NL1034483A1 - Systeem en werkwijze voor verbeteren van immersiescanner-overlayprestatievermogen. - Google Patents
Systeem en werkwijze voor verbeteren van immersiescanner-overlayprestatievermogen.Info
- Publication number
- NL1034483A1 NL1034483A1 NL1034483A NL1034483A NL1034483A1 NL 1034483 A1 NL1034483 A1 NL 1034483A1 NL 1034483 A NL1034483 A NL 1034483A NL 1034483 A NL1034483 A NL 1034483A NL 1034483 A1 NL1034483 A1 NL 1034483A1
- Authority
- NL
- Netherlands
- Prior art keywords
- immersion scanner
- overlay performance
- scanner overlay
- improving immersion
- improving
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
- G03F7/70875—Temperature, e.g. temperature control of masks or workpieces via control of stage temperature
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70783—Handling stress or warp of chucks, masks or workpieces, e.g. to compensate for imaging errors or considerations related to warpage of masks or workpieces due to their own weight
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US86819106P | 2006-12-01 | 2006-12-01 | |
US86819106 | 2006-12-01 | ||
US67794907 | 2007-02-22 | ||
US11/677,949 US8068208B2 (en) | 2006-12-01 | 2007-02-22 | System and method for improving immersion scanner overlay performance |
Publications (2)
Publication Number | Publication Date |
---|---|
NL1034483A1 true NL1034483A1 (nl) | 2008-06-03 |
NL1034483C2 NL1034483C2 (nl) | 2009-10-20 |
Family
ID=39363328
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL1034483A NL1034483C2 (nl) | 2006-12-01 | 2007-10-05 | Systeem en werkwijze voor verbeteren van immersiescanner-overlayprestatievermogen. |
Country Status (4)
Country | Link |
---|---|
US (2) | US8068208B2 (nl) |
DE (1) | DE102007044633B4 (nl) |
NL (1) | NL1034483C2 (nl) |
TW (1) | TWI456353B (nl) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8705010B2 (en) | 2007-07-13 | 2014-04-22 | Mapper Lithography Ip B.V. | Lithography system, method of clamping and wafer table |
TWI541615B (zh) | 2007-07-13 | 2016-07-11 | 瑪波微影Ip公司 | 在微影裝置中交換晶圓的方法 |
NL2005874A (en) | 2010-01-22 | 2011-07-25 | Asml Netherlands Bv | A lithographic apparatus and a device manufacturing method. |
US10191396B2 (en) | 2014-06-19 | 2019-01-29 | Asml Netherlands B.V. | Lithographic apparatus, object positioning system and device manufacturing method |
WO2016066392A1 (en) * | 2014-10-28 | 2016-05-06 | Asml Netherlands B.V. | Component for a lithography tool, lithography apparatus, inspection tool and a method of manufacturing a device |
US9793183B1 (en) | 2016-07-29 | 2017-10-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method for measuring and improving overlay using electronic microscopic imaging and digital processing |
US10043650B2 (en) | 2016-09-22 | 2018-08-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and system for wet chemical bath process |
US10522385B2 (en) | 2017-09-26 | 2019-12-31 | Taiwan Semiconductor Manufacturing Co., Ltd. | Wafer table with dynamic support pins |
US11054742B2 (en) | 2018-06-15 | 2021-07-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | EUV metallic resist performance enhancement via additives |
US11069526B2 (en) | 2018-06-27 | 2021-07-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | Using a self-assembly layer to facilitate selective formation of an etching stop layer |
US10867805B2 (en) | 2018-06-29 | 2020-12-15 | Taiwan Semiconductor Manufacturing Co., Ltd. | Selective removal of an etching stop layer for improving overlay shift tolerance |
KR20210023102A (ko) | 2019-08-22 | 2021-03-04 | (주)아모레퍼시픽 | 눈썹 또는 속눈썹 성장 촉진용 조성물 |
IL307450A (en) * | 2021-04-21 | 2023-12-01 | Asml Netherlands Bv | Temperature conditioning system, lithographic device and object temperature conditioning method |
EP4102297A1 (en) * | 2021-06-10 | 2022-12-14 | ASML Netherlands B.V. | Temperature conditioning system, a lithographic apparatus and a method of temperature conditioning an object |
Family Cites Families (27)
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US3648458A (en) * | 1970-07-28 | 1972-03-14 | Roy E Mcalister | Vapor pressurized hydrostatic drive |
US4000626A (en) * | 1975-02-27 | 1977-01-04 | Webber Robert C | Liquid convection fluid heat exchanger for refrigeration circuit |
JPH01152639A (ja) * | 1987-12-10 | 1989-06-15 | Canon Inc | 吸着保持装置 |
EP0363098B1 (en) * | 1988-10-03 | 1995-04-05 | Canon Kabushiki Kaisha | Temperature controlling device |
US5435379A (en) * | 1992-08-14 | 1995-07-25 | Texas Instruments Incorporated | Method and apparatus for low-temperature semiconductor processing |
JP3475973B2 (ja) * | 1994-12-14 | 2003-12-10 | 株式会社ニコン | リニアモータ、ステージ装置、及び露光装置 |
JP3276553B2 (ja) * | 1995-01-19 | 2002-04-22 | 東京エレクトロン株式会社 | 処理装置及び処理方法 |
US5885134A (en) * | 1996-04-18 | 1999-03-23 | Ebara Corporation | Polishing apparatus |
US5998889A (en) * | 1996-12-10 | 1999-12-07 | Nikon Corporation | Electro-magnetic motor cooling system |
JPH10270535A (ja) * | 1997-03-25 | 1998-10-09 | Nikon Corp | 移動ステージ装置、及び該ステージ装置を用いた回路デバイス製造方法 |
JPH11307430A (ja) * | 1998-04-23 | 1999-11-05 | Canon Inc | 露光装置およびデバイス製造方法ならびに駆動装置 |
TWI284785B (en) * | 2002-04-24 | 2007-08-01 | Nikon Corp | Exposure system and device manufacturing method |
US7235483B2 (en) * | 2002-11-19 | 2007-06-26 | Blue29 Llc | Method of electroless deposition of thin metal and dielectric films with temperature controlled stages of film growth |
EP2261742A3 (en) | 2003-06-11 | 2011-05-25 | ASML Netherlands BV | Lithographic apparatus and device manufacturing method. |
KR101523180B1 (ko) * | 2003-09-03 | 2015-05-26 | 가부시키가이샤 니콘 | 액침 리소그래피용 유체를 제공하기 위한 장치 및 방법 |
SG144907A1 (en) * | 2003-09-29 | 2008-08-28 | Nikon Corp | Liquid immersion type lens system, projection exposure apparatus, and device fabricating method |
US7250237B2 (en) * | 2003-12-23 | 2007-07-31 | Asml Netherlands B.V. | Optimized correction of wafer thermal deformations in a lithographic process |
JP4429023B2 (ja) * | 2004-01-07 | 2010-03-10 | キヤノン株式会社 | 露光装置及びデバイス製造方法 |
KR101135232B1 (ko) * | 2004-01-20 | 2012-04-12 | 칼 짜이스 에스엠테 게엠베하 | 마이크로 리소그래픽 투영 노광 장치 |
US8208119B2 (en) * | 2004-02-04 | 2012-06-26 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
JP2006005061A (ja) * | 2004-06-16 | 2006-01-05 | Canon Inc | 冷却媒体貯蔵用タンク |
US7304715B2 (en) * | 2004-08-13 | 2007-12-04 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
JP2006222165A (ja) * | 2005-02-08 | 2006-08-24 | Canon Inc | 露光装置 |
EP1713155B1 (en) | 2005-04-12 | 2012-10-17 | DET International Holding Limited | Power supply arrangement |
US7667822B2 (en) * | 2006-02-14 | 2010-02-23 | Asml Netherlands B.V. | Lithographic apparatus and stage apparatus |
US7602471B2 (en) * | 2006-05-17 | 2009-10-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Apparatus and method for particle monitoring in immersion lithography |
US7804582B2 (en) * | 2006-07-28 | 2010-09-28 | Asml Netherlands B.V. | Lithographic apparatus, method of calibrating a lithographic apparatus and device manufacturing method |
-
2007
- 2007-02-22 US US11/677,949 patent/US8068208B2/en not_active Expired - Fee Related
- 2007-09-04 TW TW096132866A patent/TWI456353B/zh not_active IP Right Cessation
- 2007-09-19 DE DE102007044633.2A patent/DE102007044633B4/de active Active
- 2007-10-05 NL NL1034483A patent/NL1034483C2/nl active Search and Examination
-
2011
- 2011-11-03 US US13/288,133 patent/US8199314B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE102007044633B4 (de) | 2014-01-09 |
TWI456353B (zh) | 2014-10-11 |
US8199314B2 (en) | 2012-06-12 |
US20120045192A1 (en) | 2012-02-23 |
TW200825633A (en) | 2008-06-16 |
US8068208B2 (en) | 2011-11-29 |
DE102007044633A1 (de) | 2008-06-12 |
US20080129969A1 (en) | 2008-06-05 |
NL1034483C2 (nl) | 2009-10-20 |
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Legal Events
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AD1A | A request for search or an international type search has been filed | ||
RD2N | Patents in respect of which a decision has been taken or a report has been made (novelty report) |
Effective date: 20090618 |
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PD2B | A search report has been drawn up |