MY110904A - Wire bonding over the active circuit area of an integrated circuit device - Google Patents

Wire bonding over the active circuit area of an integrated circuit device

Info

Publication number
MY110904A
MY110904A MYPI93001860A MYPI19931860A MY110904A MY 110904 A MY110904 A MY 110904A MY PI93001860 A MYPI93001860 A MY PI93001860A MY PI19931860 A MYPI19931860 A MY PI19931860A MY 110904 A MY110904 A MY 110904A
Authority
MY
Malaysia
Prior art keywords
active circuit
wire bonding
integrated circuit
bonding over
circuit device
Prior art date
Application number
MYPI93001860A
Other languages
English (en)
Inventor
G Heinen Katherine
J Stierman Roger
C Alfaro Rafael
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of MY110904A publication Critical patent/MY110904A/en

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    • HELECTRICITY
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    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
    • H01L21/60Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Wire Bonding (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Electrodes Of Semiconductors (AREA)
MYPI93001860A 1992-09-10 1993-09-10 Wire bonding over the active circuit area of an integrated circuit device MY110904A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US94308792A 1992-09-10 1992-09-10

Publications (1)

Publication Number Publication Date
MY110904A true MY110904A (en) 1999-06-30

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Application Number Title Priority Date Filing Date
MYPI93001860A MY110904A (en) 1992-09-10 1993-09-10 Wire bonding over the active circuit area of an integrated circuit device

Country Status (7)

Country Link
EP (1) EP0587442B1 (en, 2012)
JP (1) JPH06204277A (en, 2012)
KR (1) KR100335591B1 (en, 2012)
DE (1) DE69323515T2 (en, 2012)
MY (1) MY110904A (en, 2012)
SG (1) SG47534A1 (en, 2012)
TW (1) TW253987B (en, 2012)

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JP3420435B2 (ja) 1996-07-09 2003-06-23 松下電器産業株式会社 基板の製造方法、半導体装置及び半導体装置の製造方法
TW445616B (en) 1998-12-04 2001-07-11 Koninkl Philips Electronics Nv An integrated circuit device
US8021976B2 (en) * 2002-10-15 2011-09-20 Megica Corporation Method of wire bonding over active area of a semiconductor circuit
US6503820B1 (en) 1999-10-04 2003-01-07 Koninklijke Philips Electronics N.V. Die pad crack absorption system and method for integrated circuit chip fabrication
DE10200932A1 (de) * 2002-01-12 2003-07-24 Philips Intellectual Property Diskretes Halbleiterbauelement
DE10242325A1 (de) * 2002-09-12 2004-04-01 eupec Europäische Gesellschaft für Leistungshalbleiter mbH Halbleiter mit Isolierschicht und Verfahren zu dessen Herstellung
DE10245867A1 (de) * 2002-09-30 2004-04-15 Siced Electronics Development Gmbh & Co. Kg Leistungs-Halbleiterbauelement mit verbesserten Anschlusskontakten und Verfahren zu dessen Herstellung
CN100449734C (zh) * 2004-03-16 2009-01-07 松下电器产业株式会社 半导体器件
JP4696532B2 (ja) 2004-05-20 2011-06-08 株式会社デンソー パワー複合集積型半導体装置およびその製造方法
JP4674522B2 (ja) 2004-11-11 2011-04-20 株式会社デンソー 半導体装置
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KR100335591B1 (ko) 2002-08-24
JPH06204277A (ja) 1994-07-22
EP0587442B1 (en) 1999-02-17
KR940008033A (ko) 1994-04-28
TW253987B (en, 2012) 1995-08-11
SG47534A1 (en) 1998-04-17
EP0587442A3 (en, 2012) 1994-08-03
EP0587442A2 (en) 1994-03-16
DE69323515D1 (de) 1999-03-25
DE69323515T2 (de) 1999-06-17

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