MX2021008545A - Metodo de caracterizacion fotometrica de las caracteristicas de radiacion optica de fuentes de luz y fuentes de radiacion. - Google Patents
Metodo de caracterizacion fotometrica de las caracteristicas de radiacion optica de fuentes de luz y fuentes de radiacion.Info
- Publication number
- MX2021008545A MX2021008545A MX2021008545A MX2021008545A MX2021008545A MX 2021008545 A MX2021008545 A MX 2021008545A MX 2021008545 A MX2021008545 A MX 2021008545A MX 2021008545 A MX2021008545 A MX 2021008545A MX 2021008545 A MX2021008545 A MX 2021008545A
- Authority
- MX
- Mexico
- Prior art keywords
- coordinate system
- world coordinate
- sources
- actual measurement
- photometric
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 3
- 230000005855 radiation Effects 0.000 title 2
- 238000012512 characterization method Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 title 1
- 238000005259 measurement Methods 0.000 abstract 5
- 238000001739 density measurement Methods 0.000 abstract 3
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0238—Details making use of sensor-related data, e.g. for identification of sensor or optical parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0242—Control or determination of height or angle information of sensors or receivers; Goniophotometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0266—Field-of-view determination; Aiming or pointing of a photometer; Adjusting alignment; Encoding angular position; Size of the measurement area; Position tracking; Photodetection involving different fields of view for a single detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
- G01M11/0214—Details of devices holding the object to be tested
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/06—Testing the alignment of vehicle headlight devices
- G01M11/061—Details of the mechanical construction of the light measuring system
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/06—Testing the alignment of vehicle headlight devices
- G01M11/064—Testing the alignment of vehicle headlight devices by using camera or other imaging system for the light analysis
- G01M11/065—Testing the alignment of vehicle headlight devices by using camera or other imaging system for the light analysis details about the image analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Non-Portable Lighting Devices Or Systems Thereof (AREA)
Abstract
La invención se refiere a un método para los gráficos de curvas fotométricas de una fuente de luz (Q, 3) sujeta dentro de un dispositivo de colocación (1) y estacionaria en relación con un sistema de coordenadas de objetivo (T) por medio de una cámara de medición de densidad de luminancia (4) colocada estacionaria en relación con un sistema de coordenadas mundial (W), en donde la fuente de luz (Q, 3) se mueve entre una primera posición de medición real (P1') y al menos una posición de medición real adicional (P2' a P5') a lo largo de una cadena cinemática del dispositivo de colocación (1) dentro del sistema de coordenadas mundial (W), en donde una imagen de medición de densidad de luminancia (81 a 85) que describe la distribución espacial de una característica fotométrica dentro de una superficie de medición se registra por medio de la cámara de medición de densidad de luminancia (4) en cada posición de medición real (P1' a P5') con la fuente de luz (Q, 3) encendida, y en donde la posición y/u orientación del sistema de coordenadas del objeto (T) en relación con el sistema de coordenadas mundial (W) está registrado en cada posición de medición real (P1' a P5') en referencia directa al sistema de coordenadas mundial (W) sin referencia a la cadena cinemática del dispositivo de colocación (1). Además, la invención se refiere al uso de tal método para los gráficos de curvas fotométricas de un faro (3).
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102020208992.2A DE102020208992A1 (de) | 2020-07-17 | 2020-07-17 | Verfahren zur räumlichen Charakterisierung des optischen Abstrahlverhaltens von Licht- und Strahlungsquellen |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2021008545A true MX2021008545A (es) | 2022-01-18 |
Family
ID=76942851
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2021008545A MX2021008545A (es) | 2020-07-17 | 2021-07-15 | Metodo de caracterizacion fotometrica de las caracteristicas de radiacion optica de fuentes de luz y fuentes de radiacion. |
Country Status (7)
Country | Link |
---|---|
US (1) | US11927477B2 (es) |
EP (1) | EP3940356A1 (es) |
KR (1) | KR102632930B1 (es) |
CN (1) | CN113945366A (es) |
DE (1) | DE102020208992A1 (es) |
MX (1) | MX2021008545A (es) |
TW (1) | TWI795829B (es) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20220016790A (ko) * | 2020-08-03 | 2022-02-10 | 가부시키가이샤 니혼 마이크로닉스 | 측정 시스템 및 측정 방법 |
DE102020131662B3 (de) * | 2020-11-30 | 2022-02-03 | Lmt Lichtmesstechnik Gmbh Berlin | Verfahren und Gonioradiometer zur richtungsabhängigen Messung mindestens einer lichttechnischen oder radiometrischen Kenngröße einer in ein Objekt eingebauten optischen Strahlungsquelle |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6280788A (ja) * | 1985-10-04 | 1987-04-14 | Omron Tateisi Electronics Co | 光照射方向制御装置 |
JP2004363085A (ja) * | 2003-05-09 | 2004-12-24 | Ebara Corp | 荷電粒子線による検査装置及びその検査装置を用いたデバイス製造方法 |
CN101490518A (zh) * | 2006-07-07 | 2009-07-22 | Tir科技公司 | 用于表征光源的设备和方法 |
CN202007934U (zh) | 2011-03-03 | 2011-10-12 | 江苏晨光波纹管有限公司 | 采用强化接头结构的金属软管 |
DE102014205430A1 (de) * | 2014-03-24 | 2015-09-24 | Lmt Lichtmesstechnik Gmbh Berlin | Verfahren und Gonioradiometer zur richtungsabhängigen Messung mindestens einer lichttechnischen oder radiometrischen Kenngröße einer optischen Strahlungsquelle |
DE102015201093A1 (de) * | 2015-01-22 | 2016-07-28 | Lmt Lichtmesstechnik Gmbh Berlin | Verfahren und Gonioradiometer zur richtungsabhängigen Messung mindestens einer lichttechnischen oder radiometrischen Kenngröße einer optischen Strahlungsquelle |
JP6717564B2 (ja) * | 2015-02-16 | 2020-07-01 | 大塚電子株式会社 | 配光特性測定装置および配光特性測定方法 |
DE102018208203B4 (de) | 2018-05-24 | 2020-02-13 | Carl Zeiss Industrielle Messtechnik Gmbh | Targetkörper, Anordnung mit Targetkörper und Verfahren zum Ermitteln einer Position und/oder einer Ausrichtung eines Targetkörpers |
JP7227442B2 (ja) * | 2018-08-07 | 2023-02-22 | 株式会社日立製作所 | 車両寸法測定装置及び車両寸法測定方法 |
-
2020
- 2020-07-17 DE DE102020208992.2A patent/DE102020208992A1/de active Pending
-
2021
- 2021-07-01 TW TW110124276A patent/TWI795829B/zh active
- 2021-07-15 MX MX2021008545A patent/MX2021008545A/es unknown
- 2021-07-15 EP EP21185743.8A patent/EP3940356A1/de active Pending
- 2021-07-16 CN CN202110803951.2A patent/CN113945366A/zh active Pending
- 2021-07-16 KR KR1020210093297A patent/KR102632930B1/ko active IP Right Grant
- 2021-07-16 US US17/378,612 patent/US11927477B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN113945366A (zh) | 2022-01-18 |
TW202204857A (zh) | 2022-02-01 |
KR20220010457A (ko) | 2022-01-25 |
EP3940356A1 (de) | 2022-01-19 |
US11927477B2 (en) | 2024-03-12 |
KR102632930B1 (ko) | 2024-02-02 |
DE102020208992A1 (de) | 2022-01-20 |
TWI795829B (zh) | 2023-03-11 |
US20220018709A1 (en) | 2022-01-20 |
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