/52Multiplying; Dividing
    • G06F7/523Multiplying only
    • G06F7/533Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even
    • G06F7/5334Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even by using multiple bit scanning, i.e. by decoding groups of successive multiplier bits in order to select an appropriate precalculated multiple of the multiplicand as a partial product
    • G06F7/5336Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even by using multiple bit scanning, i.e. by decoding groups of successive multiplier bits in order to select an appropriate precalculated multiple of the multiplicand as a partial product overlapped, i.e. with successive bitgroups sharing one or more bits being recoded into signed digit representation, e.g. using the Modified Booth Algorithm
    • G06F7/5338Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even by using multiple bit scanning, i.e. by decoding groups of successive multiplier bits in order to select an appropriate precalculated multiple of the multiplicand as a partial product overlapped, i.e. with successive bitgroups sharing one or more bits being recoded into signed digit representation, e.g. using the Modified Booth Algorithm each bitgroup having two new bits, e.g. 2nd order MBA
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2226Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test ALU
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/851Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector the connector being supplied to the parts to be connected in the bonding apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01019Potassium [K]

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Optimization (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Pure & Applied Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)
  • Complex Calculations (AREA)
DE8787202655T 1987-01-29 1987-12-30 Verfahren zum testen eines modifizierten booth-multiplizierers, modifizierter booth-multiplizierer, geeignet zum testen mittels dieses verfahrens, und denselben enthaltende integrierte schaltung. Expired - Lifetime DE3779612D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8700216A NL8700216A (nl) 1987-01-29 1987-01-29 Werkwijze voor het testen van een gemodificeerde boothmultiplicator, gemodificeerde boothmultiplicator, geschikt om volgens deze werkwijze te worden getest, en geintegreerde schakeling, voorzien van een dergelijke gemodificeerde boothmultiplicator.

Publications (1)

Publication Number Publication Date
DE3779612D1 true DE3779612D1 (de) 1992-07-09

Family

ID=19849490

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787202655T Expired - Lifetime DE3779612D1 (de) 1987-01-29 1987-12-30 Verfahren zum testen eines modifizierten booth-multiplizierers, modifizierter booth-multiplizierer, geeignet zum testen mittels dieses verfahrens, und denselben enthaltende integrierte schaltung.

Country Status (6)

Country Link
US (1) US4866715A (de)
EP (1) EP0276520B1 (de)
JP (1) JPS63195730A (de)
KR (1) KR880009301A (de)
DE (1) DE3779612D1 (de)
NL (1) NL8700216A (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04147334A (ja) * 1990-10-09 1992-05-20 Matsushita Electric Ind Co Ltd 乗算器と乗算器のテスト方式
US5218564A (en) * 1991-06-07 1993-06-08 National Semiconductor Corporation Layout efficient 32-bit shifter/register with 16-bit interface
FR2722590B1 (fr) * 1994-07-15 1996-09-06 Sgs Thomson Microelectronics Circuit logique de multiplication parallele
JPH08152994A (ja) * 1994-11-29 1996-06-11 Mitsubishi Electric Corp 乗算器及びディジタルフィルタ
US5600658A (en) * 1995-10-19 1997-02-04 National Semiconductor Corporation Built-in self tests for large multiplier, adder, or subtractor
KR100362186B1 (ko) * 1995-12-29 2003-03-28 주식회사 하이닉스반도체 멀티플렉서를이용한직렬부스승산기
US5960009A (en) * 1996-08-09 1999-09-28 Lucent Technologies Inc. Built in shelf test method and apparatus for booth multipliers
US6571268B1 (en) 1998-10-06 2003-05-27 Texas Instruments Incorporated Multiplier accumulator circuits
US6978426B2 (en) * 2002-04-10 2005-12-20 Broadcom Corporation Low-error fixed-width modified booth multiplier
US11467830B2 (en) * 2021-01-29 2022-10-11 Arm Limited Method of testing one or more compute units

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4153938A (en) * 1977-08-18 1979-05-08 Monolithic Memories Inc. High speed combinatorial digital multiplier
US4539635A (en) * 1980-02-11 1985-09-03 At&T Bell Laboratories Pipelined digital processor arranged for conditional operation
US4507727A (en) * 1982-02-11 1985-03-26 Texas Instruments Incorporated Microcomputer with ROM test mode of operation
US4677586A (en) * 1985-06-04 1987-06-30 Texas Instruments Incorporated Microcomputer device having test mode substituting external RAM for internal RAM

Also Published As

Publication number Publication date
US4866715A (en) 1989-09-12
NL8700216A (nl) 1988-08-16
JPS63195730A (ja) 1988-08-12
EP0276520B1 (de) 1992-06-03
EP0276520A1 (de) 1988-08-03
KR880009301A (ko) 1988-09-14

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Legal Events

Date Code Title Description
8332 No legal effect for de