MY157709A - Article sorting apparatus - Google Patents

Article sorting apparatus

Info

Publication number
MY157709A
MY157709A MYPI2011001529A MYPI2011001529A MY157709A MY 157709 A MY157709 A MY 157709A MY PI2011001529 A MYPI2011001529 A MY PI2011001529A MY PI2011001529 A MYPI2011001529 A MY PI2011001529A MY 157709 A MY157709 A MY 157709A
Authority
MY
Malaysia
Prior art keywords
sorting
tray
articles
stocker
empty
Prior art date
Application number
MYPI2011001529A
Inventor
Shunichi Hori
Original Assignee
Shibuya Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shibuya Kogyo Co Ltd filed Critical Shibuya Kogyo Co Ltd
Publication of MY157709A publication Critical patent/MY157709A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes
    • G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/286External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867Handlers or transport devices, e.g. loaders, carriers, trays
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/02Feeding of components
    • H05K13/021Loading or unloading of containers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • H05K13/0452Mounting machines or lines comprising a plurality of tools for guiding different components to the same mounting place
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Optics & Photonics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Sorting Of Articles (AREA)
  • Stacking Of Articles And Auxiliary Devices (AREA)
  • Specific Conveyance Elements (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)
  • Warehouses Or Storage Devices (AREA)

Abstract

A STOCKER (5) CONSTITUTING AN ARTICLE SORTING APPARATUS (2) INCLUDES FIRST TO FIFTH SLIDING BOARDS (21A TO 21E) ON WHICH THE SORTING TRAYS (4) ARE PLACED IN MULTIPLE ALIGNMENT, AND A DRIVING MEANS (22) VERTICALLY HOLDING THE SLIDING BOARDS OF MULTIPLE STAGES AND RECIPROCATING EACH OF THE SLIDING BOARDS IN A HORIZONTAL DIRECTION. FURTHER, EMPTY TRAY SUPPLY MEANS (7) IS PROVIDED AT A POSITION ADJACENT TO THE STOCKER. WHEN THE FIRST TRANSFER MEANS (6) TRANSFERS AN LED ELEMENT (1) TO A CORRESPONDING SORTING TRAY IN ACCORDANCE WITH A RANK, THE STOCKER MOVES THE SLIDING BOARD SO THAT THE SORTING TRAY CORRESPONDING TO THE ARTICLE IS EXPOSED. WHEN A PREDETERMINED NUMBER OF ARTICLES IS ACCOMMODATED IN THE REQUIRED SORTING TRAY, THE FIRST TRANSFER MEANS PILES AN EMPTY SORTING TRAY HELD BY THE EMPTY TRAY SUPPLY MEANS ON THE SORTING TRAY ACCOMMODATING THE PREDETERMINE NUMBER OF THE ARTICLES. THE ARTICLES CAN BE SORTED INTO A NUMBER OF CLASSIFICATIONS REGARDLESS SPACE SAVING, AND AN EXCELLENT OPERATING EFFICIENCY CAN BE OBTAINED.
MYPI2011001529A 2010-04-20 2011-04-06 Article sorting apparatus MY157709A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010096680A JP5589525B2 (en) 2010-04-20 2010-04-20 Article classification device

Publications (1)

Publication Number Publication Date
MY157709A true MY157709A (en) 2016-07-15

Family

ID=45006037

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2011001529A MY157709A (en) 2010-04-20 2011-04-06 Article sorting apparatus

Country Status (5)

Country Link
JP (1) JP5589525B2 (en)
KR (1) KR101776855B1 (en)
CN (1) CN102259095B (en)
MY (1) MY157709A (en)
TW (1) TWI500940B (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5950183B2 (en) * 2012-01-24 2016-07-13 澁谷工業株式会社 Article inspection apparatus and article classification apparatus provided with the article inspection apparatus
CN102785798A (en) * 2012-04-07 2012-11-21 杭州中为光电技术股份有限公司 Method for using blanking barrel of high-capacity light-emitting diode (LED) sorting machine
CN103121014B (en) * 2013-02-27 2015-09-02 上海轩田工业设备有限公司 A kind of lens quality automatic checkout equipment with automatic sorting mechanism
TWI588074B (en) * 2016-10-24 2017-06-21 Automatic material storage machine for storage equipment
CN108840076A (en) * 2018-08-08 2018-11-20 苏州精濑光电有限公司 A kind of classification stacking device
TWI744665B (en) * 2019-07-12 2021-11-01 威光自動化科技股份有限公司 Method and device for automatically sorting and collecting plate parts
CN110733688A (en) * 2019-10-22 2020-01-31 芯思杰技术(深圳)股份有限公司 device packaging equipment
CN110733689A (en) * 2019-10-22 2020-01-31 芯思杰技术(深圳)股份有限公司 device packaging equipment
CN111203398B (en) * 2020-02-28 2022-07-12 清陶(昆山)自动化装备有限公司 Battery detection grading system
JP7430154B2 (en) * 2021-03-29 2024-02-09 Towa株式会社 Processing equipment and method for manufacturing processed products

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57211746A (en) * 1981-06-23 1982-12-25 Fujitsu Ltd Wafer conveying apparatus
JP3739844B2 (en) * 1995-12-19 2006-01-25 株式会社アドバンテスト Stocker section of handler device
JP3644567B2 (en) * 1997-04-08 2005-04-27 株式会社アドバンテスト Handler tray transfer device
JP4171119B2 (en) * 1998-11-25 2008-10-22 株式会社アドバンテスト Tray holding device, component handling device, and component classification method
JP2000206191A (en) * 1999-01-11 2000-07-28 Advantest Corp Test device of electronic component board
JP2002255315A (en) * 2001-02-26 2002-09-11 Ando Electric Co Ltd Tray accommodation device
JP4401616B2 (en) * 2002-03-14 2010-01-20 ヤマハ発動機株式会社 Electronic component inspection equipment
JP4028263B2 (en) * 2002-03-15 2007-12-26 ヤマハ発動機株式会社 Parts storage device
CN201143504Y (en) * 2007-10-18 2008-11-05 南京熊猫仪器仪表有限公司 Device for arraying, sorting and overlapping SMD components

Also Published As

Publication number Publication date
JP5589525B2 (en) 2014-09-17
TW201202110A (en) 2012-01-16
KR101776855B1 (en) 2017-09-08
CN102259095B (en) 2014-08-20
TWI500940B (en) 2015-09-21
KR20110117005A (en) 2011-10-26
JP2011226905A (en) 2011-11-10
CN102259095A (en) 2011-11-30

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