MX2021005739A - Optimizacion de una etapa de configuracion en un proceso de inspeccion visual automatica. - Google Patents

Optimizacion de una etapa de configuracion en un proceso de inspeccion visual automatica.

Info

Publication number
MX2021005739A
MX2021005739A MX2021005739A MX2021005739A MX2021005739A MX 2021005739 A MX2021005739 A MX 2021005739A MX 2021005739 A MX2021005739 A MX 2021005739A MX 2021005739 A MX2021005739 A MX 2021005739A MX 2021005739 A MX2021005739 A MX 2021005739A
Authority
MX
Mexico
Prior art keywords
images
visual inspection
inspection process
optimizing
stage
Prior art date
Application number
MX2021005739A
Other languages
English (en)
Spanish (es)
Inventor
Yonatan Hyatt
Dan Carmon
Original Assignee
Inspekto A M V Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspekto A M V Ltd filed Critical Inspekto A M V Ltd
Publication of MX2021005739A publication Critical patent/MX2021005739A/es

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515Objects of complex shape, e.g. examined with use of a surface follower device
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00Pattern recognition
    • G06F18/20Analysing
    • G06F18/23Clustering techniques
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • G06T7/73Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/888Marking defects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10004Still image; Photographic image
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20081Training; Learning
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20092Interactive image processing based on input by user
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20212Image combination
    • G06T2207/20216Image averaging
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30164Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Artificial Intelligence (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
MX2021005739A 2018-11-18 2019-11-18 Optimizacion de una etapa de configuracion en un proceso de inspeccion visual automatica. MX2021005739A (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862768934P 2018-11-18 2018-11-18
IL263097A IL263097B2 (en) 2018-11-18 2018-11-18 Optimizing a set-up stage in an automatic visual inspection process
PCT/IL2019/051260 WO2020100146A1 (en) 2018-11-18 2019-11-18 Optimizing a set-up stage in an automatic visual inspection process

Publications (1)

Publication Number Publication Date
MX2021005739A true MX2021005739A (es) 2021-08-11

Family

ID=65910786

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2021005739A MX2021005739A (es) 2018-11-18 2019-11-18 Optimizacion de una etapa de configuracion en un proceso de inspeccion visual automatica.

Country Status (10)

Country Link
US (1) US12524866B2 (enExample)
EP (1) EP3881059A4 (enExample)
JP (1) JP2022507678A (enExample)
KR (1) KR20210091189A (enExample)
CN (1) CN113039432A (enExample)
BR (1) BR112021009487A2 (enExample)
CA (1) CA3117917A1 (enExample)
IL (1) IL263097B2 (enExample)
MX (1) MX2021005739A (enExample)
WO (1) WO2020100146A1 (enExample)

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IL260417B (en) 2018-07-04 2021-10-31 Tinyinspektor Ltd System and method for automated visual inspection
US11816827B2 (en) 2020-02-13 2023-11-14 Inspekto A.M.V. Ltd. User interface device for autonomous machine vision inspection
JP7537095B2 (ja) * 2020-02-18 2024-08-21 株式会社リコー 情報処理装置、プログラム、情報生成方法、情報処理システム
WO2023218441A1 (en) * 2022-05-11 2023-11-16 Inspekto A.M.V. Ltd. Optimizing a reference group for visual inspection

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US7096207B2 (en) 2002-03-22 2006-08-22 Donglok Kim Accelerated learning in machine vision using artificially implanted defects
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Also Published As

Publication number Publication date
IL263097A (en) 2020-05-31
WO2020100146A1 (en) 2020-05-22
CN113039432A (zh) 2021-06-25
BR112021009487A2 (pt) 2021-08-10
KR20210091189A (ko) 2021-07-21
EP3881059A1 (en) 2021-09-22
IL263097B2 (en) 2024-01-01
JP2022507678A (ja) 2022-01-18
US12524866B2 (en) 2026-01-13
CA3117917A1 (en) 2020-05-22
EP3881059A4 (en) 2022-05-11
US20220020136A1 (en) 2022-01-20
IL263097B1 (en) 2023-09-01

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