DE3779612D1 - Verfahren zum testen eines modifizierten booth-multiplizierers, modifizierter booth-multiplizierer, geeignet zum testen mittels dieses verfahrens, und denselben enthaltende integrierte schaltung. - Google Patents
Verfahren zum testen eines modifizierten booth-multiplizierers, modifizierter booth-multiplizierer, geeignet zum testen mittels dieses verfahrens, und denselben enthaltende integrierte schaltung.Info
- Publication number
- DE3779612D1 DE3779612D1 DE8787202655T DE3779612T DE3779612D1 DE 3779612 D1 DE3779612 D1 DE 3779612D1 DE 8787202655 T DE8787202655 T DE 8787202655T DE 3779612 T DE3779612 T DE 3779612T DE 3779612 D1 DE3779612 D1 DE 3779612D1
- Authority
- DE
- Germany
- Prior art keywords
- testing
- modified booth
- booth multiplier
- integrated circuit
- same
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
- G06F7/38—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation
- G06F7/48—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
- G06F7/52—Multiplying; Dividing
- G06F7/523—Multiplying only
- G06F7/533—Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even
- G06F7/5334—Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even by using multiple bit scanning, i.e. by decoding groups of successive multiplier bits in order to select an appropriate precalculated multiple of the multiplicand as a partial product
- G06F7/5336—Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even by using multiple bit scanning, i.e. by decoding groups of successive multiplier bits in order to select an appropriate precalculated multiple of the multiplicand as a partial product overlapped, i.e. with successive bitgroups sharing one or more bits being recoded into signed digit representation, e.g. using the Modified Booth Algorithm
- G06F7/5338—Reduction of the number of iteration steps or stages, e.g. using the Booth algorithm, log-sum, odd-even by using multiple bit scanning, i.e. by decoding groups of successive multiplier bits in order to select an appropriate precalculated multiple of the multiplicand as a partial product overlapped, i.e. with successive bitgroups sharing one or more bits being recoded into signed digit representation, e.g. using the Modified Booth Algorithm each bitgroup having two new bits, e.g. 2nd order MBA
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2226—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test ALU
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/851—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector the connector being supplied to the parts to be connected in the bonding apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01019—Potassium [K]
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Optimization (AREA)
- Computational Mathematics (AREA)
- Mathematical Analysis (AREA)
- Pure & Applied Mathematics (AREA)
- Quality & Reliability (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- Tests Of Electronic Circuits (AREA)
- Compression, Expansion, Code Conversion, And Decoders (AREA)
- Complex Calculations (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8700216A NL8700216A (nl) | 1987-01-29 | 1987-01-29 | Werkwijze voor het testen van een gemodificeerde boothmultiplicator, gemodificeerde boothmultiplicator, geschikt om volgens deze werkwijze te worden getest, en geintegreerde schakeling, voorzien van een dergelijke gemodificeerde boothmultiplicator. |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3779612D1 true DE3779612D1 (de) | 1992-07-09 |
Family
ID=19849490
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8787202655T Expired - Lifetime DE3779612D1 (de) | 1987-01-29 | 1987-12-30 | Verfahren zum testen eines modifizierten booth-multiplizierers, modifizierter booth-multiplizierer, geeignet zum testen mittels dieses verfahrens, und denselben enthaltende integrierte schaltung. |
Country Status (6)
Country | Link |
---|---|
US (1) | US4866715A (de) |
EP (1) | EP0276520B1 (de) |
JP (1) | JPS63195730A (de) |
KR (1) | KR880009301A (de) |
DE (1) | DE3779612D1 (de) |
NL (1) | NL8700216A (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04147334A (ja) * | 1990-10-09 | 1992-05-20 | Matsushita Electric Ind Co Ltd | 乗算器と乗算器のテスト方式 |
US5218564A (en) * | 1991-06-07 | 1993-06-08 | National Semiconductor Corporation | Layout efficient 32-bit shifter/register with 16-bit interface |
FR2722590B1 (fr) * | 1994-07-15 | 1996-09-06 | Sgs Thomson Microelectronics | Circuit logique de multiplication parallele |
JPH08152994A (ja) * | 1994-11-29 | 1996-06-11 | Mitsubishi Electric Corp | 乗算器及びディジタルフィルタ |
US5600658A (en) * | 1995-10-19 | 1997-02-04 | National Semiconductor Corporation | Built-in self tests for large multiplier, adder, or subtractor |
KR100362186B1 (ko) * | 1995-12-29 | 2003-03-28 | 주식회사 하이닉스반도체 | 멀티플렉서를이용한직렬부스승산기 |
US5960009A (en) * | 1996-08-09 | 1999-09-28 | Lucent Technologies Inc. | Built in shelf test method and apparatus for booth multipliers |
US6571268B1 (en) | 1998-10-06 | 2003-05-27 | Texas Instruments Incorporated | Multiplier accumulator circuits |
US6978426B2 (en) * | 2002-04-10 | 2005-12-20 | Broadcom Corporation | Low-error fixed-width modified booth multiplier |
US11467830B2 (en) * | 2021-01-29 | 2022-10-11 | Arm Limited | Method of testing one or more compute units |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4153938A (en) * | 1977-08-18 | 1979-05-08 | Monolithic Memories Inc. | High speed combinatorial digital multiplier |
US4539635A (en) * | 1980-02-11 | 1985-09-03 | At&T Bell Laboratories | Pipelined digital processor arranged for conditional operation |
US4507727A (en) * | 1982-02-11 | 1985-03-26 | Texas Instruments Incorporated | Microcomputer with ROM test mode of operation |
US4677586A (en) * | 1985-06-04 | 1987-06-30 | Texas Instruments Incorporated | Microcomputer device having test mode substituting external RAM for internal RAM |
-
1987
- 1987-01-29 NL NL8700216A patent/NL8700216A/nl not_active Application Discontinuation
- 1987-12-30 EP EP87202655A patent/EP0276520B1/de not_active Expired - Lifetime
- 1987-12-30 DE DE8787202655T patent/DE3779612D1/de not_active Expired - Lifetime
-
1988
- 1988-01-15 US US07/144,294 patent/US4866715A/en not_active Expired - Fee Related
- 1988-01-26 JP JP63013727A patent/JPS63195730A/ja active Pending
- 1988-01-28 KR KR1019880000681A patent/KR880009301A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
US4866715A (en) | 1989-09-12 |
NL8700216A (nl) | 1988-08-16 |
JPS63195730A (ja) | 1988-08-12 |
EP0276520B1 (de) | 1992-06-03 |
EP0276520A1 (de) | 1988-08-03 |
KR880009301A (ko) | 1988-09-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE3783593D1 (de) | Verfahren zum betreiben eines analysiergeraets. | |
DE58909461D1 (de) | Verfahren zum Prüfen von Blattmaterial. | |
DE3871877D1 (de) | Verfahren zum anbringen eines orthodontischen hilfsstuecks. | |
DE69109935D1 (de) | Verfahren zum Überprüfen von Abdrücken. | |
DE3785978D1 (de) | Geraet zum feststellen der raeumlichen anordnung eines elektronischen bauteils. | |
DE3779181D1 (de) | Apparat zum verbinden von metallischen baendern. | |
DE69000582D1 (de) | Verfahren zum lackieren eines gegenstandes und nach dem verfahren hergestellter gegenstand. | |
ATE96523T1 (de) | Verfahren zum schnellen und dichten verbinden von rohren. | |
DE3675926D1 (de) | Vorrichtung zum lenken eines flugkoerpers. | |
DE3581118D1 (de) | Verfahren zum genauen bestimmen der lage von traegerblechen in dampfgeneratoren. | |
DE69110824D1 (de) | Vorrichtung zum auftragen von lötflussmitteln. | |
DE58909277D1 (de) | Vorrichtung zum Prüfen von Zigaretten. | |
DE3680512D1 (de) | Verfahren zum beziehen eines innenausstattungsteiles. | |
DE58904087D1 (de) | Verfahren zum interpolieren von positionsmesssignalen. | |
DE3779612D1 (de) | Verfahren zum testen eines modifizierten booth-multiplizierers, modifizierter booth-multiplizierer, geeignet zum testen mittels dieses verfahrens, und denselben enthaltende integrierte schaltung. | |
DE58902702D1 (de) | Verfahren zum aufbringen von phosphatueberzuegen. | |
DE58900881D1 (de) | Verfahren zum aufbringen von konversionsueberzuegen. | |
DE68913034D1 (de) | Anordnung zum Anzeigen der Restladung eines Akkumulators. | |
DE69101150D1 (de) | Verfahren zum Lokalisieren eines Fehlers. | |
DE58901845D1 (de) | Verfahren zum festlegen. | |
DE3750397D1 (de) | Verfahren zum testen von körperflüssigkeiten. | |
DE68915189D1 (de) | Verfahren zum Fleckenabweisendmachen von Polyamidmaterialien. | |
DE3854232D1 (de) | Verfahren zum verbessern eines bildelements. | |
DE69021159D1 (de) | Verfahren zum immunochemischen Bestimmen von Haptenen. | |
DE68902514D1 (de) | Verfahren zum endbearbeiten der zwei gegenueberliegenden kanten eines werkstueckes und vorrichtung zum ausfuehren dieses verfahrens. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |