NL2010679A - Lithographic apparatus and device manufacturing method. - Google Patents

Lithographic apparatus and device manufacturing method. Download PDF

Info

Publication number
NL2010679A
NL2010679A NL2010679A NL2010679A NL2010679A NL 2010679 A NL2010679 A NL 2010679A NL 2010679 A NL2010679 A NL 2010679A NL 2010679 A NL2010679 A NL 2010679A NL 2010679 A NL2010679 A NL 2010679A
Authority
NL
Netherlands
Prior art keywords
substrate
actuator
substrate table
positioning member
positioning
Prior art date
Application number
NL2010679A
Other languages
English (en)
Dutch (nl)
Inventor
Yang-Shan Huang
Theodorus Petrus Maria Cadee
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of NL2010679A publication Critical patent/NL2010679A/en

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70716—Stages
    • G03F7/70725—Stages control
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70758—Drive means, e.g. actuators, motors for long- or short-stroke modules or fine or coarse driving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
NL2010679A 2012-05-23 2013-04-22 Lithographic apparatus and device manufacturing method. NL2010679A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261650708P 2012-05-23 2012-05-23
US201261650708 2012-05-23

Publications (1)

Publication Number Publication Date
NL2010679A true NL2010679A (en) 2013-11-26

Family

ID=49621357

Family Applications (1)

Application Number Title Priority Date Filing Date
NL2010679A NL2010679A (en) 2012-05-23 2013-04-22 Lithographic apparatus and device manufacturing method.

Country Status (3)

Country Link
US (2) US9261798B2 (enExample)
JP (2) JP5513658B2 (enExample)
NL (1) NL2010679A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL2010679A (en) 2012-05-23 2013-11-26 Asml Netherlands Bv Lithographic apparatus and device manufacturing method.
CN105470186B (zh) * 2015-12-11 2019-02-15 中国电子科技集团公司第四十八研究所 用于反应室内旋转石墨盘精确定位系统
CN108700828B (zh) * 2016-02-25 2020-09-15 Asml荷兰有限公司 致动器系统和光刻设备
US11156924B2 (en) 2018-08-23 2021-10-26 Asml Netherlands B.V. Substrate support, lithographic apparatus, substrate inspection apparatus, device manufacturing method
WO2026018233A1 (en) * 2024-07-14 2026-01-22 Carl Zeiss Sms Ltd. Extreme ultraviolet mask inspection – laser interferometer optical alignment

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JPH10209030A (ja) * 1997-01-20 1998-08-07 Nikon Corp 投影露光方法及び投影露光装置
JPH1169764A (ja) * 1997-08-21 1999-03-09 Nikon Corp 位置決め装置及び該装置を備えた露光装置
JP2001313241A (ja) 2000-04-28 2001-11-09 Canon Inc 露光装置および露光方法
TWI307526B (en) * 2002-08-06 2009-03-11 Nikon Corp Supporting device and the mamufacturing method thereof, stage device and exposure device
JP2004087593A (ja) * 2002-08-23 2004-03-18 Nikon Corp ステージ装置および露光装置
JP4307872B2 (ja) * 2003-03-18 2009-08-05 オリンパス株式会社 基板検査装置
TWI295414B (en) * 2003-05-13 2008-04-01 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
JP4266713B2 (ja) * 2003-06-03 2009-05-20 キヤノン株式会社 位置決め装置及び露光装置
ATE489567T1 (de) 2003-09-05 2010-12-15 Koninkl Philips Electronics Nv Stellgliedanordnung für aktive schwingungsisolierung mit einer trägheitsbezugsmasse
US7486381B2 (en) * 2004-05-21 2009-02-03 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
WO2005124832A1 (ja) * 2004-06-17 2005-12-29 Nikon Corporation 露光装置
US7440081B2 (en) 2004-11-05 2008-10-21 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method, and substrate table
US7442476B2 (en) * 2004-12-27 2008-10-28 Asml Netherlands B.V. Method and system for 3D alignment in wafer scale integration
JP4699071B2 (ja) * 2005-04-01 2011-06-08 株式会社安川電機 ステージ装置およびその露光装置
US20070236854A1 (en) * 2006-04-11 2007-10-11 Lee Martin E Anti-Gravity Device for Supporting Weight and Reducing Transmissibility
JP2007331041A (ja) * 2006-06-13 2007-12-27 Hitachi High-Technologies Corp 平板状ワークの作業装置
US20080067968A1 (en) * 2006-09-12 2008-03-20 Nikon Corporation Identifying and compensating force-ripple and side-forces produced by linear actuators
KR101391025B1 (ko) * 2006-09-29 2014-04-30 가부시키가이샤 니콘 이동체 시스템, 패턴 형성 장치, 노광 장치 및 노광 방법, 그리고 디바이스 제조 방법
JP2008147411A (ja) * 2006-12-08 2008-06-26 Canon Inc 露光装置及びデバイス製造方法
WO2008108148A1 (ja) * 2007-03-06 2008-09-12 Kabushiki Kaisha Yaskawa Denki 精密位置決め装置
JP2009038258A (ja) * 2007-08-02 2009-02-19 Canon Inc 露光装置及びデバイス製造方法
KR20100096097A (ko) * 2007-10-19 2010-09-01 코닌클리케 필립스 일렉트로닉스 엔.브이. 정밀 위치 측정의 변위 디바이스
JP5241276B2 (ja) * 2008-03-10 2013-07-17 キヤノン株式会社 露光装置
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JP2010245300A (ja) * 2009-04-06 2010-10-28 Canon Inc 駆動装置、露光装置およびデバイス製造方法
TW201100975A (en) * 2009-04-21 2011-01-01 Nikon Corp Moving-object apparatus, exposure apparatus, exposure method, and device manufacturing method
US20110042874A1 (en) 2009-08-20 2011-02-24 Nikon Corporation Object processing apparatus, exposure apparatus and exposure method, and device manufacturing method
NL2010679A (en) 2012-05-23 2013-11-26 Asml Netherlands Bv Lithographic apparatus and device manufacturing method.

Also Published As

Publication number Publication date
US9811005B2 (en) 2017-11-07
JP2013247358A (ja) 2013-12-09
JP6228878B2 (ja) 2017-11-08
JP5513658B2 (ja) 2014-06-04
US20160154322A1 (en) 2016-06-02
US9261798B2 (en) 2016-02-16
US20130314684A1 (en) 2013-11-28
JP2014123778A (ja) 2014-07-03

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WDAP Patent application withdrawn

Effective date: 20141105