MY157709A - Article sorting apparatus - Google Patents
Article sorting apparatusInfo
- Publication number
- MY157709A MY157709A MYPI2011001529A MYPI2011001529A MY157709A MY 157709 A MY157709 A MY 157709A MY PI2011001529 A MYPI2011001529 A MY PI2011001529A MY PI2011001529 A MYPI2011001529 A MY PI2011001529A MY 157709 A MY157709 A MY 157709A
- Authority
- MY
- Malaysia
- Prior art keywords
- sorting
- tray
- articles
- stocker
- empty
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/02—Feeding of components
- H05K13/021—Loading or unloading of containers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/0452—Mounting machines or lines comprising a plurality of tools for guiding different components to the same mounting place
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
- G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Optics & Photonics (AREA)
- Environmental & Geological Engineering (AREA)
- Sorting Of Articles (AREA)
- Stacking Of Articles And Auxiliary Devices (AREA)
- Specific Conveyance Elements (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Branching, Merging, And Special Transfer Between Conveyors (AREA)
- Warehouses Or Storage Devices (AREA)
Abstract
A STOCKER (5) CONSTITUTING AN ARTICLE SORTING APPARATUS (2) INCLUDES FIRST TO FIFTH SLIDING BOARDS (21A TO 21E) ON WHICH THE SORTING TRAYS (4) ARE PLACED IN MULTIPLE ALIGNMENT, AND A DRIVING MEANS (22) VERTICALLY HOLDING THE SLIDING BOARDS OF MULTIPLE STAGES AND RECIPROCATING EACH OF THE SLIDING BOARDS IN A HORIZONTAL DIRECTION. FURTHER, EMPTY TRAY SUPPLY MEANS (7) IS PROVIDED AT A POSITION ADJACENT TO THE STOCKER. WHEN THE FIRST TRANSFER MEANS (6) TRANSFERS AN LED ELEMENT (1) TO A CORRESPONDING SORTING TRAY IN ACCORDANCE WITH A RANK, THE STOCKER MOVES THE SLIDING BOARD SO THAT THE SORTING TRAY CORRESPONDING TO THE ARTICLE IS EXPOSED. WHEN A PREDETERMINED NUMBER OF ARTICLES IS ACCOMMODATED IN THE REQUIRED SORTING TRAY, THE FIRST TRANSFER MEANS PILES AN EMPTY SORTING TRAY HELD BY THE EMPTY TRAY SUPPLY MEANS ON THE SORTING TRAY ACCOMMODATING THE PREDETERMINE NUMBER OF THE ARTICLES. THE ARTICLES CAN BE SORTED INTO A NUMBER OF CLASSIFICATIONS REGARDLESS SPACE SAVING, AND AN EXCELLENT OPERATING EFFICIENCY CAN BE OBTAINED.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010096680A JP5589525B2 (en) | 2010-04-20 | 2010-04-20 | Article classification device |
Publications (1)
Publication Number | Publication Date |
---|---|
MY157709A true MY157709A (en) | 2016-07-15 |
Family
ID=45006037
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MYPI2011001529A MY157709A (en) | 2010-04-20 | 2011-04-06 | Article sorting apparatus |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5589525B2 (en) |
KR (1) | KR101776855B1 (en) |
CN (1) | CN102259095B (en) |
MY (1) | MY157709A (en) |
TW (1) | TWI500940B (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5950183B2 (en) * | 2012-01-24 | 2016-07-13 | 澁谷工業株式会社 | Article inspection apparatus and article classification apparatus provided with the article inspection apparatus |
CN102785798A (en) * | 2012-04-07 | 2012-11-21 | 杭州中为光电技术股份有限公司 | Method for using blanking barrel of high-capacity light-emitting diode (LED) sorting machine |
CN103121014B (en) * | 2013-02-27 | 2015-09-02 | 上海轩田工业设备有限公司 | A kind of lens quality automatic checkout equipment with automatic sorting mechanism |
TWI588074B (en) * | 2016-10-24 | 2017-06-21 | Automatic material storage machine for storage equipment | |
CN108840076A (en) * | 2018-08-08 | 2018-11-20 | 苏州精濑光电有限公司 | A kind of classification stacking device |
TWI744665B (en) * | 2019-07-12 | 2021-11-01 | 威光自動化科技股份有限公司 | Method and device for automatically sorting and collecting plate parts |
CN110733688A (en) * | 2019-10-22 | 2020-01-31 | 芯思杰技术(深圳)股份有限公司 | device packaging equipment |
CN110733689A (en) * | 2019-10-22 | 2020-01-31 | 芯思杰技术(深圳)股份有限公司 | device packaging equipment |
CN111203398B (en) * | 2020-02-28 | 2022-07-12 | 清陶(昆山)自动化装备有限公司 | Battery detection grading system |
JP7430154B2 (en) * | 2021-03-29 | 2024-02-09 | Towa株式会社 | Processing equipment and method for manufacturing processed products |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57211746A (en) * | 1981-06-23 | 1982-12-25 | Fujitsu Ltd | Wafer conveying apparatus |
JP3739844B2 (en) * | 1995-12-19 | 2006-01-25 | 株式会社アドバンテスト | Stocker section of handler device |
JP3644567B2 (en) * | 1997-04-08 | 2005-04-27 | 株式会社アドバンテスト | Handler tray transfer device |
JP4171119B2 (en) * | 1998-11-25 | 2008-10-22 | 株式会社アドバンテスト | Tray holding device, component handling device, and component classification method |
JP2000206191A (en) * | 1999-01-11 | 2000-07-28 | Advantest Corp | Test device of electronic component board |
JP2002255315A (en) * | 2001-02-26 | 2002-09-11 | Ando Electric Co Ltd | Tray accommodation device |
JP4401616B2 (en) * | 2002-03-14 | 2010-01-20 | ヤマハ発動機株式会社 | Electronic component inspection equipment |
JP4028263B2 (en) * | 2002-03-15 | 2007-12-26 | ヤマハ発動機株式会社 | Parts storage device |
CN201143504Y (en) * | 2007-10-18 | 2008-11-05 | 南京熊猫仪器仪表有限公司 | Device for arraying, sorting and overlapping SMD components |
-
2010
- 2010-04-20 JP JP2010096680A patent/JP5589525B2/en active Active
-
2011
- 2011-04-06 MY MYPI2011001529A patent/MY157709A/en unknown
- 2011-04-11 TW TW100112385A patent/TWI500940B/en active
- 2011-04-19 KR KR1020110036005A patent/KR101776855B1/en active IP Right Grant
- 2011-04-20 CN CN201110098447.3A patent/CN102259095B/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP5589525B2 (en) | 2014-09-17 |
TW201202110A (en) | 2012-01-16 |
KR101776855B1 (en) | 2017-09-08 |
CN102259095B (en) | 2014-08-20 |
TWI500940B (en) | 2015-09-21 |
KR20110117005A (en) | 2011-10-26 |
JP2011226905A (en) | 2011-11-10 |
CN102259095A (en) | 2011-11-30 |
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