MY127555A - Memory cell structural test - Google Patents

Memory cell structural test

Info

Publication number
MY127555A
MY127555A MYPI20020232A MYPI20020232A MY127555A MY 127555 A MY127555 A MY 127555A MY PI20020232 A MYPI20020232 A MY PI20020232A MY PI20020232 A MYPI20020232 A MY PI20020232A MY 127555 A MY127555 A MY 127555A
Authority
MY
Malaysia
Prior art keywords
memory cell
structural test
cell structural
bit lines
memory cells
Prior art date
Application number
MYPI20020232A
Other languages
English (en)
Inventor
Tak M Mak
Michael R Spica
Michael J Tripp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of MY127555A publication Critical patent/MY127555A/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C2029/5004—Voltage

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Static Random-Access Memory (AREA)
  • Dram (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Micro-Organisms Or Cultivation Processes Thereof (AREA)
MYPI20020232A 2001-03-30 2002-01-21 Memory cell structural test MY127555A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/823,642 US6757209B2 (en) 2001-03-30 2001-03-30 Memory cell structural test

Publications (1)

Publication Number Publication Date
MY127555A true MY127555A (en) 2006-12-29

Family

ID=25239313

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI20020232A MY127555A (en) 2001-03-30 2002-01-21 Memory cell structural test

Country Status (9)

Country Link
US (1) US6757209B2 (enExample)
EP (1) EP1374250B1 (enExample)
JP (1) JP2004530243A (enExample)
KR (1) KR100544362B1 (enExample)
CN (1) CN100538910C (enExample)
AT (1) ATE329354T1 (enExample)
DE (1) DE60212103T2 (enExample)
MY (1) MY127555A (enExample)
WO (1) WO2002080183A2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7480195B2 (en) * 2005-05-11 2009-01-20 Micron Technology, Inc. Internal data comparison for memory testing
US7602778B2 (en) * 2005-06-29 2009-10-13 Cisco Technology, Inc. System and methods for compressing message headers
JP4773791B2 (ja) * 2005-09-30 2011-09-14 富士通セミコンダクター株式会社 半導体記憶装置、およびメモリテスト回路
US7548473B2 (en) * 2006-04-14 2009-06-16 Purdue Research Foundation Apparatus and methods for determining memory device faults
CN101714407B (zh) * 2009-11-12 2012-08-08 钰创科技股份有限公司 行地址保留存储单元触发电路及行地址保留存储单元装置
JP6430194B2 (ja) * 2014-09-29 2018-11-28 ルネサスエレクトロニクス株式会社 半導体記憶装置
CN108051767B (zh) * 2018-01-04 2019-07-19 南京国睿安泰信科技股份有限公司 一种用于集成电路测试仪的自动诊断方法
KR20240111461A (ko) * 2023-01-10 2024-07-17 삼성전자주식회사 정적 랜덤 액세스 메모리의 메모리 셀 어레이 및 이를 포함하는 정적 랜덤 액세스 메모리

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JPS57105897A (en) * 1980-12-23 1982-07-01 Fujitsu Ltd Semiconductor storage device
US4503536A (en) 1982-09-13 1985-03-05 General Dynamics Digital circuit unit testing system utilizing signature analysis
US4527272A (en) 1982-12-06 1985-07-02 Tektronix, Inc. Signature analysis using random probing and signature memory
JPS61261895A (ja) * 1985-05-16 1986-11-19 Toshiba Corp 半導体記憶装置
JPS61292300A (ja) * 1985-06-18 1986-12-23 Toshiba Corp オンチツプメモリテスト容易化回路
JP2523586B2 (ja) * 1987-02-27 1996-08-14 株式会社日立製作所 半導体記憶装置
JP2831767B2 (ja) * 1990-01-10 1998-12-02 株式会社アドバンテスト 半導体メモリ試験装置
JPH04212799A (ja) * 1990-01-31 1992-08-04 Nec Ic Microcomput Syst Ltd テスト回路内蔵半導体メモリ
JPH04211160A (ja) * 1990-03-20 1992-08-03 Mitsubishi Electric Corp 半導体記憶装置
KR940007240B1 (ko) * 1992-02-21 1994-08-10 현대전자산업 주식회사 병렬 테스트 회로
JP3251637B2 (ja) * 1992-05-06 2002-01-28 株式会社東芝 半導体記憶装置
JP3307473B2 (ja) * 1992-09-09 2002-07-24 ソニー エレクトロニクス インコーポレイテッド 半導体メモリの試験回路
JPH07211099A (ja) * 1994-01-12 1995-08-11 Sony Corp 半導体記憶装置の試験装置
JPH07307100A (ja) * 1994-05-11 1995-11-21 Nec Corp メモリ集積回路
US5708598A (en) * 1995-04-24 1998-01-13 Saito; Tamio System and method for reading multiple voltage level memories
JP3607407B2 (ja) * 1995-04-26 2005-01-05 株式会社日立製作所 半導体記憶装置
US5973967A (en) * 1997-01-03 1999-10-26 Programmable Microelectronics Corporation Page buffer having negative voltage level shifter
US6002623A (en) * 1997-02-12 1999-12-14 Micron Technology, Inc. Semiconductor memory with test circuit
JPH10308100A (ja) 1997-05-06 1998-11-17 Mitsubishi Electric Corp 半導体記憶装置
KR100269319B1 (ko) 1997-12-29 2000-10-16 윤종용 동시칼럼선택라인활성화회로를구비하는반도체메모리장치및칼럼선택라인제어방법
US5963497A (en) * 1998-05-18 1999-10-05 Silicon Aquarius, Inc. Dynamic random access memory system with simultaneous access and refresh operations and methods for using the same
KR100308191B1 (ko) 1998-05-28 2001-11-30 윤종용 빌트-인패럴테스트회로를구비한반도체메모리장치
JP2001210095A (ja) * 2000-01-24 2001-08-03 Mitsubishi Electric Corp メモリモジュール
US6353568B1 (en) * 2000-12-29 2002-03-05 Lsi Logic Corporation Dual threshold voltage sense amplifier

Also Published As

Publication number Publication date
DE60212103D1 (de) 2006-07-20
CN1537312A (zh) 2004-10-13
WO2002080183A3 (en) 2003-04-17
KR100544362B1 (ko) 2006-01-23
CN100538910C (zh) 2009-09-09
ATE329354T1 (de) 2006-06-15
US20020141259A1 (en) 2002-10-03
DE60212103T2 (de) 2007-01-04
EP1374250B1 (en) 2006-06-07
WO2002080183A2 (en) 2002-10-10
JP2004530243A (ja) 2004-09-30
HK1060437A1 (en) 2004-08-06
EP1374250A2 (en) 2004-01-02
KR20030085084A (ko) 2003-11-01
US6757209B2 (en) 2004-06-29

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