IL263097B2 - Optimizing a set-up stage in an automatic visual inspection process - Google Patents

Optimizing a set-up stage in an automatic visual inspection process

Info

Publication number
IL263097B2
IL263097B2 IL263097A IL26309718A IL263097B2 IL 263097 B2 IL263097 B2 IL 263097B2 IL 263097 A IL263097 A IL 263097A IL 26309718 A IL26309718 A IL 26309718A IL 263097 B2 IL263097 B2 IL 263097B2
Authority
IL
Israel
Prior art keywords
images
cluster
image
inspection
criterion
Prior art date
Application number
IL263097A
Other languages
English (en)
Hebrew (he)
Other versions
IL263097A (en
IL263097B1 (en
Inventor
HYATT Yonatan
Carmon Dan
Original Assignee
Inspekto A M V Ltd
HYATT Yonatan
Carmon Dan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspekto A M V Ltd, HYATT Yonatan, Carmon Dan filed Critical Inspekto A M V Ltd
Priority to IL263097A priority Critical patent/IL263097B2/en
Priority to CN201980074977.9A priority patent/CN113039432A/zh
Priority to KR1020217016265A priority patent/KR20210091189A/ko
Priority to PCT/IL2019/051260 priority patent/WO2020100146A1/en
Priority to US17/294,752 priority patent/US12524866B2/en
Priority to EP19885049.7A priority patent/EP3881059A4/en
Priority to MX2021005739A priority patent/MX2021005739A/es
Priority to JP2021527065A priority patent/JP2022507678A/ja
Priority to CA3117917A priority patent/CA3117917A1/en
Priority to BR112021009487-3A priority patent/BR112021009487A2/pt
Publication of IL263097A publication Critical patent/IL263097A/en
Publication of IL263097B1 publication Critical patent/IL263097B1/en
Publication of IL263097B2 publication Critical patent/IL263097B2/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/23—Clustering techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20092—Interactive image processing based on input by user
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20212—Image combination
    • G06T2207/20216—Image averaging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Artificial Intelligence (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
IL263097A 2018-11-18 2018-11-18 Optimizing a set-up stage in an automatic visual inspection process IL263097B2 (en)

Priority Applications (10)

Application Number Priority Date Filing Date Title
IL263097A IL263097B2 (en) 2018-11-18 2018-11-18 Optimizing a set-up stage in an automatic visual inspection process
CN201980074977.9A CN113039432A (zh) 2018-11-18 2019-11-18 优化自动视觉检查过程中的设置阶段
KR1020217016265A KR20210091189A (ko) 2018-11-18 2019-11-18 자동 시각적 검사 공정에서 설정 단계의 최적화
PCT/IL2019/051260 WO2020100146A1 (en) 2018-11-18 2019-11-18 Optimizing a set-up stage in an automatic visual inspection process
US17/294,752 US12524866B2 (en) 2018-11-18 2019-11-18 Optimizing a set-up stage in an automatic visual inspection process
EP19885049.7A EP3881059A4 (en) 2018-11-18 2019-11-18 OPTIMIZATION OF AN EXPANSION STAGE IN AN AUTOMATIC VISUAL INSPECTION PROCEDURE
MX2021005739A MX2021005739A (es) 2018-11-18 2019-11-18 Optimizacion de una etapa de configuracion en un proceso de inspeccion visual automatica.
JP2021527065A JP2022507678A (ja) 2018-11-18 2019-11-18 自動目視検査プロセスにおけるセットアップ段階の最適化
CA3117917A CA3117917A1 (en) 2018-11-18 2019-11-18 Optimizing a set-up stage in an automatic visual inspection process
BR112021009487-3A BR112021009487A2 (pt) 2018-11-18 2019-11-18 otimização de um estágio de configuração em um processo de inspeção visual automática

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL263097A IL263097B2 (en) 2018-11-18 2018-11-18 Optimizing a set-up stage in an automatic visual inspection process

Publications (3)

Publication Number Publication Date
IL263097A IL263097A (en) 2020-05-31
IL263097B1 IL263097B1 (en) 2023-09-01
IL263097B2 true IL263097B2 (en) 2024-01-01

Family

ID=65910786

Family Applications (1)

Application Number Title Priority Date Filing Date
IL263097A IL263097B2 (en) 2018-11-18 2018-11-18 Optimizing a set-up stage in an automatic visual inspection process

Country Status (10)

Country Link
US (1) US12524866B2 (enExample)
EP (1) EP3881059A4 (enExample)
JP (1) JP2022507678A (enExample)
KR (1) KR20210091189A (enExample)
CN (1) CN113039432A (enExample)
BR (1) BR112021009487A2 (enExample)
CA (1) CA3117917A1 (enExample)
IL (1) IL263097B2 (enExample)
MX (1) MX2021005739A (enExample)
WO (1) WO2020100146A1 (enExample)

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* Cited by examiner, † Cited by third party
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IL259285B2 (en) * 2018-05-10 2023-07-01 Inspekto A M V Ltd A system and method for detecting defects on objects in an image
IL260417B (en) 2018-07-04 2021-10-31 Tinyinspektor Ltd System and method for automated visual inspection
US11816827B2 (en) 2020-02-13 2023-11-14 Inspekto A.M.V. Ltd. User interface device for autonomous machine vision inspection
JP7537095B2 (ja) * 2020-02-18 2024-08-21 株式会社リコー 情報処理装置、プログラム、情報生成方法、情報処理システム
WO2023218441A1 (en) * 2022-05-11 2023-11-16 Inspekto A.M.V. Ltd. Optimizing a reference group for visual inspection

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US20170154234A1 (en) * 2015-12-01 2017-06-01 Takuya Tanaka Information processing device, information processing method, computer-readable recording medium, and inspection system

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CA2446259A1 (en) * 2001-05-02 2002-11-07 Teradyne, Inc. Inspection system using dynamically obtained values and related techniques
US7096207B2 (en) 2002-03-22 2006-08-22 Donglok Kim Accelerated learning in machine vision using artificially implanted defects
US7359544B2 (en) 2003-02-12 2008-04-15 Kla-Tencor Technologies Corporation Automatic supervised classifier setup tool for semiconductor defects
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US7369236B1 (en) * 2006-10-31 2008-05-06 Negevtech, Ltd. Defect detection through image comparison using relative measures
US20170154234A1 (en) * 2015-12-01 2017-06-01 Takuya Tanaka Information processing device, information processing method, computer-readable recording medium, and inspection system

Also Published As

Publication number Publication date
IL263097A (en) 2020-05-31
WO2020100146A1 (en) 2020-05-22
CN113039432A (zh) 2021-06-25
BR112021009487A2 (pt) 2021-08-10
KR20210091189A (ko) 2021-07-21
EP3881059A1 (en) 2021-09-22
JP2022507678A (ja) 2022-01-18
US12524866B2 (en) 2026-01-13
CA3117917A1 (en) 2020-05-22
EP3881059A4 (en) 2022-05-11
US20220020136A1 (en) 2022-01-20
IL263097B1 (en) 2023-09-01
MX2021005739A (es) 2021-08-11

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